TOP 249 YN SYMBOL Search Results

top 249 yn

Abstract: top 248 yn
Contextual Info: TOSHIBA TC74VHC240,244F/FW/FS/FT TO SH IBA C M O S DIGITAL INTEGRATED CIRCUIT SILICON M O N O LITH IC TC74VHC240F, TC74VHC240FW, TC74VHC240FS, TC74VHC240FT TC74VHC244F, TC74VHC244FW, TC74VHC244FS, TC74VHC244FT OCTAL BUS BUFFER TC74VHC240F/ FW / FS/ FT INVERTED, 3 -STATE OUTPUTS

Contextual Info: IMAGE SENSOR Flat panel sensor C10013SK High reliability, high sensitivity Flat panel sensor C10013SK is a digital X-ray image sensor newly developed as a key device for open-type tube application, radiography and other real-time X-ray imaging applications requiring high resolution and high image quality.

C10013SK

Abstract: image sensor x-ray charge amplifier array video lvds cable
Contextual Info: IMAGE SENSOR Flat panel sensor C10013SK High reliability, high sensitivity Flat panel sensor C10013SK is a digital X-ray image sensor newly developed as a key device for open-type tube application, radiography and other real-time X-ray imaging applications requiring high resolution and high image quality.

CTRDIV16

Abstract: srg2 UT54ACS244
Contextual Info: UT54ACS00/UT54ACTS00 Radiation-Hardened Quadruple 2-Input NAND Gates FEATURES PINOUTS • 1.2µ radiation-hardened CMOS - Latchup immune • High speed • Low power consumption • Single 5 volt supply • Available QML Q or V processes • Flexible package

MSI Logic

Abstract: ut69151 lxe/dxe UT69151 smd g2b SRG8 Multiplexer UT54ACTS02 CMOS 4002 ACS 53 ACS132 compared CMOS TTL Logic Family Specifications
Contextual Info: UT54ACS00/UT54ACTS00 Radiation-Hardened Quadruple 2-Input NAND Gates FEATURES PINOUTS • 1.2µ radiation-hardened CMOS - Latchup immune • High speed • Low power consumption • Single 5 volt supply • Available QML Q or V processes • Flexible package

transistor 18971

Abstract: STD90 LD1A pci ck16 80C51 MDL90 what about 1553 bus top 249 yn asic 1605 Quartz resonator 33mhz
Contextual Info: Introduction 1 Table of Contents 1.1 Library Description. 1-1 1.2 Features. 1-2

LB2X

Abstract: 8a67 41/RCOB-350
Contextual Info: UT54ACS00/UT54ACTS00 Radiation-Hardened Quadruple 2-Input NAND Gates FEATURES PINOUTS • 1.2µ radiation-hardened CMOS - Latchup immune • High speed • Low power consumption • Single 5 volt supply • Available QML Q or V processes • Flexible package

ACTS14

Contextual Info: UT54ACS00/UT54ACTS00 Radiation-Hardened Quadruple 2-Input NAND Gates FEATURES PINOUTS • 1.2µ radiation-hardened CMOS - Latchup immune • High speed • Low power consumption • Single 5 volt supply • Available QML Q or V processes • Flexible package

c2183

Contextual Info: UT54ACS00/UT54ACTS00 Radiation-Hardened Quadruple 2-Input NAND Gates FEATURES PINOUTS • 1.2µ radiation-hardened CMOS - Latchup immune • High speed • Low power consumption • Single 5 volt supply • Available QML Q or V processes • Flexible package

Contextual Info: UT54ACS00/UT54ACTS00 Radiation-Hardened Quadruple 2-Input NAND Gates FEATURES PINOUTS • 1.2µ radiation-hardened CMOS - Latchup immune • High speed • Low power consumption • Single 5 volt supply • Available QML Q or V processes • Flexible package

tl 0741

Abstract: 2062 USB adc 809 lpg 889 TAG 8734 ao21 ND2D2 schematic diagram display samsung TAG 8518 sj 2517 transistor
Contextual Info: Introduction 1 Table of Contents 1.1 Library Description . 1-1 1.2 Features . 1-2

pure sine wave using TL 494

Abstract: verilog code for digital modulation 152935 74950 design pure "sine wave" power inverter KT 839 PH 593 PURE SINE WAVE inverter schematic diagram vhdl coding for analog to digital converter 16C450
Contextual Info: Introduction 1 Table of Contents 1.1 Library Description . 1-1 1.2 Features . 1-2

