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    TEST Search Results

    TEST Result Highlights (5)

    Part ECAD Model Manufacturer Description Download Buy
    SSCTESTBDV1P0 Renesas Electronics Corporation SSC Test Board Visit Renesas Electronics Corporation
    SSCTESTBDQFN24V1P0 Renesas Electronics Corporation SSC Test Board for 24 and 32 Pin QFN Packages Visit Renesas Electronics Corporation
    FO-62.5LPBMT0-001 Amphenol Cables on Demand Amphenol FO-62.5LPBMT0-001 MT-RJ Connector Loopback Cable: Multimode 62.5/125 Fiber Optic Port Testing .1m Datasheet
    FO-9LPBMTRJ00-001 Amphenol Cables on Demand Amphenol FO-9LPBMTRJ00-001 MT-RJ Connector Loopback Cable: Single-Mode 9/125 Fiber Optic Port Testing .1m Datasheet
    SF-SFP28LPB1W-3DB Amphenol Cables on Demand Amphenol SF-SFP28LPB1W-3DB SFP28 Loopback Adapter Module for SFP28 Port Compliance Testing - 3dB Attenuation & 1W Power Consumption Datasheet
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    Microchip Technology Inc MCP6404T-E-ST

    IC OPAMP GP 4 CIRCUIT 14TSSOP
    Distributors Part Package Stock Lead Time Min Order Qty Price Buy
    DigiKey MCP6404T-E-ST Digi-Reel 46,612 1
    • 1 $0.77
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    Microchip Technology Inc MCP6274T-E-ST

    IC OPAMP GP 4 CIRCUIT 14TSSOP
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    DigiKey MCP6274T-E-ST Cut Tape 9,324 1
    • 1 $1.59
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    MCP6274T-E-ST Digi-Reel 9,324 1
    • 1 $1.59
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    MCP6274T-E-ST Reel 5,000 2,500
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    Microchip Technology Inc AVR32DD28T-E-STX

    32KB, 8KB RAM, 28P, 24MHZ, MVIO,
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    DigiKey AVR32DD28T-E-STX Digi-Reel 3,170 1
    • 1 $1.16
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    AVR32DD28T-E-STX Cut Tape 3,170 1
    • 1 $1.16
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    Vishay Semiconductors TEST2600

    PHOTOTRANSISTOR 850 TO 980 NM
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    DigiKey TEST2600 Bulk 3,055 1
    • 1 $1.26
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    Microchip Technology Inc 24LC16BHT-E-ST

    IC EEPROM 16KBIT I2C 8TSSOP
    Distributors Part Package Stock Lead Time Min Order Qty Price Buy
    DigiKey 24LC16BHT-E-ST Cut Tape 2,500 1
    • 1 $0.52
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    24LC16BHT-E-ST Digi-Reel 2,500 1
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    24LC16BHT-E-ST Reel 2,500 2,500
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    • 10000 $0.4841
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    TEST Datasheets (442)

    Part ECAD Model Manufacturer Description Curated Datasheet Type PDF
    100 Test Products International Equipment - Multimeters, Test and Measurement, DMM AUTO RANGE W/BOOT Original PDF
    1010 Test Products International Equipment - Environmental Testers, Test and Measurement, HUMIDITY IAQ METER W DATA LOGGNG Original PDF
    1010A Test Products International Equipment - Environmental Testers, Test and Measurement, INDOOR AIR QUALITY METER Original PDF
    1020 Test Products International Equipment - Environmental Testers, Test and Measurement, SINGLE CHANNEL PARTICLE COUNTER Original PDF
    120082 Test Products International Attenuators, RF/IF and RFID, ATTENUATOR BNC 3DB 1.0W Original PDF
    120083 Test Products International Attenuators, RF/IF and RFID, ATTENUATOR BNC 6DB 1.0W Original PDF
    120084 Test Products International Attenuators, RF/IF and RFID, ATTENUATOR BNC 10DB 1.0W Original PDF
    120085 Test Products International Attenuators, RF/IF and RFID, ATTENUATOR BNC 20DB 1.0W Original PDF
    120086 Test Products International Miscellaneous, Kits, KIT ATTENUATOR 3DB 6DB 10DB 20DB Original PDF
    122 Test Products International Equipment - Multimeters, Test and Measurement, COMPACT DIGITAL ADAPTER Original PDF
    123501B/10' Test Products LEAD 10 FT BLK Original PDF
    123501B/5' Test Products LEAD 5 FT BLK Original PDF
    123501R/10' Test Products LEAD 10 FT RED Original PDF
    123501R/5' Test Products LEAD 5 FT RED Original PDF
    183A Test Products International Equipment - Multimeters, Test and Measurement, DIGITAL MULTIMETER Original PDF
    190 Test Products International Equipment - Multimeters, Test and Measurement, DMM AUTO-RANGE W/BOOT IND HVAC Original PDF
    192 Test Products International Equipment - Multimeters, Test and Measurement, DMM AUTO-RANGE W/INDUCTANCE Original PDF
    194 Test Products International Equipment - Multimeters, Test and Measurement, DMM AUTO-RANGE IND 600V CAT IV Original PDF
    196 Test Products International Equipment - Multimeters, Test and Measurement, DMM AUTO-RANGE 0-24MA OUTPUT Original PDF
    1P20B Test Products International Test Leads - Oscilloscope Probes, Test and Measurement, PROBE OSCILLOSCOPE 15MHZ X1 Original PDF
    ...

