D87C257
Abstract: ic 41315 D27256 US94V D2732A intel 2708 eprom intel 4308 intel EPROM RR-35 D27C256
Contextual Info: in ter RELIABILITY REPORT RR-35 November 1990 EPROM RELIABILITY DATA SUMMARY Order Number: 210473-007 5-287 5 RR-35 INTEL EPROM RELIABILITY DATA SUMMARY CONTENTS page The Importance of Reliability. 5-289 EPROM Reliability Data Summary . 5-289
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RR-35
D2732A
D2764A
D27128A
D27256
D27C256
D87C257
P2764A.
27C256
D87C257
ic 41315
D27256
US94V
D2732A
intel 2708 eprom
intel 4308
intel EPROM
RR-35
D27C256
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M7401
Abstract: m74010 m7402 M74050 M74040 M74064 m80129 hyundai 9750 9745-1 VIC068A cy7c199zi
Contextual Info: CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT QUARTER 1, 1998 PERFORM PER THE REQUIREMENT OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION Marc Hartranft Reliability Manager CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT
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CY7C1334-AC
M7401
m74010
m7402
M74050
M74040
M74064
m80129
hyundai 9750 9745-1
VIC068A
cy7c199zi
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cy7c9101
Abstract: M82054 M74070 97356 M8201 CY7C199-DMB 130C 140C CY7C1009-VC 519701901
Contextual Info: CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT QUARTER 2, 1998 PERFORM PER THE REQUIREMENT OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION Marc Hartranft Reliability Manager CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT
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619802812L
CY7C109-VC
cy7c9101
M82054
M74070
97356
M8201
CY7C199-DMB
130C
140C
CY7C1009-VC
519701901
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MR840
Abstract: MR841
Contextual Info: CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT QUARTER 1, 1999 PERFORM PER THE REQUIREMENT OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION Ed Russell Reliability Manager CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 1, 1999
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------------------------SRAM/LOGIC-R52H
140C/3
CY62128V-ZAIB
MR84072
121C/100
MR84070
MR840
MR841
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CYM1464
Abstract: CY7C1353-AC MR840
Contextual Info: CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT QUARTER 3, 1999 PERFORM PER THE REQUIREMENT OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION Ed Russell Reliability Director CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 3, 1999
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CY62137VL-ZSIB
CYM1464
CY7C1353-AC
MR840
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CY7C4271-JC
Abstract: cypress 98267 9832 CY5037
Contextual Info: CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT QUARTER 4, 1998 PERFORM PER THE REQUIREMENT OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION Ed Russell Reliability Manager CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 4, 1998
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CY62128V-VC
CY62128V-ZSC
CY7C4271-JC
cypress 98267
9832
CY5037
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tms 9937
Abstract: TSMC fuse PALC22V10b M99242 CY7C1353-AC MR841 Hyundai 9944 PALC22V10B-15PC
Contextual Info: CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT QUARTER 4, 1999 PERFORM PER THE REQUIREMENT OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION Ed Russell Reliability Director CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 4, 1999
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SRAM/LOGIC-R52LD
121C/100
CY62137-AI
MR94085
tms 9937
TSMC fuse
PALC22V10b
M99242
CY7C1353-AC
MR841
Hyundai 9944
PALC22V10B-15PC
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tms 9937
Abstract: M9922 TSMC fuse PALC22V10B-15PC 135C-6 cy7c136 PALC22V10B Hyundai 9944 140C CY7B923-JI
Contextual Info: CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT QUARTER 4, 1999 PERFORM PER THE REQUIREMENT OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION Ed Russell Reliability Director CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 4, 1999
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SRAM/LOGIC-R52LD
121C/100
CY62137-AI
MR94085
tms 9937
M9922
TSMC fuse
PALC22V10B-15PC
135C-6
cy7c136
PALC22V10B
Hyundai 9944
140C
CY7B923-JI
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MR841
Abstract: M84032 M84020 CY7C341 MR840
Contextual Info: CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT QUARTER 1, 1999 PERFORM PER THE REQUIREMENT OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION Ed Russell Reliability Manager CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 1, 1999
