W83C553F-G
Abstract: quality and reliability report W83977TF W83C43 W9925QF CMOS SPDM Process JEDEC-STD-78 0.6 um cmos process 8 bit uC w78c32BP
Text: Quality and Reliability Report 6. Process Related Reliability Test Data Dynamic Early Fail Study EFR 1. Test Condition Condition: Dynamic operating condition with Vcc = 4.6V for 3.3V products, T = 125°C, f = 0.8 MHz/125 KHz for synchronous DRAMs Dynamic operating condition with Vcc = 6.5V/4.3V for 5V/3.3V products, T = 125°C, f = 1 MHz/100
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Hz/125
Hz/100
W9925QF)
W9920IF)
W83C553FG
W83977TF
W83877F
W91340
W9910IF)
W83C553F-G
quality and reliability report
W83977TF
W83C43
W9925QF
CMOS SPDM Process
JEDEC-STD-78
0.6 um cmos process
8 bit uC
w78c32BP
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