STATISTICAL PROCESS CONTROL Search Results

statistical process control

Abstract: wafer fab control plan pareto process control system spc data sheet SPC Technology TIONA wafer fab control SPC-2 SPC-3
Contextual Info: STATISTICAL PROCESS CONTROL STATISTICAL PROCESS CONTROL Linear Technology Corporation LTC has an active Statistical Process Control (SPC) system. It operates via the interrelated mechanisms of: a structure, control charts with built-in contingency action plans, operational area

wafer fab control plan

Abstract: SPC3 SPC2 LINEAR TECHNOLOGY flowchart
Contextual Info: STATISTICAL PROCESS CONTROL STATISTICAL PROCESS CONTROL Linear Technology Corporation LTC has an active Statistical Process Control (SPC) system. It operates via the interrelated mechanisms of: a structure, control charts with built-in contingency action plans, operational area

5075MM

Contextual Info: Issued March 1999 232-5115 Data Pack A Data Sheet Statistical process control data processor and instruments Introduction Statistical process control SPC is a key concept for enhancing quality control and can achieve significant improvements in product quality.

wafer fab control plan

Abstract: LINEAR TECHNOLOGY flowchart
Contextual Info: STATISTICAL PROCESS CONTROL Linear Technology Corporation LTC has an active Statistical Process Control (SPC) system. It operates via the interrelated mechanisms of: a structure, control charts with built-in contingency action plans, operational area documentation (flowcharts and control plan details), an

Contextual Info: Philips Semiconductors Surface Mounted Semiconductors General QUALITY • In-line quality assurance to m onitor process reproducibility during m anufacture and initiate any necessary corrective action. C ritical process steps are 100% under statistical process control

Contextual Info: Production Flow Chart_ VISHAY Vishay Roederstein Metallized Plastic Film Capacitors Radial Types Statistical Process Control www.vishay.com 6 RFI@Vishay.com Document Number 26530 Revision 02-0ct-00

Contextual Info: Test and QA Flow Chart V1SHAY Vishay Roederstein Metallized Plastic Film Capacitors Radial Types Statistical Process Control Document Number 26531 Revision 30-Jun-00 RFI@Vishay.com www.vishay.com 7

dupont 9450

Abstract: 77274-006 MAX 77693 77030-001 vertical pwb mounting with 68 pin male connector ASTM 240
Contextual Info: • Superior design and Statistical Process Control SPC assure high reliability. • High normal force of 75 grams per beam approximately twice that of connectors at a comparable insertion force. This critical parameter is directly measured during the manufacturing process. Results

MA4GM2

Contextual Info: GaAs FET MMIC Control Product Process Screening and Quality Procedures In processing G aAs FE T MMIC Control Products, consistency and reproducibility is ensured by measuring key electrical parameters on each wafer at the main steps and using the results for statistical process control. If a process goes out

SMD w1a 93

Contextual Info: TMJ Tantalum SMD S1gma* Series Capacitors The AVX S1gma series is offering a next generation of statistical screening and process control enhancement of tantalum capacitors for professional applications with improved reliability and extremely low DCL needs.

E19279

Abstract: disc thermostats LR19988 STO-210 MH5304 MH-5304 STO-160 STO-85 sto-160 disc thermostat STO-220
Contextual Info: DISC THERMOSTATS Snap Action Thermostats ADVANTAGES 1/2 " Bimetal Disc Thermostats - Proven reliability in a compact, versatile, cost-effective design - High speed contact separation provides long contact life - Statistical process control of manufacturing assures high product

Contextual Info: Statistical Process Control Key to Competitive Manufacturing In manufacturing, variation is evil! If the value of Cpk for a purchased part is low, and Cpk varies from production lotto-lot, then it can be projected the process for manufacturing the part is not in control, performance will be inconsistent,

Contextual Info: M ODEL LPE-4841 Inductors Surface Mount, Gapped and Ungapped FEATURES • Totally integrated manufacturing • Pick and place compatible • Statistical process controlled • Tape packaging per EIA-481 • Low cost • Qualification data available • Short lead times

Contextual Info: MODEL LPE-4841 Inductors Surface Mount, Gapped and Ungapped FEATURES • Totally integrated manufacturing • Pick and place compatible • Statistical process controlled • Tape packaging per EIA-481 • Low cost • Qualification data available • Short lead times

SM3180

Contextual Info: SM3 SERIES GOWAIMDA HIGH PERFORMANCE SURFACE MOUNT INDUCTORS • High “Q”, Low DC resistance, Ultra stable. ■ Defect rate below 50 PPM. ■ Statistical process control. ■ Chart of central tendency supplied with each lot. ■ Rugged lead frame design.

Contextual Info: REV. | T | UNLESS OTHERWISE NOTED DIMENSIONS ARE IN INCHES NOTES: 1. MIN. PUSHOUT FORCE: .5 lb. 2. PLANARITY TO BE WITHIN .006 [.15]. 3. REPRESENTS A CRITICAL DIMENSION FOR STATISTICAL PROCESS CONTROL. ONE PLACE DECIMALS TWO PLACE DECIMALS TOLERANCES ARE:

Contextual Info: At TAM taker to rigorous international cus^pmer uality standards. Our factories are certified to ISO 9001/9002 and are BSI licensed. TAMURA utilizes 100% engineering design control and statistical process control to achieve SIGMA 6 levels of product reliability.

Contextual Info: M ODEL LPE-6562 Inductors Surface Mount, Gapped and Ungapped FEATURES • • • • • • • • • Totally integrated manufacturing Pick and place compatible Statistical process controlled Tape packaging per EIA-481 Low cost Qualification data available

Contextual Info: MODEL LPE-6855 Inductors Surface Mount, Gapped and Ungapped FEATURES • Totally integrated manufacturing • Pick and place compatible • Statistical process controlled • Tape packaging per EIA-481 • Low cost • Qualification data available • Short lead times

200NH-2

Abstract: SM3180
Contextual Info: SM3 SERIES High “Q”, Low DC resistance, Ultra stable. HIGH PERFORMANCE SURFACE MOUNT INDUCTORS Defect rate below 50 PPM. Statistical process control. Chart of central tendency supplied with each lot. Rugged lead frame design. Solder plated copper terminals.

Contextual Info: M ODEL LPE-3325 Inductors Surface Mount, Gapped and Ungapped FEATURES • Totally integrated manufacturing • Pick and place compatible • Statistical process controlled • Tape packaging per EIA-481 • Low cost • Qualification data available • Short lead times

Contextual Info: Reliability Testing STATISTICAL PROCESS CONTROL « Previous Continue » SPC of Dimensional Results U.S. Sensor 1832 W. Collins Ave Orange, CA 92867 Tel: 800-777-6467 Tel: 714-639-1000 Fax: 714-639-1220 Email: sales@ussensor.com Gage Repeatability and Reproducibility

Contextual Info: SM3 SERIES GOWAIMDA i* HIGH PERFORMANCE SURFACE MOUNT INDUCTORS ' • High “Q”, Low DC resistance, Ultra stable. ■ Defect rate below 50 PPM. ■ Statistical process control. ■ Chart of central tendency supplied with each lot. ■ Rugged lead frame design.

SM3-120K

Contextual Info: iOA High "Q", Low DC resistance. Ultra stable. HIGH PERFORMANCE SURFACE MOUN INDUCTORS Defect rate below 50 PPM. Statistical process control. Chart of central tendency supplied with each lot. Rugged lead fram e design. Solder plated copper terminals. Vapor phase and infrared compatible.