TESTS Search Results

TESTS Result Highlights (5)

Part	Manufacturer	Description	Download
FO-62.5LPBMT0-001	Amphenol Cables on Demand	Amphenol FO-62.5LPBMT0-001 MT-RJ Connector Loopback Cable: Multimode 62.5/125 Fiber Optic Port Testing .1m	Datasheet
FO-9LPBMTRJ00-001	Amphenol Cables on Demand	Amphenol FO-9LPBMTRJ00-001 MT-RJ Connector Loopback Cable: Single-Mode 9/125 Fiber Optic Port Testing .1m	Datasheet
SF-SFP28LPB1W-3DB	Amphenol Cables on Demand	Amphenol SF-SFP28LPB1W-3DB SFP28 Loopback Adapter Module for SFP28 Port Compliance Testing - 3dB Attenuation & 1W Power Consumption	Datasheet
FO-50LPBMTRJ0-001	Amphenol Cables on Demand	Amphenol FO-50LPBMTRJ0-001 MT-RJ Connector Loopback Cable: Multimode 50/125 Fiber Optic Port Testing .1m	Datasheet
SF-SFPPLOOPBK-003.5	Amphenol Cables on Demand	Amphenol SF-SFPPLOOPBK-003.5 SFP+ Loopback Adapter Module for SFP+ Port Compliance Testing - 3.5dB Copper/Optical Cable Emulation	Datasheet

TESTS Price and Stock

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Fluke Corporation TS22-TEST-SET TONE TEST SET NETWORK TESTING
Distributors	Part	Package	Stock	Lead Time	Min Order Qty	Price	Buy
DigiKey	TS22-TEST-SET	Bulk				1 - 10 - 100 - 1000 - 10000 -	Buy Now
ams OSRAM Group LIQUID-TEST-SETUP LED
Distributors	Part	Package	Stock	Lead Time	Min Order Qty	Price	Buy
DigiKey	LIQUID-TEST-SETUP	Box			1	1 $559.28 10 $559.28 100 $559.28 1000 $559.28 10000 $559.28	Buy Now
Sensitron Semiconductors GRPBTEST/SDA1008SS Diode Array Rectifier 150V 1A 16-Pin SMD - Virtual or Non-Physical Inventory (Software & Literature) (Alt: GRPBTEST/SDA1008SS)
Distributors	Part	Package	Stock	Lead Time	Min Order Qty	Price	Buy
Avnet Americas	GRPBTEST/SDA1008SS	No Container		38 Weeks	1	1 - 10 - 100 - 1000 - 10000 -	Get Quote
Sensitron Semiconductors GRPATEST/SDA1008SS Diode Array Rectifier 150V 1A 16-Pin SMD - Virtual or Non-Physical Inventory (Software & Literature) (Alt: GRPATEST/SDA1008SS)
Distributors	Part	Package	Stock	Lead Time	Min Order Qty	Price	Buy
Avnet Americas	GRPATEST/SDA1008SS	No Container		38 Weeks	1	1 - 10 - 100 - 1000 - 10000 -	Get Quote
Sensitron Semiconductors TESTSETUPCHG/SHD620051PSS - Bulk (Alt: TESTSETUPCHG/SHD62)
Distributors	Part	Package	Stock	Lead Time	Min Order Qty	Price	Buy
Avnet Americas	TESTSETUPCHG/SHD620051PSS	Bulk		58 Weeks	1	1 - 10 - 100 - 1000 - 10000 -	Get Quote

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TESTS Datasheets Context Search