    TEST Datasheets Context Search

    Catalog Datasheet MFG & Type PDF Document Tags

    TLP3375

    Abstract: No abstract text available
    Text: TLP3375 Photocouplers Photorelay TLP3375 1. Applications • High-Speed Memory Testers • High-Speed Logic IC Testers • Radio-Frequency Measuring Instruments • ATE Automatic Test Equipment 2. General The TLP3375 photorelay consists of a photo MOSFET optically coupled to an infrared light emitting diode. It is


    Original
    PDF TLP3375 TLP3375

    C3 marking code sot 223

    Abstract: MMIC marking code C3 sot89 cs 1694
    Text: TQP369182 DC-6 GHz Gain Block Applications •      Wireless Infrastructure CATV / SATV / MoCA Point to Point Defense & Aerospace Test & Measurement Equipment General Purpose Wireless Product Features          SOT-89 Package


    Original
    PDF TQP369182 OT-89 DC-6000 TQP369182 C3 marking code sot 223 MMIC marking code C3 sot89 cs 1694

    Untitled

    Abstract: No abstract text available
    Text: TQP4M9072 High Linearity 6-Bit, 31.5dB Digital Step Attenuator Applications •     Mobile Infrastructure LTE / WCDMA / CDMA / EDGE Test Equipments and Sensors IF and RF Applications General Purpose Wireless 24-pin 4x4mm leadless QFN package 3


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    PDF TQP4M9072 24-pin

    Untitled

    Abstract: No abstract text available
    Text: TLC1542C, TLC1542I, TLC1542M, TLC1542Q, TLC1543C, TLC1543I, TLC1543Q 10-BIT ANALOG-TO-DIGITAL CONVERTERS WITH SERIAL CONTROL AND 11 ANALOG INPUTS SLAS052E – MARCH 1992 – OCTOBER 1998 10-Bit Resolution A/D Converter 11 Analog Input Channels Three Built-In Self-Test Modes


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    PDF TLC1542C, TLC1542I, TLC1542M, TLC1542Q, TLC1543C, TLC1543I, TLC1543Q 10-BIT SLAS052E

    BCT8373A

    Abstract: No abstract text available
    Text: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE


    Original
    PDF SN54BCT8373A, SN74BCT8373A SCBS044F BCT373 SCBA004C SDYA010 SDYA012 SSYA002C, SZZU001B, SDYU001N, BCT8373A

    MP1470

    Abstract: No abstract text available
    Text: TH I S DRAW I NG I S U N P U B L I S H E D . COP Y R I GH T BY 20 REVISIONS R E L E A S E D POR P U B L I C A T I ON TYCO ELECTRONICS ALL CORPORATION RIGHTS RESERVED. LTR -TEST EAC CLAMP I NG SCREW 2 9.5 3 D E S C R I P T I ON DATE R E V I S E D PER 0 G 3 B - 0 I 19-01


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    PDF

    Untitled

    Abstract: No abstract text available
    Text: THIS DRAWING IS COPYRIGHT UNPUBLISHED. 20 RELEASED BY TYCO ELECTRONICS CORPORATION FOR ALL 20 PUBLICATION RIGHTS LOC RESERVED. REV I S IONS D I ST FT LTR DESCRIPTION REVISED -TEST C L A M P I NG SCREW­ / ^ DWN DATE P E R 0 G 3 B - 0 I 19-01 APVD EZ 3 I OCT 2 0 0 I


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    PDF I0CT200

    2SC2640

    Abstract: pj 71
    Text: SILICON NPN EPITAXIAL PLANAR TYPE 2SC2640 Unit in mm VHF BAND POWER AMPLIFIER APPLICATIONS. FEATURES : Output Power : Po=28W Min, ( f=175MHz, VCC=12.5V, Pi=4W ) 100% Tested for Load Mismatch Stress at All Phase Angles with 30:1 VSWR @ VCC=14.5V, Pj=4W, f=175MHz


