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    RELIABILITY DATA ANALYSIS REPORT Search Results

    RELIABILITY DATA ANALYSIS REPORT Result Highlights (5)

    Part ECAD Model Manufacturer Description Download Buy
    NFMJMPC226R0G3D Murata Manufacturing Co Ltd Data Line Filter, Visit Murata Manufacturing Co Ltd
    NFM15PC755R0G3D Murata Manufacturing Co Ltd Feed Through Capacitor, Visit Murata Manufacturing Co Ltd
    NFM15PC435R0G3D Murata Manufacturing Co Ltd Feed Through Capacitor, Visit Murata Manufacturing Co Ltd
    NFM15PC915R0G3D Murata Manufacturing Co Ltd Feed Through Capacitor, Visit Murata Manufacturing Co Ltd
    MP-52RJ11SNNE-100 Amphenol Cables on Demand Amphenol MP-52RJ11SNNE-100 Shielded CAT5e 2-Pair RJ11 Data Cable [AT&T U-Verse & Verizon FiOS Data Cable] - CAT5e PBX Patch Cable with 6P6C RJ11 Connectors (Straight-Thru) 100ft Datasheet

    RELIABILITY DATA ANALYSIS REPORT Datasheets Context Search

    Catalog Datasheet MFG & Type PDF Document Tags

    WO7430

    Abstract: 13KHZ 25KHZ ANTIFUSE
    Text: Standard Products Reliability Analysis of Programmed UTMC PROMs following Post-Program Conditioning July 1998 Summary—Life test data were obtained on the UTMC Microelectronic Systems 64K and 256KBit programmable read-only memories PROMs following post-program conditioning (PPC). PPC is used to enhance the reliability


    Original     		PDF 256KBit WO7430 13KHZ 25KHZ ANTIFUSE

    ALTERA EPM7128SLC84

    Abstract: FLUKE 8840a FLUKE 8840a specification EPM7128SLC84-7 atmel 160 pin EPM7128SLC84-7 part number atmel programming in c altera altera Date Code Formats ATMEL 340 EPM7128S
    Text: White Paper ATF1500AS Analysis Report Introduction ® The Altera MAX 7000 family has many features that make it a leader in the programmable logic industry. MAX 7000 devices consume minimal power and are reliable at high frequencies. Additionally, these devices were designed for optimum timing characteristics and to support in-system programmability


    Original     		PDF ATF1500AS EPM7128S, ALTERA EPM7128SLC84 FLUKE 8840a FLUKE 8840a specification EPM7128SLC84-7 atmel 160 pin EPM7128SLC84-7 part number atmel programming in c altera altera Date Code Formats ATMEL 340 EPM7128S

    L504XXX

    Abstract: transistor 9427 m507xxx 9437 transistor CLCC 100 1550371 9434 8 pin integrated circuit
    Text: March 1996 RR-B1A High-Frequency Bipolar Products Reliability Report This report presents the product reliability data for Maxim’s High-Frequency Bipolar analog and digital products. This data was collected from extensive reliability stress tests performed between June 1, 1994 and July 1,


    Original     		PDF 12GHz 27GHz L504XXX transistor 9427 m507xxx 9437 transistor CLCC 100 1550371 9434 8 pin integrated circuit

    Transistor morocco 9740

    Abstract: Ablebond 8360 con hdr hrs ablebond 8086 interfacing with 8254 peripheral Date Code Formats diodes St Microelectronics formatter board Canon interfacing of 8237 with 8086 ST tOP MaRKinGS 388BGA
    Text: RELIABILITY REPORT Q98001 SICL BUSINESS UNIT REPORT NUMBER : Q98001 QUALIFICATION TYPE : NEW DEVICE - NEW PACKAGE DEVICE : STPC Client SIP101 SALES TYPES : STPCD0166BTC3 - STPCD0175BTC3 TECHNICAL CODE : MDBT*CHDT1BR PROCESS : HCMOS6 - CROLLES FAB LOCATION