Catalog Datasheet	MFG & Type	PDF	Document Tags
Untitled Abstract: No abstract text available Text: T93 Vishay Sfernice 3/8" Square Multi-Turn Cermet Trimmer FEATURES • Industrial grade • 0.5 W at 70 °C • Tests according to CECC 41000 or IEC 60393-1 The T93 is a small size trimmer - 3/8" x 3/8" x 3/16" answering PC board mounting requirements. Five versions are available which differ by the position of the	Original	PDF	2002/95/EC T93XA 2011/65/EU 2002/95/EC. 2002/95/EC 2011/65/EU. 12-Mar-12
2D 1002 Abstract: RH 2D 1002 2D 1406 RN41 RN412E RN412 Text: 1733 Reader's Spreads pg1-203:document 1/27/09 4:08 PM Page 87 fixed metal film melf resistors EU features • • • • • Suitable for reflow and wave soldering Higher stability in short and long term tests Meets or exceeds IEC 60115-8, EIAJ RC-2132A	Original	PDF	pg1-203 RC-2132A C/-55 2D 1002 RH 2D 1002 2D 1406 RN41 RN412E RN412
versacon 9 Abstract: sdg-40 data sheet of 4033 spm-33A versacon PLCP-40 BAZ-33 ac adapter SPM-32A lnt 2 Text: ACTERNA TEST & MEASUREMENT SOLUTIONS SPM-32A/-33A/-34A/-35A/-36A Selective Level Meters Key Features • For line qualification tests on ISDN, PCM, xDSL, and measurements on analog transmission systems up to 3.5 MHz • Synthesizer for accurate, stable frequency settings	Original	PDF	SPM-32A/-33A/-34A/-35A/-36A SPM-32A, SPM-33A, SPM-36A SPM32A36A versacon 9 sdg-40 data sheet of 4033 spm-33A versacon PLCP-40 BAZ-33 ac adapter SPM-32A lnt 2
Untitled Abstract: No abstract text available Text: T63 Vishay Sfernice 1/4" Multi-Turn Fully Sealed Container Cermet Trimmer FEATURES • 0.25 W at 70 °C • Industrial grade • Tests according to CECC 41000 or IEC 60393-1 • Multi-turn operation • Low contact resistance variation 1 % typical Due to their square shape and small size 6.8 mm x 6.8 mm	Original	PDF	2002/95/EC 2011/65/EU 2002/95/EC. 2002/95/EC 2011/65/EU. 12-Mar-12
Untitled Abstract: No abstract text available Text: Tool and Appliance Tester Tool and Appliance Tester DESCRIPTION The Tool and Appliance Tester combines, in one portable instrument, the three most frequently specified electrical safety tests for tools and appliances. In conformance to UL and ANSI test requirements, the instrument performs test	Original	PDF	20-ampere L5-15R L5-20R L-30R TX75237-1088
CXB1451Q Abstract: CXB1452Q QFP080-P-1414 ckmode parallel to serial converter GVIF cable Text: CXB1451Q VGA/SVGA/XGA digital data serial transmitter VEET RED0 4 RED0 (5) RED0 (3) RED0 (2) RED0 (1) VCCT RED0 (0) IDLE 80 pin QFP (Plastic) REFREQ VEEE SDATAP VCCE SDATAN VCCA VEEA VEES LPFB LPFA Block Digagram & Pin out TESTSB Features • 1 chip transmitter for serial transmission of 18bit color	Original	PDF	CXB1451Q 18bit 80pin 50MHz 100kHz 00MHz 10dB/ CXB1451Q CXB1452Q QFP080-P-1414 ckmode parallel to serial converter GVIF cable
S3LU Abstract: SH-D Capacitor sus material 304 L027 L028 TIC-L027 Text: 3D Package View S3L2U Features: 1. Meets IEEE 802.3 and ANSI X3.263 2. Operating Temperature: 0 °C to +85 °C 3. 1500Vrms Isolation 4. Enhanced Common Mode Attenuation for maximum EMI Suppression 5. Full Product Qualification Tests 3D Package View S3U P/N	Original	PDF	1500Vrms TIC-L025 TIC-L026 TIC-L027 TIC-L028 TIC-L029 TIC-L030 TIC-L031 S3LU SH-D Capacitor sus material 304 L027 L028
