Please enter a valid full or partial manufacturer part number with a minimum of 3 letters or numbers

    TEST TRANSISTORS Search Results

    TEST TRANSISTORS Result Highlights (5)

    Part ECAD Model Manufacturer Description Download Buy
    FO-62.5LPBLC0-001
    		Amphenol Cables on Demand Amphenol FO-62.5LPBLC0-001 LC Connector Loopback Cable: Multimode 62.5/125 Fiber Optic Port Testing .1m Datasheet
    SF-SFP28LPB1W-0DB
    		Amphenol Cables on Demand Amphenol SF-SFP28LPB1W-0DB SFP28 Loopback Adapter Module for SFP28 Port Compliance Testing - 0dB Attenuation & 1W Power Consumption Datasheet
    SF-SFPPLOOPBK-0DB
    		Amphenol Cables on Demand Amphenol SF-SFPPLOOPBK-0DB SFP+ Loopback Adapter Module for SFP+ Port Compliance Testing - 0dB Attenuation & 0W Power Consumption Datasheet
    FO-50LPBMTRJ0-001
    		Amphenol Cables on Demand Amphenol FO-50LPBMTRJ0-001 MT-RJ Connector Loopback Cable: Multimode 50/125 Fiber Optic Port Testing .1m Datasheet
    SF-SFPPLOOPBK-003.5
    		Amphenol Cables on Demand Amphenol SF-SFPPLOOPBK-003.5 SFP+ Loopback Adapter Module for SFP+ Port Compliance Testing - 3.5dB Copper/Optical Cable Emulation Datasheet

    TEST TRANSISTORS Datasheets Context Search

    Catalog Datasheet Type Document Tags PDF

    tunnel diode General Electric

    Abstract: tc4011bp
    Contextual Info: 1. Test Results A. Life Test Results Table 1 shows the life test results of B Series C2MOS IC. B Series is classified into SSI Family less than 100 transistors and MSI Family (More than transistors). Table 1 TEST TIME (hrs) EQUIVALENT NUMBER OF FAILURES


    OCR Scan     		83x106 tunnel diode General Electric tc4011bp PDF

    TC4011BP equivalent

    Contextual Info: 1. Test Results A. Life Test Results Table 1 shows the life test results of B Series C2M0S IC. B Series is classified into SSI Family less than 100 transistors and MSI Family (More than transistSfs). Table 1 B Series CJM0S (SSI Family) TYPE TEST ITEMS CONDITION


    OCR Scan     		FP-14pins FP-16pins 20Hrs 15pins -14pins TC4011BP equivalent PDF

    Willamette

    Abstract: project transistor tester
    Contextual Info: Intel Technology Journal Q1’99 Defect-Based Test: A Key Enabler for Successful Migration to Structural Test Sanjay Sengupta, MPG Test Technology, Intel Corp. Sandip Kundu, MPG Test Technology, Intel Corp. Sreejit Chakravarty, MPG Test Technology, Intel Corp.


    Original     		A4/T11 Willamette project transistor tester PDF

    107D

    Contextual Info: CHIP LED LAMPS GENERAL INFORMATION QUALITY CONTROL AND ASSURANCE Classification Endurance Test Environmental Test Test Item Reference Standard Test Conditions Operation Life MIL-STD-750 : 1026 MIL-STD-883 : 1005 JIS C 7021 : B-1 High Temperature High Humidity


    Original     		MIL-STD-202 MIL-STD-883 JIS-C-7021 MIL-STD-750 107D PDF

    Contextual Info: TestStation LX In-Circuit Test System Highest Quality In-Circuit Test ½ Configurable from 256 to 7680 test pins ½ Capable of testing large, complex, and heavily integrated PCBs ½ Safe, accurate, and reliable electrical test with SafeTest™ Protection


    Original     		AT-169-1004 PDF

    107D

    Abstract: HX2040
    Contextual Info: CHIP LED LAMPS GENERAL INFORMATION QUALITY CONTROL AND ASSURANCE Classification Endurance Test Environmental Test Test Item Reference Standard Test Conditions Result Operation Life MIL-STD-750 : 1026 MIL-STD-883 : 1005 JIS C 7021 : B-1 Connect with a power If = 20mA


    Original     		MIL-STD-202 240hrs MIL-STD-883 000hrs JIS-C-7021 MIL-STD-750 60min 107D HX2040 PDF

    BU-2143-D-48-0

    Abstract: BU-2241-D-48-0 BU-65621 BU-00225-2 BU225 BU302 BU-656-2 002070 BU-00243-2 BU326
    Contextual Info: 118-2012:QuarkCatalogTempNew 8/14/12 7:34 AM Page 118 INTERCONNECT TEST & MEASUREMENT 1 Test Accessories and DMM Kits BU-26101 and BU-26106 Insulated Plug-On Test Prod with Stainless Steel Tip DMM Replacement Leads and Probes BU-2143-D-48 Variable Length Test Prods


