LTC5540
Abstract: LTC5585 LTC5541 LTC5592 DATE code LTC5544 LTC5593 LTC5590 LTC5584 LTC5567
Text: Reliability Data Report Product Family R550 LTC5540 / LTC5541 / LTC5542 / LTC5543 / LTC5544 / LTC5567 / LTC5582 / LTC5583 / LTC5584 / LTC5585 / LTC5588 / LTC5590 / LTC5591 / LTC5592 / LTC5593 Reliability Data Report Report Number: R550 Report generated on: Wed Oct 03 18:48:41 PDT 2012
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LTC5540
LTC5541
LTC5542
LTC5543
LTC5544
LTC5567
LTC5582
LTC5583
LTC5584
LTC5585
LTC5592
DATE code
LTC5593
LTC5590
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PDF
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1001
Abstract: DATE code
Text: Reliability Data Report Product Family R549 LTC2364 / LTC2367 / LTC2368 / LTC2370 / LTC2376 / LTC2377 / LTC2378 / LTC2379 / LTC2380 / LTC2381 / LTC2382 / LTC2383 / LTC2389 / LTC2391 / LTC2392 / LTC2393 Reliability Data Report Report Number: R549 Report generated on: Wed Oct 03 18:18:05 PDT 2012
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LTC2364
LTC2367
LTC2368
LTC2370
LTC2376
LTC2377
LTC2378
LTC2379
LTC2380
LTC2381
1001
DATE code
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PDF
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8501 equivalent
Abstract: 9443 r003
Text: Reliability Data Report Product Family R003 LT1021 LT1031 LT1236 LH0070 Reliability Data Report Report Number: R003 Report generated on: Wed Sep 19 09:54:13 PDT 2012 OPERATING LIFE TEST PACKAGE TYPE HERMETIC PLASTIC DIP SOIC/SOT/MSOP TO-92 FLATPACK Totals
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LT1021
LT1031
LT1236
LH0070
No346
J-STD-020
8501 equivalent
9443
r003
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PDF
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in-coming quality control
Abstract: "Dallas Semiconductor" TOP MARKING
Text: RELIABILITY MONITOR PROGRAM FIRST QUARTER 1997 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 4/20/97 NOTICE RELIABILITY MONITOR PROGRAM CHANGE Starting with the Third Quarter 96 Report, the Reliability Monitor will
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MIL-STD-883,
in-coming quality control
"Dallas Semiconductor" TOP MARKING
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PDF
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DS1868
Abstract: No abstract text available
Text: RELIABILITY MONITOR PROGRAM FOURTH QUARTER 1996 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 1/20/97 NOTICE RELIABILITY MONITOR PROGRAM CHANGE Starting with the Third Quarter 96 Report, the Reliability Monitor will
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MIL-STD-883,
DS1868
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PDF
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0952
Abstract: R457
Text: Reliability Data Report Product Family R457 LTC3113 LTC3411/16/17/18/19 LTC3520/27/28 LTC3539/58/62 LTC3606/12/14/15/16/17/19 LTC3672/77 Reliability Data Report Report Number: R457 Report generated on: Thu Sep 20 13:37:42 PDT 2012 OPERATING LIFE TEST PACKAGE TYPE
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LTC3113
LTC3411/16/17/18/19
LTC3520/27/28
LTC3539/58/62
LTC3606/12/14/15/16/17/19
LTC3672/77
J-STD-020
0952
R457
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PDF
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Untitled
Abstract: No abstract text available
Text: RELIABILITY MONITOR PROGRAM THIRD QUARTER 2001 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 4/30/01 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those
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JESD22
MIL-STD-883,
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PDF
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Untitled
Abstract: No abstract text available
Text: RELIABILITY MONITOR PROGRAM FOURTH QUARTER 1998 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 1/29/98 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those
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JESD22
MIL-STD-883,
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PDF
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Untitled
Abstract: No abstract text available
Text: RELIABILITY MONITOR PROGRAM THIRD QUARTER 1998 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 10/30/98 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those
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MIL-STD-883,
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PDF
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TR-TSY-000357
Abstract: No abstract text available
Text: RELIABILITY MONITOR PROGRAM THIRD QUARTER 1996 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 10/20/96 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those
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MIL-STD-883,
TR-TSY-000357
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PDF
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Untitled
Abstract: No abstract text available
Text: RELIABILITY MONITOR PROGRAM THIRD QUARTER 1997 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 10/23/97 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those
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MIL-STD-883,
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PDF
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Untitled
Abstract: No abstract text available
Text: RELIABILITY MONITOR PROGRAM SECOND QUARTER 1996 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 7/20/96 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those
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MIL-STD-883,
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PDF
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Untitled
Abstract: No abstract text available
Text: RELIABILITY MONITOR PROGRAM THIRD QUARTER 2003 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 11/20/03 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those
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JESD22
MIL-STD-883,
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PDF
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Untitled
Abstract: No abstract text available
Text: RELIABILITY MONITOR PROGRAM FOURTH QUARTER 1997 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 1/23/98 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those
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PDF
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Untitled
Abstract: No abstract text available
Text: RELIABILITY MONITOR PROGRAM FOURTH QUARTER 2003 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 02/26/04 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those
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JESD22
MIL-STD-883,
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PDF
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Untitled
Abstract: No abstract text available
Text: RELIABILITY MONITOR PROGRAM FIRST QUARTER 1999 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 4/20/99 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those
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JESD22
MIL-STD-883,
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PDF
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Untitled
Abstract: No abstract text available
Text: RELIABILITY MONITOR PROGRAM SECOND QUARTER 2000 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 07/20/00 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those
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JESD22
MIL-STD-883,
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PDF
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reliability report 2012
Abstract: No abstract text available
Text: RELIABILITY MONITOR PROGRAM SECOND QUARTER 1999 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 7/20/99 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those
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JESD22
MIL-STD-883,
reliability report 2012
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PDF
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Untitled
Abstract: No abstract text available
Text: RELIABILITY MONITOR PROGRAM FOURTH QUARTER 1999 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 01/18/00 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those
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JESD22
MIL-STD-883,
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PDF
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Untitled
Abstract: No abstract text available
Text: RELIABILITY MONITOR PROGRAM SECOND QUARTER 1998 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 8/14/98 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those
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MIL-STD-883,
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PDF
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quality acceptance plan
Abstract: No abstract text available
Text: RELIABILITY MONITOR PROGRAM THIRD QUARTER 2000 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 010/20/00 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those
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JESD22
MIL-STD-883,
quality acceptance plan
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PDF
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JESD22 B100
Abstract: No abstract text available
Text: RELIABILITY MONITOR PROGRAM FIRST QUARTER 2004 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 04/20/04 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those
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JESD22
MIL-STD-883,
JESD22 B100
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PDF
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Untitled
Abstract: No abstract text available
Text: RELIABILITY MONITOR PROGRAM SECOND QUARTER 1997 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 7/20/97 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those
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MIL-STD-883,
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PDF
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reliability testing report
Abstract: No abstract text available
Text: RELIABILITY MONITOR PROGRAM THIRD QUARTER 2001 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 4/30/01 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those
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Original
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JESD22
MIL-STD-883,
reliability testing report
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PDF
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