Untitled Abstract: No abstract text available Text: User's Guide SLVU702 – March 2012 ESD Protection Diodes EVM DESCRIPTION The “ESD EVM” features a series of ESD protection diodes and can be used for destructive electrostatic discharge ESD pass/fail ESD strike, continuity, and signal pass-through tests. Specifically, it could be	Original	PDF	SLVU702 IEC-61000-4-2 TPD4E101DPW* TPD1E10B09DPY TPD1E6A14DPL TPD1E10B06DPY TPD1E6B06DPL TPD1E05U06DPY TPD1E05U06DPL TPD5E003DPF*
Untitled Abstract: No abstract text available Text: EMI Filters 4.1 to 4.7 4.1 - Production process flowchart 4.3 - Tests conducted during batch manufacture Standard products Multilayer ceramic part manufacture discoidal or planar array Solderability ● Voltage proof test DWV / Flash Solder assembly Cleaning process	Original	PDF	50Vdc 100Vdc 200Vdc 300Vdc 500Vdc
JESD22-A108 Abstract: JESD22*108 Text: AOS Semiconductor Product Reliability Report AO3421E, rev A Plastic Encapsulated Device ALPHA & OMEGA Semiconductor, Inc www.aosmd.com This AOS product reliability report summarizes the qualification result for AO3421E. Accelerated environmental tests are performed on a specific sample size, and then followed	Original	PDF	AO3421E, AO3421E. AO3421E Resul77x168 6x77x1000) JESD22-A108 JESD22*108
108-1163 Abstract: No abstract text available Text: Product Specification 108-1163-2 11Mar11 Rev C High Performance Modular Plugs & Jacks, PCB Mounted 1. SCOPE 1.1. Content This specification covers the performance, tests and quality requirements for TE Connectivity TE high performance modular plugs and jacks designed for printed circuit board mounting.	Original	PDF	11Mar11 31Mar97. 108-1163
Untitled Abstract: No abstract text available Text: AN706 EZSP-UART HOST INTERFACING GUIDE Formerly document 120-5049-000 This document describes procedures for initial tests of a host connected to an Ember ZigBee processor using EZSP-UART. It assumes that you have already read document 120-3010-000, UART Gateway Protocol Reference	Original	PDF	AN706
FLUKE 8840a specification Abstract: No abstract text available Text: AN770 S i826 X 5 K V I SOLATOR TEST R EPORT S UMMARY 1. Introduction This application note summarizes various performance, quality, and reliability test results for the Si826x isolator family. A summary of tests and their results is listed in Table 1. For more details on a particular test, see the	Original	PDF	AN770 Si826x IEC62539 IEC60065 J1752 IEC61967-2) FLUKE 8840a specification
Untitled Abstract: No abstract text available Text: Product Specification 108-1228 11Mar11 Rev F Connector, AMPLIMITE, Shielded, .050 Series 1. SCOPE 1.1. Content This specification covers perform ance, tests and quality requirem ents for AMPLIMITE .050 series product. This product consists of printed circuit board m ounted and cable applied plug and receptacle	Original	PDF	11Mar11 E-28476, LR-86179-1.