    Original     		BU-2143-D-48 BU-00285 BU-00286 BU-00287 BU-31602-0 BU-31602-2 BU-31603-0 BU-31603-2 BU-32603-0 BU-32603-2 BU-2143-D-48-0 BU-2241-D-48-0 BU-65621 BU-00225-2 BU225 BU302 BU-656-2 002070 BU-00243-2 BU326 PDF

    S5 100 B112 MT RELAY

    Abstract: konica IR sensor DVB-T Schematic set top box MIL-STD-291C Digital Panel Meter PM 428 S5 100 B112 RELAY DVB-C receiver schematic diagram service manual tv seg pacific
    Contextual Info: Test & Measurement Catalog 2015 Chapter Contents Page Company profile ❙❙ Our business fields and products 2 1 Aerospace and defense test solutions ❙❙ Radar test systems ❙❙ ILS test system 6 2 Wireless ­communications testers and systems ❙❙ Wireless device testers


    Original     		ZV-Z170/-Z135/-Z129 ZN-Z15x S5 100 B112 MT RELAY konica IR sensor DVB-T Schematic set top box MIL-STD-291C Digital Panel Meter PM 428 S5 100 B112 RELAY DVB-C receiver schematic diagram service manual tv seg pacific PDF

    Contextual Info: AP1114 Transistors Si PNP Power BJT Military/High-RelN V BR CEO (V)90ö V(BR)CBO (V)150 I(C) Max. (A)30 Absolute Max. Power Diss. (W) Maximum Operating Temp (øC) I(CBO) Max. (A) @V(CBO) (V) (Test Condition) V(CE)sat Max. (V) @I(C) (A) (Test Condition) @I(B) (A) (Test Condition)


    Original     		AP1114 Freq80M PDF

    Contextual Info: AP1112 Transistors Si PNP Power BJT Military/High-RelN V BR CEO (V)90ö V(BR)CBO (V)120 I(C) Max. (A)50 Absolute Max. Power Diss. (W) Maximum Operating Temp (øC) I(CBO) Max. (A) @V(CBO) (V) (Test Condition) V(CE)sat Max. (V) @I(C) (A) (Test Condition) @I(B) (A) (Test Condition)


    Original     		AP1112 Freq50M PDF

    Contextual Info: DTL3503 Transistors Si PNP Power BJT Military/High-RelN V BR CEO (V)80 V(BR)CBO (V) I(C) Max. (A)0.5 Absolute Max. Power Diss. (W)7.0 Maximum Operating Temp (øC) I(CBO) Max. (A) @V(CBO) (V) (Test Condition) V(CE)sat Max. (V) @I(C) (A) (Test Condition) @I(B) (A) (Test Condition)


    Original     		DTL3503 Freq50M PDF

    Contextual Info: DTL3509 Transistors Si PNP Power BJT Military/High-RelN V BR CEO (V)40 V(BR)CBO (V) I(C) Max. (A)0.5 Absolute Max. Power Diss. (W)29 Maximum Operating Temp (øC) I(CBO) Max. (A) @V(CBO) (V) (Test Condition) V(CE)sat Max. (V) @I(C) (A) (Test Condition) @I(B) (A) (Test Condition)


    Original     		DTL3509 Freq50M PDF

    Contextual Info: AP1111 Transistors Si PNP Power BJT Military/High-RelN V BR CEO (V)100ö V(BR)CBO (V)100 I(C) Max. (A)60 Absolute Max. Power Diss. (W) Maximum Operating Temp (øC) I(CBO) Max. (A) @V(CBO) (V) (Test Condition) V(CE)sat Max. (V) @I(C) (A) (Test Condition) @I(B) (A) (Test Condition)


    Original     		AP1111 Freq50M PDF

    Contextual Info: DTL3426 Transistors Si NPN Power BJT Military/High-RelN V BR CEO (V)60 V(BR)CBO (V) I(C) Max. (A)2.0 Absolute Max. Power Diss. (W)9 Maximum Operating Temp (øC) I(CBO) Max. (A) @V(CBO) (V) (Test Condition) V(CE)sat Max. (V) @I(C) (A) (Test Condition) @I(B) (A) (Test Condition)