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SRAM/LOGIC-R52H
140C/3
CY62128V-ZAIB
MR84072
121C/100
MR84070
MR841
M84032
M84020
CY7C341
MR840
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reliability report
Abstract: MR840
Contextual Info: CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT QUARTER 3, 1999 PERFORM PER THE REQUIREMENT OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION Ed Russell Reliability Director CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 3, 1999
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CY62137VL-ZSIB
reliability report
MR840
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MS1562
Abstract: SPX29150 SPX29300 reliability report and tests for failure rate the1000
Contextual Info: Reliability and Qualification Report Silan BP4 Process Reliability Qualification using the SPX29150 Prepared By: Salvador Wu & Greg West QA Engineering Date: September 15, 2006 SPX29150 Reliability Report Reviewed By: Fred Claussen VP Quality & Reliability
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SPX29150
SPX29150
O-263
SPX29150/51/52/53
130C/85
96hrs
MS1562
SPX29300
reliability report and tests for failure rate
the1000
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W49C65
Abstract: 9938 9952 l28 cypress 9938 G 9948 PALC22V10B Taiwan Alpha TSMC Flash cy82
Contextual Info: CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT QUARTER 1, 2000 PERFORM PER THE REQUIREMENT OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION Ed Russell Reliability Director CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 1, 2000
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125C/-55C
CY62146VLL-BAIB
121C/100
150C/-65C
CY62137VL-BAI
W49C65
9938
9952
l28 cypress
9938 G
9948
PALC22V10B
Taiwan Alpha
TSMC Flash
cy82
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tw 9907
Abstract: W48C101-01H M99213 malaysia 99052 MR92184 M99219 99141 CY7C63101A-SC MR840 MR841
Contextual Info: CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT QUARTER 2, 1999 PERFORM PER THE REQUIREMENT OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION Ed Russell Reliability Director CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1999
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SRAM/LOGIC-R52LD
CY62137VL-ZSIB
tw 9907
W48C101-01H
M99213
malaysia 99052
MR92184
M99219
99141
CY7C63101A-SC
MR840
MR841
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M82055
Abstract: m80-193 CY7C1399 M82021 CY7C341-RMB CY7C341 reliability report M83029 VIC068A-BC HTSSL
Contextual Info: CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT QUARTER 3, 1998 PERFORM PER THE REQUIREMENT OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION Ed Russell Reliability Manager CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 3, 1998
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-----------------------SRAM/LOGIC-R42HD
CY7C1011-ZC
M82055
m80-193
CY7C1399
M82021
CY7C341-RMB
CY7C341
reliability report
M83029
VIC068A-BC
HTSSL
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P21256
Abstract: p21464 411K intel 21256 p21010
Contextual Info: intei RELIABILITY REPORT RR-62 September 1989 Dynamic RAM Reliability Report MADHU NIMGAONKAR COMPONENTS CONTRACTING DIVISION QUALITY AND RELIABILITY ENGINEERING Order Number: 240543-001 3-158 DRAM RELIABILITY DATA SUMMARY CONTENTS PAGE 1.0 OVERVIEW . 3-160
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RR-62
P21256
p21464
411K
intel 21256
p21010
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130C
Abstract: SPX2815 CF10039
Contextual Info: Reliability and Qualification Report Silan BP2 Process Reliability Qualification using the SPX2815 Prepared By: Salvador Wu & Greg West QA Engineering Date: November 29, 2006 SPX2815 Reliability Report Reviewed By: Fred Claussen VP Quality & Reliability Date: November 29, 2006
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SPX2815
SPX2815
O-263
130C/85
96hrs
48hrs
130C
CF10039
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Capacitor Assembly MTBF
Abstract: spx1117 5 SPX1117 FIT rate MS1557
Contextual Info: Reliability and Qualification Report Silan BP1 Process Reliability Qualification using the SPX1117 Prepared By: Salvador Wu & Greg West QA Engineering Date: September 15, 2006 SPX1117 Reliability Report Reviewed By: Fred Claussen VP Quality & Reliability Date: September 15, 2006
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SPX1117
SPX1117
/200V.
