DASF007804.pdf by Micrel Semiconductor

Partial File Text High Temp Bias Moisture Life Test TA = 85C / 85%RH at rated voltage or Highly Accelerated Stress Test HAST +131C / 85%RH MSL Pkg Lds Device D/C Process L2 L2 L2 L2 L2 L2 L2 L
Datasheet Type Original
RoHS Unknown
Pb Free Unknown
Lifecycle Unknown
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0116E 0307E 0420g ATML 28 ATML H ATML U CARSEM KSZ8721 L1 SOT-23-5 MIC2026BM MIC2211 MIC2214 MIC2920ABS MIC5205M5 MIC5247 MIC5255 MIC5319BML mic7122mm SPN860003 SY58016L SY58023 SY88953L Unisem

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