106 10k 804
Abstract: 106F 213B
Text: CTS ClearONE Terminator Reliability Test Data RELIABILITY TEST DATA Table of Contents BGA RESISTOR ARRAY DESIGN VALIDATION TEST PLAN .3 DESIGN VERIFICATION PLAN &
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JEDEC JESD22-B117
Abstract: JESD22-B117 Solder Paste, Indium 5.8 N41 250 y 803 IPC-9504 10k resistor 1/8 watt datasheet hot air bga Solder Paste, Indium 5.1, Type 3 10k resistor 1/4 watt datasheet
Text: RELIABILITY TEST DATA Table of Contents BGA RESISTOR ARRAY DESIGN VALIDATION TEST PLAN .3 DESIGN VERIFICATION PLAN & REPORT .4
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13001 s
Abstract: 13001 datasheet 13001 JL-01 ACTEL 1020B RTSX32 B 13001 RTSX16 42MX09 1280A
Text: Actel 4th Quarter 2000 Reliability Report 1 Table of Contents Page Reliability Test Matrix • Test Methods and Conditions Failure Rates • Failure Rates FITs Based For Current Process Data • Mean Time Between Failure (MTBF) For Current Process Data 2
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1225XL,
1240XL,
1280XL,
A1415,
A1425,
14100BP,
32140DX,
32200DX
13001 s
13001 datasheet
13001
JL-01
ACTEL 1020B
RTSX32
B 13001
RTSX16
42MX09
1280A
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irlml2404
Abstract: transistor 9529 IRF7603 IRF7389 IRF7103 irlml2402 Small-Outline SMD Reliability Report 704618 HEXFET SO-8 irf7404 datasheet
Text: Small-Outline SMD Reliability Report Page 1 Table of Contents Section I. II. III. IV. V. VI. VII. VIII. IX. X. Page Executive Summary Introduction Procedure Reliability Tests - Table I Electrical Tests - Table II Test Purposes & Common Failure Mechanisms Reliability Data
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triac zd 107
Abstract: triac bcr BS08A BS08A TRANSISTOR equivalent SCR induction furnace circuit diagram 1000w inverter design and calculation TRIAC BCR 50 AM BCR 3A 400V CR3JM equivalent TRIACS EQUIVALENT LIST
Text: Low Power Applications and Technical Data Book A Guide to Using the Data Book 1.0 Numbering System 2.0 Symbols and Definitions of Major Parameters 3.0 Powerex Quality Assurance Program 4.0 Semiconductor Device Reliability 5.0 Reliability Test Methods 6.0 Designing Trigger Circuits
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BCR10CM-8L
Loa25
O-202B1
O-220
BS08A
triac zd 107
triac bcr
BS08A
BS08A TRANSISTOR equivalent
SCR induction furnace circuit diagram
1000w inverter design and calculation
TRIAC BCR 50 AM
BCR 3A 400V
CR3JM equivalent
TRIACS EQUIVALENT LIST
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WO7430
Abstract: 13KHZ 25KHZ ANTIFUSE
Text: Standard Products Reliability Analysis of Programmed UTMC PROMs following Post-Program Conditioning July 1998 Summary—Life test data were obtained on the UTMC Microelectronic Systems 64K and 256KBit programmable read-only memories PROMs following post-program conditioning (PPC). PPC is used to enhance the reliability
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256KBit
WO7430
13KHZ
25KHZ
ANTIFUSE
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agilent n3300A
Abstract: N3303
Text: Agilent N3300 Series DC Electronic Loads Data Sheet Increase your manufacturing test throughput with fast electronic loads • Increase test system throughput • Lower cost of ownership • Decrease system development time • Increase system reliability
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N3300
5980-0232E
agilent n3300A
N3303
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Hitachi DSA002719
Abstract: tr-tsy-000357
Text: Preliminary Technical Data v1.2, August, 1998 TRW5403 WDM Bi-Directional OC-3 Transceiver Preliminary Product Disclaimer This preliminary data sheet is provided to assist you in the evaluation of functional samples of the products which are under development and reliability test has not be completed. Until
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TRW5403
PDF0001ceptable
TRW5403M
Hitachi DSA002719
tr-tsy-000357
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Hitachi DSA002719
Abstract: TRW7403
Text: Preliminary Technical Data v1.1, August, 1998 TRW7403 WDM Bi-Directional OC-3 Transceiver Preliminary Product Disclaimer This preliminary data sheet is provided to assist you in the evaluation of functional samples of the products which are under development and reliability test has not be completed. Until
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TRW7403
PDF0002ceptable
TRW7403M
Hitachi DSA002719
TRW7403
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MS-001
Abstract: MS001 MS-011
Text: LEADFRAME data sheet PDIP Features Reliability Amkor package qualification uses three independent production lots Qualification and a minimum of 77 units per test group. Plastic Dual In-line Package PDIP : PDIP has a proven track record and is a common choice
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basic structure of induction cooker
Abstract: induction cooker application note Hitachi Semiconductor hd61602 induction cooker mechanical design hitachi hd44100h HD44102H induction cooker EMos HD44103H
Text: Reliability Test Data of LCD Drivers 1. Introduction 2. Chip and Package Structure The use of liquid crystal displays with microcomputer application systems has been increasing, because of their low power consumption, freedom in display pattern design, and thin shape. Low
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Abstract: No abstract text available
Text: Rev: 003 Product Family Data Sheet LH351A - 3535 Ceramic LED Introduction Features View Angle: 125 ˚ Precondition : JEDEC Level 2 Dimension : 3.5 x 3.5 x 1.89 mm ESD withstand Voltage : up to ±5KV [HBM] Reliability Test : IES-LM-80-08 qualified Applications