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    PDF 2SC2640 175MHz, 175MHz 2SC2640 pj 71

    Untitled

    Abstract: No abstract text available
    Text: SAFETY DRGANIZATIDNS RELIABILITY SPECIFICATIONS: TH IS F ILT E R HAS BEEN FORMALLY RRCDONIZOD, C ER TIFIED DR APPROVED BY THE LIST ED AGENCY, THEREFORE, ALL TEST/REQUIREMENTS SP EC IFIED IN THE TEST REVISION OF TBE FOLLOWING AGENLY STANDARDS HAVE BEEN MET


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    PDF 50-00H 250VAC

    2SC1955

    Abstract: No abstract text available
    Text: SILICON NPN EPITAXIAL PLANAR TYPE 2SC1955 Unit in mm VHF BAND POWER AMPLIFIER APPLICATIONS. 0S59MAX. g ja 4 5 M A X . FEATURES : Output Power : f=175MHz, Po=2.8W (Min. Vcc=13.5V, Pi=0.15W) 100% Tested for Load Mismatch Stress at All Phase Angles with 30:1 VSWR


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    PDF 2SC1955 175MHz, 0S59MAX. 175MHz -30pF 2SC1955

    p721f

    Abstract: P721 TLP721F p72-1f VDE0303Part1
    Text: TLP721 D4 series (T L P 7 2 H D 4 ) ATTACHMENT : SPECIFICATIONS FOR VDE0884 OPTION Types : TLP721, TLP721F Type designations for ‘ Option : (D4) ’ , which are tested under VDE0884 requirements. Ex. : TLP721 (D4-GR-LF4) D4 : VDE0884 option GR : CTR rank name


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    PDF TLP721 VDE0884 TLP721, TLP721F TLP721 p721f P721 p72-1f VDE0303Part1

    Untitled

    Abstract: No abstract text available
    Text: TOSHIBA TLP3540 TOSHIBA PHOTOCOUPLER GaAs IRED & PHOTO-MOS FET T L P 3 540 Unit in mm M EM O R Y TESTERS LOGIC 1C TESTERS DATA RECORDING EQUIPMENT 7 6 5 CT1 n_ n l~P MEASURING EQUIPMENT TLP3540 is a photorelay and consists of a GaAs infrared emitting diode optically coupled to a photo-MOSFET in a 8-pin DIP package.


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    PDF TLP3540 TLP3540 5X1010

    Untitled

    Abstract: No abstract text available
    Text: TOSHIBA TLP3111 TOSHIBA PHOTOCOUPLER GaAs IRED & PHOTO-MOS FET T• I Pm v? 1■ 1■ 1■ MEASUREMENT INSTRUMENTS LOGIC IC TESTERS/MEMORY TESTERS BOARD TESTERS/SCANNERS The TOSHIBA MINI FLAT PHOTO RELAY TLP3111 is a small outline photo relay, suitable for surface m ount assembly.


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    PDF TLP3111 TLP3111

    VDE0884

    Abstract: No abstract text available
    Text: TLP12KD4 T LPl 2 1 (0 4 ) ATTACHMENT : SPECIFICATIONS FOR VDE0884 OPTION Types : TLP121 Type designations for ‘Option : (D4)’ , which are tested under VDE0884 requirements. Ex. : TLP121 (D4-GR-TPR) D4 : VDE0884 option GR CTR rank name TPR : standard taping name


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    PDF TLP12KD4) VDE0884 TLP121 TLP121 VDE0110

    a1310a

    Abstract: No abstract text available
    Text: SN54ABTH18504A, SN54ABTH182504A, SN74ABTH18504A, SN74ABTH182504A SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS _ _ SCBS165A-AUGUST 1 9 9 3 - REVISED AUGUST 1994 Members of the Texas Instruments


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    PDF SN54ABTH18504A, SN54ABTH182504A, SN74ABTH18504A, SN74ABTH182504A 20-BIT SCBS165A-AUGUST ABTH182504A a1310a

    TLP508

    Abstract: thyristor 072 0043 sl 1008 transistor thyristor st 103
    Text: 9. Reliability 9.1 General In recent years, as the application fields for photo couplers expand, more discussions are being made on reliability. For reliability improvement, it is insufficient to perform strinct process management and to have reliability tests such as life test and environmental tests. It is necessary to


