STD 357 Search Results

Contextual Info: VSC7306 Data Sheet FEATURES • Full-duplex flow control IEEE Std 802.3x • Flexible link aggregation based on IEEE Std 802.3ad • 32-bit standard parallel CPU interface for SNMP and Web-based management 8 k MAC addresses and 4 k VLAN support (IEEE Std 802.1Q)

electrical power system

Abstract: IEEE STD 1100-1999 abstract for grounding electrical system maintenance practices
Contextual Info: IEEE Std 1100-1999 Revision of IEEE Std 1100-1992 IEEE Recommended Practice for Powering and Grounding Electronic Equipment Sponsor Power Systems Engineering Committee of the Industrial and Commercial Power Systems Department of the IEEE Industry Applications Society

MS27212

Abstract: MIL-T-55155 D1277B MS25036-102 MS25435 MS27429 MS20659-126 MIL-T-16366 M81824 MIL-T-15659
Contextual Info: MIL-STD-l277B 28 December 1983 SUPERSEDING MIL-S- D-1277A 22 Ju’y 1970 MILITARY STANDARD SPLICES, TERMINALS, TERMINAL BINDING POSTS, TERMINAL JUNCTION SYSTEMS, WIRE CAPS; ELECTRICAL BOARDS, MIL-STD-1277B I EPARTMENTOF I)EF13NSI: WASI{INGTON. D.C. ‘20301

implement AES encryption Using Cyclone II FPGA Circuit

Abstract: EP2S15 EP2S180 EP2S30 EP2S60 EP2S90
Contextual Info: 3. Configuration & Testing SII51003-4.2 IEEE Std. 1149.1 JTAG BoundaryScan Support All Stratix II devices provide Joint Test Action Group JTAG boundary-scan test (BST) circuitry that complies with the IEEE Std. 1149.1. JTAG boundary-scan testing can be performed either before

EPCS128

Abstract: EPCS64 SRUNNER
Contextual Info: 3. Configuration & Testing SIIGX51005-1.3 IEEE Std. 1149.1 JTAG BoundaryScan Support All Stratix II GX devices provide Joint Test Action Group JTAG boundary-scan test (BST) circuitry that complies with the IEEE Std. 1149.1. JTAG boundary-scan testing can be performed either before

CDF Series capasitor

Abstract: EPCS128 EPCS64
Contextual Info: 3. Configuration & Testing SIIGX51005-1.4 IEEE Std. 1149.1 JTAG BoundaryScan Support All Stratix II GX devices provide Joint Test Action Group JTAG boundary-scan test (BST) circuitry that complies with the IEEE Std. 1149.1. You can perform JTAG boundary-scan testing either before or

systron Donner 410

Abstract: MIL-STD-750E Ultrasonic Atomizing Transducer systron donner accelerometer substitute diode PH 33D fastest finger first indicator synopsis emerson three phase dc motor driver service note tektronix 576 curve tracer MIL-STD-750E 1071 proximity detector sensor
Contextual Info: The documentation and process conversion measures necessary to comply with this revision shall be completed by 20 June 2007 INCH - POUND MIL-STD-750E 20 November 2006 SUPERSEDING MIL-STD-750D 28 FEBRUARY 1995 DEPARTMENT OF DEFENSE TEST METHOD STANDARD TEST METHODS FOR SEMICONDUCTOR DEVICES

AGX51003-1

Abstract: AN414 AN418 AN423 EPCS128 EPCS64
Contextual Info: 3. Configuration and Testing AGX51003-1.2 IEEE Std. 1149.1 JTAG BoundaryScan Support All ArriaTM GX devices provide Joint Test Action Group JTAG boundary-scan test (BST) circuitry that complies with the IEEE Std. 1149.1. JTAG boundary-scan testing can be performed either before or

embedded control handbook

Abstract: EP1S60 EPC16 MAX1617A MAX1619 jrunner rbf
Contextual Info: 3. Configuration & Testing S51003-1.3 IEEE Std. 1149.1 JTAG Boundary-Scan Support All Stratix devices provide JTAG BST circuitry that complies with the IEEE Std. 1149.1a-1990 specification. JTAG boundary-scan testing can be performed either before or after, but not during configuration. Stratix

MIL-STD-750E

Abstract: 1N21B diode cc 3053 MIL-PRF-680 D65019 rectifier 2037-1 TT 2076 SAE-ARP-743 1N21B diode 1N21* Diode Detector Holder
Contextual Info: The documentation and process conversion measures necessary to comply with this revision shall be completed by 20 June 2007 INCH - POUND MIL-STD-750E 20 November 2006 SUPERSEDING MIL-STD-750D 28 FEBRUARY 1995 DEPARTMENT OF DEFENSE TEST METHOD STANDARD TEST METHODS FOR SEMICONDUCTOR DEVICES

EP2C50

Abstract: CII51003-2 EP2C20 EP2C35 cyclic redundancy code Some Altera devices have weak pull-up resistors altera usb blaster
Contextual Info: 3. Configuration & Testing CII51003-2.2 IEEE Std. 1149.1 JTAG Boundary Scan Support All Cyclone II devices provide JTAG BST circuitry that complies with the IEEE Std. 1149.1. JTAG boundary-scan testing can be performed either before or after, but not during configuration. Cyclone II devices can

ES-99033-0001

Abstract: X314 L399 X324
Contextual Info: 10 NOTES• 90 27- 1. APPL. CLASS TO DIN 40040 HME -25°C/+100°C . 2. COMPATIBLE WITH MOLEX PT 90325. 3. USE WITH CABLES 28AWG STD. 26AWG STD. AND 26AWQ (69 STRANDS) SUPERFLEX. 4. TERMINATION SPECIFICATION: ES-99033-0001. 5. PRODUCT SPECIFICATION: PS-99020-0011.