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LH351A
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SPMWHT
Abstract: SPMWHT5225D5WAV0S0
Text: Rev: 001 Product Family Data Sheet LM561A - 5630 Middle Power LED Introduction Features View Angle: 120 ˚ Precondition : JEDEC Level 2a Dimension : 5.6 x 3.0 x 0.95 mm ESD withstand Voltage : up to ± 5KV [HBM] Reliability Test : Refer to page 24 Applications
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LM561A
SPMWHT
SPMWHT5225D5WAV0S0
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SPMWHT
Abstract: No abstract text available
Text: Rev: 003 Product Family Data Sheet LM231A - 2323 Middle Power LED Introduction Features Beam Angle : 120˚ Precondition : JEDEC Level 2a Dimension : 2.3 x 2.3 x 0.7 mm ESD withstand Voltage : up to ± 5KV [HBM] Reliability Test : LM-80 qualified Applications
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LM231A
LM-80
SPMWHT
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AN-944A
Abstract: AN944A AN934B IRF130 IRF430 IRF440 what is THERMAL RUNAWAY IN RECTIFIER MOSFET i-pak Package zener diode MOSFET reliability report format AN949A High frequency switching
Text: EXECUTIVE SUMMARY FIFTY FIFTH QUARTERLY REPORT This Quarterly Reliability Report is a summary of test data covering the previous twenty four months of component testing at International Rectifier's HEXFET America facility in Temecula, California. The products tested include HEXFETs packaged in TO-220,
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O-220,
O-247
O-220
O-220/D2Pak
AN-944A
AN944A
AN934B
IRF130
IRF430
IRF440
what is THERMAL RUNAWAY IN RECTIFIER MOSFET
i-pak Package zener diode
MOSFET reliability report format
AN949A High frequency switching
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Untitled
Abstract: No abstract text available
Text: Rev: 001 Product Family Data Sheet LM231B - 2323 Middle Power LED Introduction Features Package : Silicone Reflector LED Package Beam Angle: 120˚ Precondition : JEDEC Level 2a Dimension : 2.3 x 2.3 x 0.7 mm ESD withstand Voltage : up to ± 5KV [HBM] Reliability Test : LM-80 qualified
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LM231B
LM-80
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SPMWH
Abstract: No abstract text available
Text: Rev: 001 ISSUE NO : Product Family Data Sheet LM362A - CRI 90 Introduction Features Beam Angle: 120˚ Precondition : JEDEC Level 2a Dimension : 3.6 x 2.3 x 0.6 mm ESD withstand Voltage : up to ±5KV [HBM] Reliability Test : Refer to page 25
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LM362A
SPMWH
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Untitled
Abstract: No abstract text available
Text: Rev: 007 Product Family Data Sheet LM231A - 2323 Middle Power LED Introduction Features Beam Angle : 120˚ Precondition : JEDEC Level 2a Dimension : 2.3 x 2.3 x 0.7 mm ESD withstand Voltage : up to ± 5KV [HBM] Reliability Test : LM-80 qualified
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LM231A
LM-80
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Untitled
Abstract: No abstract text available
Text: ISSUE NO : 3800-05NTI16 Rev: 004 Product Family Data Sheet LM362A - 3623 LED PKG Introduction Features Beam Angle: 120˚ Precondition : JEDEC Level 2a Dimension : 3.6 x 2.3 x 0.6 mm ESD withstand Voltage : up to ±5KV [HBM] Reliability Test : Refer to page 25
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3800-05NTI16
LM362A
MP36S
CRI78
2700K
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JIS C 7021 A10
Abstract: ED-4701-b-131 ED-4701 A124 st A122 MILSTD-105E Pub68
Text: Quality Assurance & Reliability Test Data 2-5 Quality Assurance & Reliability Test Data 2 Planning 2-5-1 Basic Approach Based on results of the m arket survey, the Planning Division sets the functions and the quality and cost targets for the new p ro d u ct. T h e q u a lity ta r g e ts include
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Abstract: No abstract text available
Text: Reliability Test Data of Microcomputer 1. Introduction Microcomputers are required to provide higher reliability and quality with increasing functions for an enlarged scale for wide applications. To meet this demand, Hitachi is improving the quality by evaluating its reliability, building up quality in
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HD63143
Abstract: HD46508P HD6321P HD63140 HD6845SP HD63310P HD63143P HD63487CP HD63084P basic structure of induction cooker
Text: Reliability Test Data o f M icro co m p u te r 1. INTRODUCTION M icrocom puter is required to provide higher reliability and quality w ith increasing function, enlarging scale and widening ap p licatio n . T o m e et this dem and, H itachi is im proving the
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16-bit
HD63143
HD46508P
HD6321P
HD63140
HD6845SP
HD63310P
HD63143P
HD63487CP
HD63084P
basic structure of induction cooker
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basic structure of induction cooker
Abstract: induction cooker application note HD61602 HD64646F
Text: Reliability Test Data of LCD Drivers 1. Introduction The use o f liquid crystal displays with microcomputer application systems has been increasing, because of their low power consumption, freedom in display pattern design, and thin shape. Low power consumption
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Untitled
Abstract: No abstract text available
Text: Quality and Reliability Te st Data 2-4 Quality and Reliability Test Data 2-4-1 Quality Assurance System S h a rp ’s LED s a re u sed in la rg e q u a n titie s by a w id e ra n g e of c u sto m e rs in in d u s tria l e q u ip m e n t, OA e q u ip m e n t su ch a s
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