BCT8373A
Abstract: No abstract text available
Text: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE
|
Original
|
SN54BCT8373A,
SN74BCT8373A
SCBS044F
BCT373
SCBA004C
SDYA010
SDYA012
SSYA002C,
SZZU001B,
SDYU001N,
BCT8373A
|
PDF
|
BCT245
Abstract: BCT8245A F245 SN54BCT8245A SN74BCT8245A
Text: SN54BCT8245A, SN74BCT8245A SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS043E – MAY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE
|
Original
|
SN54BCT8245A,
SN74BCT8245A
SCBS043E
BCT8245A
SN54BCT8245A
BCT245
F245
SN54BCT8245A
SN74BCT8245A
|
PDF
|
V5050
Abstract: BCT244 F244 SN54BCT8244A SN74BCT8244A
Text: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042E – FEBRUARY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8244A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This
|
Original
|
SN54BCT8244A,
SN74BCT8244A
SCBS042E
BCT8244A
SN54BCT8244A
17customer
V5050
BCT244
F244
SN54BCT8244A
SN74BCT8244A
|
PDF
|
Untitled
Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
|
Original
|
SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT8374A
SN54BCT8374A
|
PDF
|
Untitled
Abstract: No abstract text available
Text: SN54BCT8245A, SN74BCT8245A SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS043E – MAY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE
|
Original
|
SN54BCT8245A,
SN74BCT8245A
SCBS043E
BCT8245A
SN54BCT8245A
|
PDF
|
Untitled
Abstract: No abstract text available
Text: SN54BCT8245A, SN74BCT8245A SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS043E – MAY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE
|
Original
|
SN54BCT8245A,
SN74BCT8245A
SCBS043E
BCT245
|
PDF
|
bct8240a
Abstract: No abstract text available
Text: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS SCBS067E – FEBRUARY 1990 – REVISED DECEMBER 1996 D D D D D description The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This
|
Original
|
SN54BCT8240A,
SN74BCT8240A
SCBS067E
BCT240
SNJ54BCT8240AFK
5962View
9174601Q3A
SNJ54BCT8240AJT
9174601QLA
bct8240a
|
PDF
|
SN74BCT373
Abstract: SN74BCT8373 SN74F373
Text: SN74BCT8373 SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES SCBS471 – JUNE 1990 – REVISED JUNE 1994 • • • • • • • • Member of the Texas Instruments SCOPE Family of Testability Products Octal Test-Integrated Circuit Functionally Equivalent to SN74F373 and
|
Original
|
SN74BCT8373
SCBS471
SN74F373
SN74BCT373
SN74BCT8373
|
PDF
|
F504
Abstract: PDIP28 ST52F500 ic 4060 internal circuit afb3
Text: ST52F500/F503/F504 ST52F500/F503/F504 8-BIT INTELLIGENT CONTROLLER UNIT ICU Two Timer/PWMs, I2C, SPI TARGET SPECIFICATION Memories • Up to 8 Kbytes Single Voltage Flash Memory ■ Up to 512 bytes of RAM ■ Up to 4 Kbytes Data EEPROM ■ In Situ Programming in Flash devices (ISP)
|
Original
|
ST52F500/F503/F504
F504
PDIP28
ST52F500
ic 4060 internal circuit
afb3
|
PDF
|
Untitled
Abstract: No abstract text available
Text: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS SCBS067E – FEBRUARY 1990 – REVISED DECEMBER 1996 D D D D D description The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This
|
Original
|
SN54BCT8240A,
SN74BCT8240A
SCBS067E
BCT8240A
SN54BCT8240A
|
PDF
|
Matrix LED Display Driver
Abstract: 4-digit counter MAX6952 MAX6953EAX MAX6953EPL MAX6953 MAX6953E
Text: 19-2312; Rev 3; 3/04 2-Wire Interfaced, 2.7V to 5.5V, 4-Digit 5 ✕ 7 Matrix LED Display Driver Features ♦ 400kbps 2-Wire Interface Compatible with I2C The MAX6953 is a compact cathode-row display driver that interfaces microprocessors to 5 ✕ 7 dot-matrix LED
|
Original
|
400kbps
MAX6953
104-character
MAX6953
Matrix LED Display Driver
4-digit counter
MAX6952
MAX6953EAX
MAX6953EPL
MAX6953E
|
PDF
|
Untitled
Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E − JUNE 1990 − REVISED JULY 1996 D Members of the Texas Instruments SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE TOP VIEW SCOPE Family of Testability Products
|
Original
|
SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT374
|
PDF
|
FUZZY MICROCONTROLLER ALGORITHM
Abstract: No abstract text available
Text: ST52F510/F513/F514 ST52F510/F513/F514 8-BIT INTELLIGENT CONTROLLER UNIT ICU Two Timer/PWMs, ADC, I2C, SPI, SCI TARGET SPECIFICATION Memories • Up to 8 Kbytes Single Voltage Flash Memory ■ Up to 512 bytes of RAM ■ Up to 4 Kbytes Data EEPROM ■
