DSASW00421681.pdf

Partial File Text On Wafer Noise Measurement Using Bipolar Transistor RF Test Structures S.D. Connor Bipolar Characterization Group, Central R&D, G.E.C. Plessey Semiconductors, Tweedale Way, Oldham, Lancs OL9 7LA,
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8970B footprint transistor hp11612a HP4145 HP8341B Plessey TRANSISTOR noise figure measurements