transistor jp4 Abstract: CMPD7000BK FMMT591A MAX664 MAX664CSA JP4-JP10 c5453 Text: 19-1110; Rev 0; 8/96 MAX3962 Evaluation Kit _Features ♦ Tests MAX3962 with Inductive Electrical Load or LED ♦ PECL Termination Provided ♦ Easy Adjustment of Modulation and Peaking Currents ♦ Single-Ended or Differential Input	Original	PDF	MAX3962 MAX3962EVKIT-SO MAX3962 transistor jp4 CMPD7000BK FMMT591A MAX664 MAX664CSA JP4-JP10 c5453
7003ZD Abstract: O116 V675 GPZA675 PR44 DA675 Text: Data Sheet Model No.: GPZA675 : : : : : : : : : : Note : When in use, the air access holes must remain uncovered. All performance data refers to storage in the sealed condition and electrical tests started 10 minutes after removal of sealing tab. ø8.1±0.2	Original	PDF	GPZA675 225hrs 7003ZD AC675E DA675X 11010I1264 7003ZD O116 V675 GPZA675 PR44 DA675
TLP508 Abstract: thyristor 072 0043 sl 1008 transistor thyristor st 103 Text: 9. Reliability 9.1 General In recent years, as the application fields for photo couplers expand, more discussions are being made on reliability. For reliability improvement, it is insufficient to perform strinct process management and to have reliability tests such as life test and environmental tests. It is necessary to	OCR Scan	PDF
3Y20 Abstract: No abstract text available Text: SN75186 QUADRUPLE DRIVER/RECEIVER WITH LOOPBACK D3389. FEBRUARY 1990 FN PACKAGE Meets Standards RS-232-C, EIA-232-D, and CCITT V.28 TOP VIEW Four Independent Drivers and Receivers CM O Ü z S I—JI—] L J L J , A 3 2 1 1 LB ] 5 N < Loopback Mode Functionally Self-Tests	OCR Scan	PDF	SN75186 D3389. RS-232-C, EIA-232-D, EIA-232-D MIL-STD-833C 3Y20
SMA rf pogo pin Abstract: oryx Text: o -Sì ESD Compliance Testing and Recommended Protection Circuits for GaAs Devices £ -ä oc o V i t 'S ^5 "o ro $ Introduction Alpha Industries conducts ESD testing at both the device and system levels. These tests are based on the requirements outlined in:	OCR Scan	PDF
ERC60 Abstract: ERC-60 Text: MODEL ERC Metal Film Resistors Military/Established Reliability, MIL-R-55182, Qualified, Type RNC FEATURES • Meets requirements of MIL-R-55182 • Very low noise • Verified Failure Rate Contact factory for current level • 100% stabilization and screening tests. Group A Testing, if	OCR Scan	PDF	MIL-R-55182, MIL-R-55182 100PPM/ 50PPM/ 25PPM/ ERC60 ERC-60
Untitled Abstract: No abstract text available Text: tlfCa — - Electronics 108-1579 P r0 d u c t . 19Dec01 RevA Specification e c 0990 - 1492-01 Sealed Circular Plastic Connector With Removable Crimp Contacts 1. SCOPE 1.1. Content This specification covers performance, tests and quality requirements fo r Tyco Electronics sealed	OCR Scan	PDF	19Dec01
Untitled Abstract: No abstract text available Text: +85°C Polypropylene Film Capacitors with Double Sided Metallized Electrodes IGBT Snubber Capacitor FEATURES Direct Mount IGBT Low ESR Low Self Inductance High Voltage WVDC and VAC High RMS Currents Negative Temperature Coefficient SPECIFICATIONS PERFORMANCE RATINGS/TESTS	OCR Scan	PDF	100VDC 205PMB700K 2O5PMB850K 225PMB850K 255PMB700K 255PMB850K 305PMB7B0K 3S5PMB700K
300b Abstract: 300B Valve 300 B VP-500 Text: 5B/300-B Stan dard Valves — 56 30C~BF VALVE TYPES 5B/300-B AND 5B/300-BF RF. PEN TO DES. The 5B/300-B and 5B/300-BF Valves are identical and the -F code indicates that the valve has passed special tests for use in Standard Aircraft Radio. SPECIFICATION.	OCR Scan	PDF	5B/300-B 5B/300-B 5B/300-BF 5B/300-BF /300-B 5B/30SBF 300b 300B Valve 300 B VP-500
03389 Abstract: D3389 A232D BV 726 B A-232-D SN75186 Text: SN75186 QUAD DRIVER/RECEIVER WITH LOOPBACK SLLS06BB - D3389. FEBRU ARY 1990 - R EV ISED MARCH 1993 * Meets Standards RS-232-C, EIA-232-D, and CCITT V.28 * Four Independent Drivers and Receivers * Loopback Mode Functionally Self-Tests Drivers and Receivers Without	OCR Scan	PDF	SN75186 d3389. RS-232-C, EIA-232-D, EIA-232-D MIL-STD-833C SN75186 03389 D3389 A232D BV 726 B A-232-D

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TESTS Search Results

TESTS Result Highlights (5)

TESTS Price and Stock

Fluke Corporation TS22-TEST-SET

ams OSRAM Group LIQUID-TEST-SETUP

Sensitron Semiconductors GRPBTEST/SDA1008SS

Sensitron Semiconductors GRPATEST/SDA1008SS

Sensitron Semiconductors TESTSETUPCHG/SHD620051PSS

TESTS Datasheets Context Search

Untitled

2D 1002

versacon 9

Untitled

Untitled

CXB1451Q

S3LU

Untitled

Untitled

JESD22-A108

108-1163

Untitled

FLUKE 8840a specification

Untitled

transistor jp4

7003ZD

TLP508

3Y20

SMA rf pogo pin

ERC60

Untitled

Untitled

300b

03389