|
Original
|
ST52F510/F513/F514
10-bit
FUZZY MICROCONTROLLER ALGORITHM
|
PDF
|
Untitled
Abstract: No abstract text available
Text: ST52F500/F503/F504 ST52F500/F503/F504 8-BIT INTELLIGENT CONTROLLER UNIT ICU Two Timer/PWMs, I2C, SPI TARGET SPECIFICATION Memories • Up to 8 Kbytes Single Voltage Flash Memory ■ Up to 512 bytes of RAM ■ Up to 4 Kbytes Data EEPROM ■ In Situ Programming in Flash devices (ISP)
|
Original
|
ST52F500/F503/F504
16-bit
|
PDF
|
|
|
BCT244
Abstract: F244 SN54BCT8244A SN74BCT8244A
Text: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042E – FEBRUARY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8244A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This
|
Original
|
SN54BCT8244A,
SN74BCT8244A
SCBS042E
BCT8244A
SN54BCT8244A
17plifiers
BCT244
F244
SN54BCT8244A
SN74BCT8244A
|
PDF
|
ldpr 006h
Abstract: F502L ST52F501L ST52F502L 9.830 mhz
Text: ST52F501L/F502L ST52F501L/F502L 8-BIT INTELLIGENT CONTROLLER UNIT ICU IR Driver, Timer/PWM, I2C, SPI, SCI, Low Voltage PRODUCT PREVIEW Memories • Up to 8 Kbytes Single Voltage Flash Memory ■ 256 bytes of Register File ■ 256 bytes of RAM ■ 256 bytes Data EEPROM (F502L only)
|
Original
|
ST52F501L/F502L
F502L
ldpr 006h
ST52F501L
ST52F502L
9.830 mhz
|
PDF
|
V5050
Abstract: F373 SN54BCT8373A SN74BCT8373A
Text: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE
|
Original
|
SN54BCT8373A,
SN74BCT8373A
SCBS044F
BCT8373A
SN54BCT8373A
V5050
F373
SN54BCT8373A
SN74BCT8373A
|
PDF
|
F374
Abstract: SN54BCT8374A SN74BCT8374A
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
|
Original
|
SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT8374A
SN54BCT8374A
F374
SN54BCT8374A
SN74BCT8374A
|
PDF
|
Untitled
Abstract: No abstract text available
Text: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042E − FEBRUARY 1990 − REVISED JULY 1996 D Members of the Texas Instruments D D D D D SCOPE Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F244 and
|
Original
|
SN54BCT8244A,
SN74BCT8244A
SCBS042E
BCT244
|
PDF
|
Untitled
Abstract: No abstract text available
Text: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS SCBS067E – FEBRUARY 1990 – REVISED DECEMBER 1996 D D D D D description The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This
|
Original
|
SN54BCT8240A,
SN74BCT8240A
SCBS067E
BCT240
|
PDF
|
BCT8244A
Abstract: No abstract text available
Text: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042E – FEBRUARY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8244A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This
|
Original
|
SN54BCT8244A,
SN74BCT8244A
SCBS042E
BCT244
BCT8244A
|
PDF
|
SN54BCT8244A
Abstract: SN74BCT8244A
Text: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042D - FEBRUARY 1990 - REVISED APRIL 1994 Members of the Texas Instruments SCOPE Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to SN54/74F244 and SN54/74BCT244 in the Normal
|
OCR Scan
|
SN54BCT8244A,
SN74BCT8244A
SCBS042D
SN54/74F244
SN54/74BCT244
752S5
SN54BCT8244A
|
PDF
|
74BCT8374
Abstract: D3641 TEX-E wire
Text: SN54BCT8374, SN74BCT8374 SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS TI0223— 0 3 6 4 1 , JUNE 1990 SN54BCT8374 IT PACKAGE SN74BCT8374 . . . DW OR NT PACKAGE Members of Texas Instruments SCOPE Family of Testability Products TOP VIEW
|
OCR Scan
|
SN54BCT8374,
SN74BCT8374
TI0223--
SN54BCT8374
SN74BCT8374
SN54/74F374
SN54/74BCT374
74BCT8374
D3641
TEX-E wire
|
PDF
|
d3413
Abstract: BCT8244 54BCT8244 SCBS042-TI0037-D3413 74BCT8244 74BCT244 SN74BCT8244 Texas Instruments bct8244
Text: SN54BCT8244, SN74BCT8244 SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042— TI0037— D3413, FEBRUARY 1990 Members of Texas Instruments SCOPE Family of Testability Products SN54BCT8244 . . . JT PACKAGE SN74BCT6244 . . . DW OR NT PACKAGE TOP VIEW Octal Test Integrated Circuits
|
OCR Scan
|
SN54BCT8244,
SN74BCT8244
SCBS042â
TI0037â
D3413,
SN54BCT8244
SN74BCT6244
SN54/74F244
SN54/74BCT244
d3413
BCT8244
54BCT8244
SCBS042-TI0037-D3413
74BCT8244
74BCT244
SN74BCT8244
Texas Instruments bct8244
|
PDF
|