    Original     		PDF Q98001 SIP101) STPCD0166BTC3 STPCD0175BTC3 388BGA Transistor morocco 9740 Ablebond 8360 con hdr hrs ablebond 8086 interfacing with 8254 peripheral Date Code Formats diodes St Microelectronics formatter board Canon interfacing of 8237 with 8086 ST tOP MaRKinGS

    ST 9427

    Abstract: 155-0241 155-0241-02 M726* TRANSISTOR st 9635 1550371 74935 M605030 806-0300 transistor 9427
    Text: December 1997 RR-B2A High-Frequency Bipolar Products Reliability Report This report presents the product reliability data for Maxim’s High-Frequency Bipolar analog and digital products. This data was collected from extensive reliability stress tests performed between June 1, 1994 and


    Original     		PDF 12GHz 27GHz ST 9427 155-0241 155-0241-02 M726* TRANSISTOR st 9635 1550371 74935 M605030 806-0300 transistor 9427

    Untitled

    Abstract: No abstract text available
    Text: GALAXY SEMICONDUCTOR INTELLIGENCE Key Features Standard and custom reports: • GLOBAL INFORMATION Tester, lot, operator information • YIELD INFORMATION Good parts, failing parts, parts retested Examinator The fastest and easiest way to analyze IC test data.


    Original     		PDF

    ao4800

    Abstract: No abstract text available
    Text: AOS Semiconductor Product Reliability Report AO4800/AO4800L, rev A Plastic Encapsulated Device ALPHA & OMEGA Semiconductor, Inc 495 Mercury Drive Sunnyvale, CA 94085 U.S. Tel: 408 830-9742 www.aosmd.com Jul 14, 2005 1 This AOS product reliability report summarizes the qualification result for AO4800. Accelerated


    Original     		PDF AO4800/AO4800L, AO4800. AO4800 Mil-Std-105D

    Untitled

    Abstract: No abstract text available
    Text: AOS Semiconductor Product Reliability Report AO4817/AO4817L, rev A Plastic Encapsulated Device ALPHA & OMEGA Semiconductor, Inc 495 Mercury Drive Sunnyvale, CA 94085 U.S. Tel: 408 830-9742 www.aosmd.com Sep 12, 2005 1 This AOS product reliability report summarizes the qualification result for AO4817. Accelerated


    Original     		PDF AO4817/AO4817L, AO4817. AO4817 Mil-Std-105D

    DC04 display

    Abstract: how to test POWER MOSFET with digital multimeter tektronix 576 curve tracer VISHAY VT 300 WEIGHT INDICATOR TSMC 0.35Um FLUKE 79 manual THERMAL ELECTRIC COOLER hp 4274A 532 nm laser diode PHOTO TRANSISTOR ppt
    Text: Quality And Reliability Report 2005 DC04-0001 Page 1 of 79


    Original     		PDF DC04-0001 DC04 display how to test POWER MOSFET with digital multimeter tektronix 576 curve tracer VISHAY VT 300 WEIGHT INDICATOR TSMC 0.35Um FLUKE 79 manual THERMAL ELECTRIC COOLER hp 4274A 532 nm laser diode PHOTO TRANSISTOR ppt

    tsmc 0.35um 2p4m cmos

    Abstract: K2411 specification of scr 2p4m teradyne j750 tester manual 2p4m equivalent Z0853006PSC SCR 2P4M Z84C1510FEC DC04 display Z0853006VSC
    Text: Quality And Reliability Report 2004 Period Covered: 2003


    Original     		PDF DC04-0001 tsmc 0.35um 2p4m cmos K2411 specification of scr 2p4m teradyne j750 tester manual 2p4m equivalent Z0853006PSC SCR 2P4M Z84C1510FEC DC04 display Z0853006VSC

    SC77655SP

    Abstract: sc77655 motorola SC77655SP MC44200FT MC145158F2 motorola transistor m 9850 mpc1825 68EC030 motorola 68SEC000 nippon denso
    Text: S EMICON DU CTOR PRODU CTS S ECTOR Imaging and Entertainment Solutions With Networking Computing Systems Group Reliability & Quality Audit Report By Monitor Center Fourth Quarter 1998 S EMICON DU CTOR PRODU CTS S ECTOR TABLE OF CONTENTS Section 1: WO RL D WID E - WORLD C LAS S


