RELIABILITY TEST METHODS FOR Search Results

Contextual Info: Test and Reliability Data Environmental Data MECHANICAL Test Number Test Methods Requirement 1 Solderability After steam aging, immerse in the solder H63A of 230 ±5° for 3 ±0.5 seconds. Approximately 95% of the terminal should be covered with new solder.

Contextual Info: ZENAMIC Series D Reliability Characteristics Test Methods/Descriptions Specifications Standard Test Condition Unless other wise specified, electrical measurements initial/aftertests shall be conducted at temperature of 5 to 35ЊC,relative humidity of 45 to 85%

VQ1000N7

Abstract: VN0109N9 VC0106N7 MIL-STD-750 TN0606N7 TP0610N2 Diode SJ TQ3001N7 Transistor SJ VP0109N2
Contextual Info: DMOS High Reliability Products The following products are available with High Reliability processing per test methods and flows of MIL-STD-750 and MIL-STD-883. For ordering purposes, add the process flow prefix to the device number as shown in the following examples:

JESD85

Abstract: failure rate Reliability Test Methods for
Contextual Info: Silicon Technology Reliability www.vishay.com Vishay Siliconix N-CHANNEL ACCELERATED OPERATING LIFE TEST RESULT Sample Size 2008 Equivalent Device Hours 342 536 204 Failure Rate in FIT 2.657 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,

JESD85

Contextual Info: Silicon Technology Reliability Vishay Siliconix N-CHANNEL ACCELERATED OPERATING LIFE TEST RESULT Sample Size Equivalent Device Hours Failure Rate in FIT 3608 863 289 007 1.054 Failure Rate in FIT is calculated according to JEDEC standard JESD85, Methods for Calculating Failure Rates in Units of FITs,

schottky diode FIT

Contextual Info: Silicon Technology Reliability www.vishay.com Vishay Siliconix SCHOTTKY DIODE ACCELERATED OPERATING LIFE TEST RESULT Sample Size 1066 Equivalent Device Hours 127 555 429 Failure Rate in FIT 7.134 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,

Contextual Info: Silicon Technology Reliability www.vishay.com Vishay Siliconix N-CHANNEL ACCELERATED OPERATING LIFE TEST RESULT Sample Size 2296 Equivalent Device Hours 657 038 279 Failure Rate in FIT 1.385 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,

Contextual Info: Silicon Technology Reliability Vishay Siliconix BCD-18 TECHNOLOGY ACCELERATED OPERATING LIFE TEST RESULT Sample Size Equivalent Device Hours Failure Rate in FIT 82 3 566 796 255.131 Failure Rate in FIT is calculated according to JEDEC standard JESD85, Methods for Calculating Failure Rates in Units of FITs,

Contextual Info: Silicon Technology Reliability www.vishay.com Vishay Siliconix N-CHANNEL ACCELERATED OPERATING LIFE TEST RESULT Sample Size 66 822 Equivalent Device Hours 15 802 994 627 Failure Rate in FIT 2.158 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,

Contextual Info: Silicon Technology Reliability www.vishay.com Vishay Siliconix P-CHANNEL ACCELERATED OPERATING LIFE TEST RESULT Sample Size 33 114 Equivalent Device Hours 6 208 734 017 Failure Rate in FIT 1.192 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,

Contextual Info: Silicon Technology Reliability www.vishay.com Vishay Siliconix N-CHANNEL ACCELERATED OPERATING LIFE TEST RESULT Sample Size 48 386 Equivalent Device Hours 8 800 936 123 Failure Rate in FIT 0.227 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,

Contextual Info: Silicon Technology Reliability www.vishay.com Vishay Siliconix N-CHANNEL ACCELERATED OPERATING LIFE TEST RESULT Sample Size 18 368 Equivalent Device Hours 2 954 669 261 Failure Rate in FIT 2.505 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,

Contextual Info: Silicon Technology Reliability www.vishay.com Vishay Siliconix P-CHANNEL ACCELERATED OPERATING LIFE TEST RESULT Sample Size 14 265 Equivalent Device Hours 2 779 173 437 Failure Rate in FIT 11.910 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,

