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Partial File Text ï»¿High-Reliability High-Speed CMOS Logic ICs CD54HC107/3A C D54HCT107/3 A Burn-In Test-Circuit Connections (Use Static ll for /3A burn-in and Dynamic for Lite Test.) Static static burn-in 1 stat
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Pb Free Unknown
Lifecycle Obsolete

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CD54HCT109 HC- 543