    Original     		PDF com/SPS/HPESD/quality/csg/3Q98/ Rel134041-2 Rel200030-4 Rel200095-2 SC77655SP sc77655 motorola SC77655SP MC44200FT MC145158F2 motorola transistor m 9850 mpc1825 68EC030 motorola 68SEC000 nippon denso

    AN-944A

    Abstract: AN944A AN934B IRF130 IRF430 IRF440 what is THERMAL RUNAWAY IN RECTIFIER MOSFET i-pak Package zener diode MOSFET reliability report format AN949A High frequency switching
    Text: EXECUTIVE SUMMARY FIFTY FIFTH QUARTERLY REPORT This Quarterly Reliability Report is a summary of test data covering the previous twenty four months of component testing at International Rectifier's HEXFET America facility in Temecula, California. The products tested include HEXFETs packaged in TO-220,


    Original     		PDF O-220, O-247 O-220 O-220/D2Pak AN-944A AN944A AN934B IRF130 IRF430 IRF440 what is THERMAL RUNAWAY IN RECTIFIER MOSFET i-pak Package zener diode MOSFET reliability report format AN949A High frequency switching

    MTBF calculation

    Abstract: synchronizer mtbf Chapter 3 Synchronization QII51018-10
    Text: 7. Managing Metastability with the Quartus II Software QII51018-10.0.0 This chapter describes the industry-leading analysis, reporting, and optimization features that can help you manage metastability in Altera devices. You can use the Quartus® II software to analyze the average mean time between failures MTBF due


    Original     		PDF QII51018-10 MTBF calculation synchronizer mtbf Chapter 3 Synchronization

    mil-std 883d method 1010

    Abstract: No abstract text available
    Text: QUALITY & RELIABILITY CYPRESS 2001 Q1 RELIABILITY REPORT TABLE OF CONTENTS 1.0 OVERVIEW OF CYPRESS MANAGEMENT SYSTEM SEMICONDUCTOR 2.0 EARLY FAILURE RATE SUMMARY 2.1 Early Failure Rate Determination 3.0 LONG TERM FAILURE RATE SUMMARY 3.1 Long Term Failure Rate Determination


    Original     		PDF

    MAX7845

    Abstract: MAX232 MAX232 mtbf mar 9109 MAX333 equivalent MAX9690 equivalent scr 9117 maxim 9114 max232 specification MAX252 8 pin
    Text: RR-1G Product Reliability Report This report presents the product reliability data for Maxim’s analog products. This data is a result of extensive reliability stress testing that we performed from 1990 to 1992. It is separated into four groups: Metal Gate


    Original     		PDF X10-9 MAX7845 MAX232 MAX232 mtbf mar 9109 MAX333 equivalent MAX9690 equivalent scr 9117 maxim 9114 max232 specification MAX252 8 pin

    W49C65

    Abstract: 9938 9952 l28 cypress 9938 G 9948 PALC22V10B Taiwan Alpha TSMC Flash cy82
    Text: CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT QUARTER 1, 2000 PERFORM PER THE REQUIREMENT OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION Ed Russell Reliability Director CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 1, 2000


    Original     		PDF 125C/-55C CY62146VLL-BAIB 121C/100 150C/-65C CY62137VL-BAI W49C65 9938 9952 l28 cypress 9938 G 9948 PALC22V10B Taiwan Alpha TSMC Flash cy82

    A101

    Abstract: A102 A104 A106 A110 PLCC-84 Z9612 X9607
    Text: INTEGRATED DEVICE TECHNOLOGY, INC. QUALITY & RELIABILITY MONITORS January 1997 IDT QUALITY SERVICE QSP PERFORMANCE 2975 Stender Way, Santa Clara, CA 95054 TEL: 800 345-7015 FAX: (408) 492-8674 IDT QUALITY & RELIABILITY MONITOR REPORT January 1997 TABLE OF CONTENTS