IMS1601LM

Abstract: A12CI
Contextual Info: IM S 1 6 0 0 M IM S 1 6 0 1 L M CMOS High Performance 64K x 1 Static RAM MIL-STD-883C FEATURES DESCRIPTION • INMOS' Very High Speed CMOS • Advanced Process -1 .6 Micron Design Rules • Full Military Temperature Operating Range -55°C to +125“C • MIL-STD-883C Processing

H06X-XXX-X-14-X-X

Abstract: .1/100V/30021
Contextual Info: 0. 80 mm HERMAPHRODITIC CONNECTOR CENTURY INTERCONNECT PRODUCTS 800-221-3576 203-375-5344 FAX 203-375-1631 SPECIFICATION: INSULATOR MATERIAL: HIGH TEMPERATURE THERMOPLASTIC FLAMMABILITY RATING: UL94V-0 INSULATION RESISTANCE: 1000 MEGOHMS MIN. PER MIL-STD-1344A METHOD 3003.1

Contextual Info: MICROPAC INDUSTRIES INC 30 deTJ biiamo ooooatiti a /77/f T -58-11-13 725 E, Walnut Street Garland, Texas 75040 214 272-3571 TWX 910-860-5186 MICROPAC INDUSTRIES, INC. P R E LIM IN A R Y MIVR 42079 1.5A FIXED THREE TERMINAL NEGATIVE REGULATORS Screened to Mil. Std. 883B.

78HXX

Abstract: 78HXXA 5A 5V regulator
Contextual Info: NICROPAC IND UST RI ES INC 3D ~ DE | bliabMO □ □□□at.E 5 T-58-11-13 725 E. Walnut Street Garland, Texas 75040 214 272-3571 TWX 910-860-5186 mu MICROPAC INDUSTRIES, INC. PRELIMINARY MIVR 42059 5V - 5A HYBRID POSITIVE VOLTAGE REGULATOR S creened to M il. Std. 883B

217F

Abstract: DHVF2812S DVHF2803R3S DVHF2805D DVHF2805S DVHF2812D DVHF2815D DVHF2815S DVHF28512T
Contextual Info: Fully Qualified Military Converters DVHF SERIES 20 Watts • Single, Dual & Triple Output Models • Designed To Meet MIL-STD-704A-D • Radiation Hardened Version • Patented Magnetic Isolation • Military & Space Screening Available • Hermetically Sealed

Contextual Info: Product specification SlgnetlcsMilitary Microprocessor Products Enhanced programmable communications interface EPCI 68661/2661 NO TIC E: This product is non-compliant to MlL-STD-883. DESCRIPTION - 5- to 6-bit characters plus parity The Signetics 68661 EPCI is a universal

FR103

Abstract: FR107
Contextual Info: FR103, FR107 Fast Recovery Axial Rectifiers Features: • Low forward voltage drop. • High current capability. • High reliability. • High surge current capability. DO-41 Mechanical Data: Case : Moulded plastic. Lead : Axial leads, solderable per MIL-STD-202,

SF-32

Abstract: diode rectifier SF32
Contextual Info: SF32 Super Fast Rectifier Diode Axial Features: • Low forward voltage drop. • High current capability. • High reliability. • High surge current capability. DO-201AD Mechanical Data: Case : Moulded plastic. Lead : Axial leads, solderable per MIL-STD-202,

diode vrrm 8000 if 7000

Abstract: LOW FORWARD VOLTAGE DROP DIODE RECTIFIER "RECTIFIER DIODE" C 5022 diode rectifier diode super fast SF12
Contextual Info: SF12 Super Fast Rectifier Diode Axial Features: • Low forward voltage drop. • High reliability. • High surge current capability. Mechanical Data: DO-41 Case : Moulded plastic. Lead : Axial leads, solderable per MIL-STD-202, Method 208 guaranteed. Polarity

Contextual Info: GSD REVISIONS CHANGES ER 35794 MJB 09/20/94 KD Ol I O I CO 2-1543-1M27 NOTES: 1. FOR USE WITH BOEING S280W503-4 AND ADAMS RUSSELL FC28Z CABLES. 2. FOR CABLING INSTRUCTIONS SEE 3=546=2. 3. FOR CRIMPING USE DIE KTH-2212. 4. INTERFACE PER MIL-STD-348, FIG. 313=1.

SJS830200

Abstract: SJS830100 EIA-364-31
Contextual Info: SJS830200 REV ECN APP'D 6253 JT 8 /6 /0 8 6297 JT 1/14/09 6431 ^n -7 ò {Z ìfa 7 1 HITE MARKING 0.040" HIGH CHARACTER . “ 1 -WHITE DOT .453 +.005 .010 .357 TEST REQUIREMENT TEST METHOD MIL-STD-1344 SUPERSEDED BY EIA 364 OPERATING TEMP. - 65° TO + 125° C

74FCT3574

Abstract: SRW05
Contextual Info: IDT54/74FCT3574/A ADVANCE INFORMATION 3.3V CMOS OCTAL D REGISTERS 3-STATE Integrated Device Technology, Inc. FEATURES: DESCRIPTION: • 0.5 MICRON CMOS Technology • ESD > 2000V per MIL-STD-883, Method 3015; > 200V using machine model (C = 200pF, R = 0)