CTC 880

Abstract: vhdl coding for analog to digital converter design pure "sine wave" power inverter PURE SINE WAVE inverter schematic diagram sine wave inverter using pic 16C450 16C550 ARM920T ARM940T IEEE1284
Contextual Info: Introduction 1 Table of Contents 1.1 Library Description . 1-1 1.2 Features . 1-2

Contextual Info: M O S E L V t T E L IC V53C100N HIGH PERFORMANCE, 3.3 VO LT 1M X 1 B IT F A S T P A G E M O D E C M O S D YN A M IC R A M 60/60L 70/70L 80/80L Max. RAS Access Time, tRAC 60 ns 70 ns 80 ns Max. Column Address Access Time, 0CAA) 35 ns 40 ns 45 ns Max. CAS Access Time, (*CAC)

Contextual Info: ADVANCE MT58LC128K16/18E1 128K X 16/18 SYNCBURST SRAM MICRON +3.3V SUPPLY, +2.5V I/O, FLOW-THROUGH AND SELECTABLE BURST MODE FEATURES Fast access times: 8.5, 9 ,1 0 , 11 and 12ns Fast OH# access times: 5 and 6ns +3.3V + 0 .3 V /-0 .1 6 5 V p o w er supply (V cc

SCANSTA112

Abstract: SCANSTA111 SCANPSC110 STA112
Contextual Info: SCANSTA112 7-Port Multidrop IEEE 1149.1 JTAG Multiplexer General Description Features The SCANSTA112 extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a multidrop approach over a single serial scan chain is improved test throughput and the ability to remove a board

SCANSTA112

Abstract: STA112 A001 A101 SCANPSC110 SCANSTA111 SCANport
Contextual Info: SCANSTA112 7-port Multidrop IEEE 1149.1 JTAG Multiplexer General Description The SCANSTA112 extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a multidrop approach over a single serial scan chain is improved test throughput and the ability to remove a board

DSS310

Abstract: BL02RN2-R62 DSs310-55Y5S223S50 DSS310H DSS310H-55B222M250 CERAMIC FILTER 223S PLT1R53C DSS306-55F223Z16 BL01RN1-A62B1 plt2003c
Contextual Info: EMI LEADED FILTERS EMI LEADED FILTERS Based on more than 30 years of ceramic and ferrite technology experience, Murata Electronics’ full range of leaded EMI filters have been designed to meet today’s electronic industry requirements. Murata’s leaded devices consist of ferrite bead inductors,

SNLS161

Abstract: SCANSTA112
Contextual Info: SCANSTA112 SCANSTA112 7-Port Multidrop IEEE 1149.1 JTAG Multiplexer Literature Number: SNLS161H SCANSTA112 7-Port Multidrop IEEE 1149.1 (JTAG) Multiplexer General Description Features The SCANSTA112 extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a

SCANSTA112SM/NOPB

Contextual Info: SCANSTA112 SCANSTA112 7-Port Multidrop IEEE 1149.1 JTAG Multiplexer Literature Number: SNLS161H SCANSTA112 7-Port Multidrop IEEE 1149.1 (JTAG) Multiplexer General Description Features The SCANSTA112 extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a

Contextual Info: T H I COM PUTING Q AND U ì N T S E M I C O N D U C T O R , I N C NETWORKING Fig u re 1 . B lock D iagram G FBIN GND REFCLK GND F1 FO A 1 8 7 GND 11-Output Data Sheets Configurable Clock Buffer Features • Wide frequency range: 24 MHz to 105 MHz ■ Output configurations:

ID102510

Abstract: L6236E L6236 ISO8859-1 Cortex-m1
Contextual Info: ARM Compiler toolchain Version 4.1 ARM C and C+ Libraries and Floating-Point Support Reference ® Copyright 2010 ARM. All rights reserved. ARM DUI 0492B ID102510 ARM Compiler toolchain ARM C and C+ Libraries and Floating-Point Support Reference Copyright © 2010 ARM. All rights reserved.

SCANSTA112

Abstract: A001 SCANPSC110 SCANSTA111 STA112 PSC110
Contextual Info: SCANSTA112 7-port Multidrop IEEE 1149.1 JTAG Multiplexer General Description The SCANSTA112 extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a multidrop approach over a single serial scan chain is improved test throughput and the ability to remove a board

SCANSTA111

Abstract: STA112 a0b1 A001 SCANPSC110 SCANSTA112 A101 diode SCANSTA112SM/NOPB
Contextual Info: SCANSTA112 7-port Multidrop IEEE 1149.1 JTAG Multiplexer General Description The SCANSTA112 extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a multidrop approach over a single serial scan chain is improved test throughput and the ability to remove a board