    Original     		DTL3426 Freq40M PDF

    2SC5147

    Contextual Info: 2SC5147 Transistors Si NPN Power BJT Military/High-RelN V BR CEO (V)300 V(BR)CBO (V) I(C) Max. (A)100m Absolute Max. Power Diss. (W)10 Maximum Operating Temp (øC) I(CBO) Max. (A) @V(CBO) (V) (Test Condition) V(CE)sat Max. (V) @I(C) (A) (Test Condition) @I(B) (A) (Test Condition)


    Original     		2SC5147 PDF

    Contextual Info: PP3000 Transistors Si NPN Power BJT Military/High-RelN V BR CEO (V)50 V(BR)CBO (V)60 I(C) Max. (A)15 Absolute Max. Power Diss. (W)115 Maximum Operating Temp (øC) I(CBO) Max. (A) @V(CBO) (V) (Test Condition) V(CE)sat Max. (V) @I(C) (A) (Test Condition) @I(B) (A) (Test Condition)


    Original     		PP3000 PDF

    Contextual Info: 2SC4937A Transistors Si NPN Power BJT Military/High-RelN V BR CEO (V)400 V(BR)CBO (V) I(C) Max. (A)2.0 Absolute Max. Power Diss. (W)35 Maximum Operating Temp (øC) I(CBO) Max. (A) @V(CBO) (V) (Test Condition) V(CE)sat Max. (V) @I(C) (A) (Test Condition) @I(B) (A) (Test Condition)


    Original     		2SC4937A PDF

    Contextual Info: SK3846 Transistors Si PNP Power BJT Military/High-RelN V BR CEO (V)200 V(BR)CBO (V)200 I(C) Max. (A)10 Absolute Max. Power Diss. (W)200 Maximum Operating Temp (øC) I(CBO) Max. (A) @V(CBO) (V) (Test Condition) V(CE)sat Max. (V) @I(C) (A) (Test Condition) @I(B) (A) (Test Condition)


    Original     		SK3846 Freq14MÃ PDF

    Contextual Info: 2SB1386 Transistors Si PNP Power BJT Military/High-RelN V BR CEO (V)20 V(BR)CBO (V) I(C) Max. (A)10 Absolute Max. Power Diss. (W)2.0 Maximum Operating Temp (øC) I(CBO) Max. (A) @V(CBO) (V) (Test Condition) V(CE)sat Max. (V) @I(C) (A) (Test Condition) @I(B) (A) (Test Condition)


    Original     		2SB1386 PDF

    Contextual Info: AP1011 Transistors Si PNP Power BJT Military/High-RelN V BR CEO (V)350ö V(BR)CBO (V)450 I(C) Max. (A)15 Absolute Max. Power Diss. (W) Maximum Operating Temp (øC) I(CBO) Max. (A) @V(CBO) (V) (Test Condition) V(CE)sat Max. (V) @I(C) (A) (Test Condition) @I(B) (A) (Test Condition)


    Original     		AP1011 Freq25M PDF

    Contextual Info: 2SD1897 Transistors Si NPN Power BJT Military/High-RelN V BR CEO (V)100 V(BR)CBO (V) I(C) Max. (A)5.0 Absolute Max. Power Diss. (W)30 Maximum Operating Temp (øC) I(CBO) Max. (A) @V(CBO) (V) (Test Condition) V(CE)sat Max. (V) @I(C) (A) (Test Condition) @I(B) (A) (Test Condition)


    Original     		2SD1897 PDF

    Contextual Info: PT3691 Transistors Si NPN Power BJT Military/High-RelN V BR CEO (V)40 V(BR)CBO (V)70 I(C) Max. (A).50 Absolute Max. Power Diss. (W)20 Maximum Operating Temp (øC) I(CBO) Max. (A) @V(CBO) (V) (Test Condition) V(CE)sat Max. (V) @I(C) (A) (Test Condition) @I(B) (A) (Test Condition)


    Original     		PT3691 PDF

    Contextual Info: SK3929 Transistors Si NPN Power BJT Military/High-RelN V BR CEO (V)200 V(BR)CBO (V)200 I(C) Max. (A)2.0 Absolute Max. Power Diss. (W)30 Maximum Operating Temp (øC) I(CBO) Max. (A) @V(CBO) (V) (Test Condition) V(CE)sat Max. (V) @I(C) (A) (Test Condition) @I(B) (A) (Test Condition)


    Original     		SK3929 Freq15M PDF

    Contextual Info: 2SD2396 Transistors Si NPN Power BJT Military/High-RelN V BR CEO (V)60 V(BR)CBO (V) I(C) Max. (A)3.0 Absolute Max. Power Diss. (W)30 Maximum Operating Temp (øC) I(CBO) Max. (A) @V(CBO) (V) (Test Condition) V(CE)sat Max. (V) @I(C) (A) (Test Condition) @I(B) (A) (Test Condition)


    Original     		2SD2396 PDF