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    PDF

    Untitled

    Abstract: No abstract text available
    Text: SAFETY ORGANIZATIONS RELIABILITY SPECIFICATIONS: THIS FILTER HAS BEEN FORMALLY RECOGNIZED, CERTIFIED DR APPROVED BY THE LISTED AGENCY. THEREFORE, ALL TEST/REQUIREMENTS SPECIFIED IN THE TEST REVISION DF THE FOLLOWING AGENCY STANDARDS HAVE BEEN MET: STORAGE TEMPERATURE: -40°C TO +85°C


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    PDF 07NDV08 250VAC 006uF

    74ABTH18646A

    Abstract: No abstract text available
    Text: SN54ABTH18646A, SN54ABTH182646A, SN74ABTH18646A, SN74ABTH182646A SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS SCBS166D - AUGUST 1993 - REVISED JULY 1996 Members of the Texas Instruments SCOPE Family of Testability Products One Boundary-Scan Cell Per I/O


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    PDF SN54ABTH18646A, SN54ABTH182646A, SN74ABTH18646A, SN74ABTH182646A 18-BIT SCBS166D ABTH182646A 25-i2 74ABTH18646A

    2SC2379

    Abstract: No abstract text available
    Text: 2SC2379 SILICON NPN EPITAXIAL PLANAR TY P E Unit in mm UHF BAND POWER AMPLIFIER APPLICATIONS. FEATURES : . Output Power : P0=6W Min. (f=470MHz, VCC=12.6V, Pi=lW) . 100% Tested for Load Mismatch Stress at All Phase Angles with 30:1 VSWR @ VCC=12.5V, P0-6.5W, f=470MHz


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    PDF 2SC2379 470MHz, 470MHz 470MH 47QMHz x15mm 2SC2379

    programmable storage device

    Abstract: No abstract text available
    Text: TMS29F816 16 384-BIT SCOPE DIARY JTAG ADDRESSABLE STORAGE DEVICE SMJS816B-NOVEMBER1990-REVISED JANUARY 1993 FM PACKAGEt TOP VIEW * Member of Texas Instruments SCOPE'“ Family of Testability Products * IEEE 1149.1 Serial Test Bus Compatible * Organization . . . 2048 x 8-Bit Flash Memory


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    PDF TMS29F816 384-BIT SMJS816B-NOVEMBER1990-REVISED 29F816-06 1024-Byte programmable storage device

    2SC2178

    Abstract: copper wire
    Text: SILICON NPN EPITAXIAL PLANAR TYPE 2SC2178 Unit in mm VHF BAND POWER AMPLIFIER APPLICATIONS. FEATURES : Output Power : Po=15W Min. ( f=175MHz, VCC=12.5V, Pi=1.3W ) 100% Tested for Load Mismatch Stress at All Phase Angles with 30:1 VSWR @ VCC=15V, Pl=1.3W, f=175MHz


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    PDF 2SC2178 175MHz, 175MHz 8-10H1A l75MHz, 2SC2178 copper wire

    tle2202

    Abstract: No abstract text available
    Text: TLC2202, TLC2202A JL C 2 2 0 2 B , TLC2202Y Advanced LinCM O S LOW-NOISE PRECISION DUAL OPERATIONAL AMPLIFIERS D3497, MAY 1990 - REVISED AUGUST 1991 TLC2202B Is 100% Tested for Noise: 25 nV/VHz Max at f = 10 Hz 12 nV/VRz Max at f = 1 kHz Low Input Offset Voltage . . . 500 jiV Max


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    PDF TLC2202, TLC2202A TLC2202Y D3497, TLC2202B TLC2202A, TLC2202B, tle2202

    Untitled

    Abstract: No abstract text available
    Text: 4 THIS DRAWING IS UNPUBLISHED. COPYRIGHT - 2 3 RELEASED BY TYCO ELECTRONICS CORPORATION. FOR PUBLICATION LOC ALL RIGHTS RESERVED. HT DI5T 0 0 R E V IS IO N S H LTR DESCRIPTION NOTES: H I RO S E C O M P A T I B L E , 2 . 0 M M MATI NG HEI GHT. 1 0 0 % E L E C T R I CA L TEST I NG FOR:


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    PDF 29APR05 100ms MAY05 I750108-' 31MAR2000 10MAR05 JD002574

    3Y20

    Abstract: No abstract text available
    Text: SN75186 QUADRUPLE DRIVER/RECEIVER WITH LOOPBACK D3389. FEBRUARY 1990 FN PACKAGE Meets Standards RS-232-C, EIA-232-D, and CCITT V.28 TOP VIEW Four Independent Drivers and Receivers CM O Ü z S I—JI—] L J L J , A 3 2 1 1 LB ] 5 N < Loopback Mode Functionally Self-Tests


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    PDF SN75186 D3389. RS-232-C, EIA-232-D, EIA-232-D MIL-STD-833C 3Y20