DSAUD0067750.pdf by Fairchild Semiconductor

Partial File Text Fairchild Application Note 1009 Robert Stodieck March 1997 ENDURANCE The number of write/erase cycles an EEPROM can withstand before a bit in the memory fails. A common definition of "failur
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AN-1009 CS100 CS160 EEPROM retention testing NM93C46 NM93C46N