    Original     		PDF

    c9013

    Abstract: 84 pin PBGA oscilloscope MTBF TSMC retention memory dc 8069 IS61C1024 IC Data-book Q-16 car radio 14x20 TSOP 8638
    Text: ISSI Integrated Silicon Solution, Inc. Quality and Reliability 1997-1998 An ISO 9001 Company ISSI ® Quality System Manual QUALITY Reliabilty Report 1997-1998 RELIABILITY Integrated Silicon Solution, Inc. An ISO 9001 Company 1997 Integrated Silicon Solution, Inc.


    Original     		PDF R-118 c9013 84 pin PBGA oscilloscope MTBF TSMC retention memory dc 8069 IS61C1024 IC Data-book Q-16 car radio 14x20 TSOP 8638

    MAX232

    Abstract: MAX1074 LTC902 MAX252 8 pin max232 MTBF calculation max232 specification MAX9687 38544 MAX9690 equivalent analog devices dg508 die
    Text: December 1, 1994 RR-1H Product Reliability Report This report presents the product reliability data for Maxim’s analog products. This data is a result of extensive reliability stress testing that we performed from January 1990 to January 1994. It is separated into six


    Original     		PDF

    MAX785

    Abstract: st 9635 DG302 to220 MAX232CPE MAX232 integrated chips IC 9637 MAX333 equivalent max232 MTBF calculation MAX232 mtbf st 9548
    Text: December 1997 RR-1K Product Reliability Report This report presents the product reliability data for Maxim’s analog products. The data was acquired from extensive reliability stress testing performed in 1996. It is separated into seven fabrication processes: 1 Standard


    Original     		PDF

    wireless charging through microwaves

    Abstract: 9824 motorola wireless mobile charging through microwaves BASIC THERMAL MANAGEMENT OF POWER SEMICONDUCTORS RCA designers handbook Solid-State Power Circuits SLWA009 AN4A506 Plessey TRF7610
    Text: Thermal Considerations for RF Power Amplifier Devices Application Report 1998 Mixed Signal Products Printed in U.S.A. 2/98 SLWA009 Thermal Considerations for RF Power Amplifier Devices SLWA009 February 1998 Printed on Recycled Paper Contents 1 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1


    Original     		PDF SLWA009 wireless charging through microwaves 9824 motorola wireless mobile charging through microwaves BASIC THERMAL MANAGEMENT OF POWER SEMICONDUCTORS RCA designers handbook Solid-State Power Circuits SLWA009 AN4A506 Plessey TRF7610

    DG302 to220

    Abstract: MAX233 application notes zener 9514 MAX249 MAX238 9545 MAX232CPE application sheet max809 ICM7218AIPI MAX232 application notes
    Text: November 1, 1996 RR-1J Product Reliability Report This report presents the product reliability data for Maxim’s analog products. The data was acquired from extensive reliability stress testing performed in 1995. It is separated into seven fabrication processes: 1 Standard


    Original     		PDF

    mil-std-883 2015

    Abstract: mil-std-883* 2015 LV500 BOX BUILD FABRICATION PROCESS INCOMING RAW MATERIAL INSPECTION method for Total organic carbon analyzer INCOMING RAW MATERIAL INSPECTION procedure INCOMING RAW MATERIAL INSPECTION report
    Text: Littelfuse Quality and Reliability 11 Transient Voltage Suppression PAGE Littelfuse Quality . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11-3


    Original     		PDF

    ULN2000

    Abstract: No abstract text available
    Text: RELIABILITY REPORT RELIABILITY OF SERIES U LN 2000A AND U LN 2800A DARLINGTON DRIVERS This report summarizes accelerated-life tests that have been per­ formed on Series ULN2000/2800A integrated circuits and provides information that can be used to calculate the failure rate at any junction


    OCR Scan     		PDF ULN2000/2800A /109unit-hours) ULN2000