TSMC 130NM CONTACT VIA DESIGN RULE METAL PROCESS Search Results

TSMC 130NM CONTACT VIA DESIGN RULE METAL PROCESS Result Highlights (5)

Part	Manufacturer	Description
TMP89FS60AUG	Toshiba Electronic Devices & Storage Corporation	8-bit Microcontroller/Processing Performance Equivalent to a 16-bit MCU/LQFP64-P-1010-0.50E
TMP89FS63AUG	Toshiba Electronic Devices & Storage Corporation	8-bit Microcontroller/Processing Performance Equivalent to a 16-bit MCU/LQFP52-P-1010-0.65
TMP89FS60BFG	Toshiba Electronic Devices & Storage Corporation	8-bit Microcontroller/Processing Performance Equivalent to a 16-bit MCU/P-LQFP64-1414-0.80-002
TMP89FS63BUG	Toshiba Electronic Devices & Storage Corporation	8-bit Microcontroller/Processing Performance Equivalent to a 16-bit MCU/P-LQFP52-1010-0.65-002
TMP89FS62AUG	Toshiba Electronic Devices & Storage Corporation	8-bit Microcontroller/Processing Performance Equivalent to a 16-bit MCU/LQFP44-P-1010-0.80A

TSMC 130NM CONTACT VIA DESIGN RULE METAL PROCESS Datasheets Context Search

Catalog Datasheet	MFG & Type	Document Tags	PDF
TSMC 90nm sram Abstract: tsmc 130nm metal process nmos transistor tsmc 130nm contact via design rule metal process applications of vlsi in antennas tsmc design rule front of fabrication process matched transistors 52NM Text: Translating Yield Learning Into Manufacturable Designs Vijay Chowdhury, Irfan Rahim, Ada Yu and Girish Venkitachalam Altera Corp. San Jose, CA 95134 Introduction: Improving semiconductor yield is a multi-dimensional process that must include design, fabrication and test aspects. An	Original		PDF
Untitled Abstract: No abstract text available Text: TM September 2013 • What are Semiconductor Devices? • How Semiconductors are Made − Front-End Process − Back-End Process • Fabrication Facility and Equipment Issues • Business Aspects of Supplying Semiconductors TM 2 TM 4 A conductor carries electricity like a pipe	Original		PDF

Catalog Datasheet

MFG & Type

Document Tags

PDF

TSMC 90nm sram

Abstract: tsmc 130nm metal process nmos transistor tsmc 130nm contact via design rule metal process applications of vlsi in antennas tsmc design rule front of fabrication process matched transistors 52NM
Text: Translating Yield Learning Into Manufacturable Designs Vijay Chowdhury, Irfan Rahim, Ada Yu and Girish Venkitachalam Altera Corp. San Jose, CA 95134 Introduction: Improving semiconductor yield is a multi-dimensional process that must include design, fabrication and test aspects. An

Original

PDF

Untitled

Abstract: No abstract text available
Text: TM September 2013 • What are Semiconductor Devices? • How Semiconductors are Made − Front-End Process − Back-End Process • Fabrication Facility and Equipment Issues • Business Aspects of Supplying Semiconductors TM 2 TM 4 A conductor carries electricity like a pipe

Original

PDF