130C/85
96hrs
Capacitor Assembly MTBF
spx1117 5
FIT rate
MS1557
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SPX2945
Abstract: SPX2951 SPX2954 MS1595
Contextual Info: Reliability and Qualification Report Silan BP3 Process Reliability Qualification using the SPX2945 Prepared By: Salvador Wu & Greg West QA Engineering Date: November 29, 2006 SPX2945 Reliability Report Reviewed By: Fred Claussen VP Quality & Reliability Date: November 29, 2006
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SPX2945
SPX2945
O-263
130C/85
96hrs
48hrs
SPX2951
SPX2954
MS1595
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130C
Abstract: SP6128A reliability testing report SP6128
Contextual Info: Reliability and Qualification Report Silan BC1 Process Reliability Qualification using the SP6128A Prepared By: Salvador Wu & Greg West QA Engineering Date: January 2, 2007 SP6128A Reliability Report Reviewed By: Fred Claussen VP Quality & Reliability Date: January 2, 2007
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SP6128A
SP6128A
/-200mA.
130C/85
96hrs
48hrs
130C
reliability testing report
SP6128
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Sample form for INPROCESS Inspection of RAW MATERIAL
Contextual Info: RELIABILITY REPORT THE RELIABILITY APPROACH To ensure maximum reliability is one of the prime goals of the SGS-THOMSON Discrete and Standard Circuits Division. Reliability is an intrinsic factor in the fabrication of any device even from the design stage.
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subj2009;
Sample form for INPROCESS Inspection of RAW MATERIAL
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quality control assurance and reliability
Abstract: reliability ESD audit mechanical engineering reliability report quality and reliability report product audit semiconductor quality assurance office organization
Contextual Info: Quality and Reliability Report 2. Quality and Reliability Organization The Quality and Reliability Assurance Division quality and reliability monitoring and im- at Winbond reports directly to the President's provement programs, which ensure that prod- Office. One of the division's main responsibili-
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koike relays
Abstract: ed27 smd diode EM 231 WIRING DIAGRAM corona discharge circuit simulation smd transistor marking xy TOSHIBA Thyristor tunnel diode GaAs QFP100 injection molding machine wire diagram position sensitive diode circuit
Contextual Info: [ 2 ] Semiconductor Reliability Contents 1. Reliability Concept . 1 1.1 Defining and Quantifying Reliability. 1 1.2 1.3 Reliability and Time. 1
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NS-15,
koike relays
ed27 smd diode
EM 231 WIRING DIAGRAM
corona discharge circuit simulation
smd transistor marking xy
TOSHIBA Thyristor
tunnel diode GaAs
QFP100
injection molding machine wire diagram
position sensitive diode circuit
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PDF
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RR-63
Contextual Info: inteT RELIABILITY REPORT RR-63 August 1989 4 Static RAM Reliability Report MADHU NIMGAONKAR COMPONENTS CONTRACTING DIVISION QUALITY AND RELIABILITY ENGINEERING Order Number: 240544-001 4-63 SRAM RELIABILITY DATA SUMMARY CONTENTS PAGE 1.0 IN T R O D U C T IO N .4-65
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RR-63
RR-63
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PDF
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68hc26
Abstract: 68HC05C4 68hc705p9 68HC05B6 JPC3400 68hc805b6 68705r3 68HC05C12 68HC705B5 68HC68SE
Contextual Info: CSIC Microcontroller Division Reliability and Quality Quarter 2, 1996 Report MOTOROLA INC., 1996 CSIC MICROCONTROLLER DIVISION RELIABILITY AND QUALITY REPORT TECHNICAL INFORMATION . 1-1 RELIABILITY DATA BY TECHNOLOGY. 2-1
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