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Scans-002005.pdf
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Tem ic Description Semiconductors B10011S This device contains a fault recognition circuit for faults on one of the two wires which are normally used for trans mission. If a fault occurs on on
Datasheet Type
Scan
RoHS
Unknown
Pb Free
Unknown
Lifecycle
Active
Scans-002005.pdf
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User Tagged Keywords
89013
B10011S
B82790
S0513
Siemens Ferrite