Silicon Technology Reliability

Abstract: silicon
Contextual Info: Silicon Technology Reliability www.vishay.com Vishay Siliconix N-CHANNEL ACCELERATED OPERATING LIFE TEST RESULT Sample Size 232 395 Equivalent Device Hours 28 904 254 900 Failure Rate in FIT 1.073 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,

MR212

Abstract: TMR325 UMR316
Contextual Info: Notice for TAIYO YUDEN products（High Reliability Application Multilayer Ceramic Capacitors） Please read this notice before using the TAIYO YUDEN products. REMINDERS • Product information in this catalog is as of October 2011. All of the contents specified herein are subject to change

FBA 710

Contextual Info: Notice for TAIYO YUDEN products Please read this notice before using the TAIYO YUDEN products. REMINDERS • Product information in this catalog is as of October 2012. All of the contents specified herein are subject to change without notice due to technical improvements, etc. Therefore, please check for the latest information carefully before practical application or usage of the Products.

SAW/FBAR Devices

Abstract: JISC60068-2-21 FAR-D5PE-881M50-P3EY FAR-F6KA-2G4500-A4VD F6QG2G140P2KA D5PE942M5P3GT FAR-F6KA-1G5859-D4MS F6KB2G350B4HT FAR-F6KY-2G6550-B4UN F5QA836M5M2AR
Contextual Info: Notice for TAIYO YUDEN products Please read this notice before using the TAIYO YUDEN products. REMINDERS • Product information in this catalog is as of October 2012. All of the contents specified herein are subject to change without notice due to technical improvements, etc. Therefore, please check for the latest information carefully before practical application or usage of the Products.

Wire-wound Chip Inductors for Signal Lines (LB series M type)

Abstract: 2016T8R2J
Contextual Info: Notice for TAIYO YUDEN products Please read this notice before using the TAIYO YUDEN products. REMINDERS • Product information in this catalog is as of October 2012. All of the contents specified herein are subject to change without notice due to technical improvements, etc. Therefore, please check for the latest information carefully before practical application or usage of the Products.

Contextual Info: Notice for TAIYO YUDEN products Please read this notice before using the TAIYO YUDEN products. REMINDERS • Product information in this catalog is as of October 2013. All of the contents specified herein are subject to change without notice due to technical improvements, etc. Therefore, please check for the latest information carefully before practical application or usage of the Products.

B7474

Abstract: 01005 land pattern
Contextual Info: Notice for TAIYO YUDEN products High Reliability Application Multilayer Ceramic Capacitors Please read this notice before using the TAIYO YUDEN products. REMINDERS • Product information in this catalog is as of October 2012. All of the contents specified herein are subject to change

MDMK

Contextual Info: Notice for TAIYO YUDEN products Please read this notice before using the TAIYO YUDEN products. REMINDERS • Product information in this catalog is as of October 2012. All of the contents specified herein are subject to change without notice due to technical improvements, etc. Therefore, please check for the latest information carefully before practical application or usage of the Products.

Contextual Info: Notice for TAIYO YUDEN products Please read this notice before using the TAIYO YUDEN products. REMINDERS • Product information in this catalog is as of October 2012. All of the contents specified herein are subject to change without notice due to technical improvements, etc. Therefore, please check for the latest information carefully before practical application or usage of the Products.

Taiyo Yuden LBC3225

Abstract: cbc3225 LEM2520 LEM Taiyo Yuden LB201 LB2518 TAIYO YUDEN LEM Taiyo Yuden lem 2520 Inductor LB2016 LB3218
Contextual Info: Notice for TAIYO YUDEN products Please read this notice before using the TAIYO YUDEN products. REMINDERS • Product information in this catalog is as of October 2009. All of the contents specified herein are subject to change without notice due to technical improvements, etc. Therefore, please check for the latest information carefully before practical application or usage of the Products.

C170

Abstract: C500 C850 FK2125T107AL FK2125T186AL FK2125T256AL FK2125T406AL Z101 Z201
Contextual Info: Notice for TAIYO YUDEN products Please read this notice before using the TAIYO YUDEN products. REMINDERS • Product information in this catalog is as of October 2009. All of the contents specified herein are subject to change without notice due to technical improvements, etc. Therefore, please check for the latest information carefully before practical application or usage of the Products.