RELIABIL Search Results

7476 ic specifications

Abstract: ic 7476 IC 7476 JK logic diagram of ic 7476 7476 logic diagram 7476 ic
Contextual Info: SN547G, SN54LS76A, SN7476, SN74LS76A DUAL J-K FLIP-FLOPS WITH PRESET AND CLEAR D EC EM BE R 1 9 8 3 -R E V IS E D M A R C H • Dependable Texas Instruments Quality and Reliability TO P V IE W ] *^16 : i k iclkC 15 H 1 Q 1 prëC 2 14 : i q 1clrC 3 13 DGND

TY 2016 thyristor

Abstract: Toshiba thyristors TOSHIBA Thyristor
Contextual Info: 5. R ELIA BILITY OF SEM ICONDUCTOR 5.1 to pro ducts are evaluated and when quality and reliability are confirm ed, next step o f the trial mass production proceeds. At the trial mass production step, stability of m anufacturing processes is evaluated p repo n­

Contextual Info: 4. EXPLANATION OF RATINGS AND STANDARDS 4 -1 M axim um R ating* In general, the maximufn rating value should not be exceeded in order to guarantee the life and reliability of integrated circuit products. The Absolute Maximum Rating should not be exceeded even for a moment.

Contextual Info: SAFETY DRGANIZATIDNS RELIABILITY SPECIFICATIONS: TH IS F ILT E R HAS BEEN FORMALLY RRCDONIZOD, C ER TIFIED DR APPROVED BY THE LIST ED AGENCY, THEREFORE, ALL TEST/REQUIREMENTS SP EC IFIED IN THE LATEST REVISION OF TBE FOLLOWING AGENLY STANDARDS HAVE BEEN MET

TF1204

Abstract: MG50G2cl3 toshiba MG50G2CL3
Contextual Info: SOLID STATE GTR DRIVER MODULE TF1204 GTR DRIVER TOSHIBA TF1204 is the GTR driver designed for use with TOSHIBA Giant Transistor Module and it includes the optical isolator and GTR driver cirucit. Using this driver, you can design high reliability and compact system.

74HC113

Abstract: D Flip Flops
Contextual Info: SN 54H C 113. SN 74H C 113 DUAL J K NEGATIVE-EDGE-TRIGGERED FLIP FLOPS WITH PRESET D 2 6 8 4 , DECEMBER 1 9 8 2 -R E V IS E D SEPTEMBER 1 9 8 7 T O P V IEW L J 14 1C LK Ü Dependable Texas Instruments Quality and Reliability 1 K L 1J C ip r e h description

Contextual Info: Quality Conformance Inspection of Finished Products 4. Q u a lity C o n fo rm a n c e In s p e c tio n o f Finished P ro du cts T he im portance of cre a tin g quality a n d reliability in sem iconductor products d u rin g the design an d m a n u fa c tu rin g p ha se s h a s been described. In order to check for com pliance in th e q u a lity control

5TUZ47

Abstract: 5TUZ47 5tuz47
Contextual Info: SILICON DIFFUSED TYPE RECTIFIER 5TUZ47 U nit in mm M O S T SUITABLE FOR COLOR T.V. DAM PER . • • • • Repetitive Peak Reverse Voltage : V r r m = 1500V Average Output Rectified Current : Io = 5A Reverse-Recovery Time : trr = 0.6/iS High Reliability

Contextual Info: INTRODUCTION Today's portable and battery-operated system designer is faced w ith the problem of keeping ahead when addressing system perform ance, long battery life, in terfacin g te ch n o lo gy, and reliability. Toshiba's low vo lta g e high perform ance C2MOS logic fam ilies help designers achieve these goals.

Contextual Info: TYPES SN54H61, SN74H61 TRIPLE 3-INPUT EXPANDERS RE V ISE D D EC EM B ER 1983 SN54H 61 . J PACKAGE SN 74H 61 . J OR N PACKAGE [ • Package Options Include Plastic and Ceramic D IPs {TOP VIEW Dependable Texas Instruments Quality and Reliability 1AC 1 U

Contextual Info: 4. Reliability and Handling Precautions for Device 1. Maximum Rating To guarantee IC ’s Life time and reliability, maximum rating the rating mentioned in this document means the 'absolute maximum rating' should never be exceeded. The maximum rating value of an IC is determined by structural material and

S5J53

Abstract: MIG30J103H 200J2 S5J25 mg7502ys MG150J1JS50 MIG100Q201H GT60M301 MIG30J103HB MP6753
Contextual Info: TOSHIBA [2 ] Introduction [ 2 ] Introduction 1. 600-V Third Generation IGBTs • • • M iniaturization technologies have improved the trade-off between switching speed and saturation voltage V qe (sat = 2-l v Ctyp.) tf = 0.2 pis (typ.). The therm al resistance has been cut for added reliability by using a high heat conduction

Contextual Info: [4 ] PRODUCT RELIABILITY AN D HANDLING PRECAUTIONS [4 ] PRODUCT RELIABILITY AND HANDLING PRECAUTIONS 1. Maximum Rating To guarantee IC Life and reliability, maximum rating the rating mentioned in this docum ent means the 'absolute maximum rating' should never be exceeded.

Contextual Info: SN54HC00, SN74HC00 QU AD R U PLE 2 INPUT POSITIVE-NAND G ATES D 2 6 8 4 . DECEMBER 1 9 8 2 -R E V IS E D M ARC H 1 9 8 4 S N 54H C 00 SN 74H C 00 TO P V IE W 1AC IB C 2 1Y0 3 2AÊ 4 Dependable Texas Instruments Quality and Reliability Th ese devices co n tain four in dependent 2 -in p u t

Contextual Info: SN54HC7266, SN74HC72S6 QUADRUPLE 2-INPUT EXCLUSIVE-NOR GATES D 2 8 0 4 . M A R C H 1 9 8 4 -R E V IS E D SEPTEMBER 1 9 8 7 • Dependable Texas Instruments Quality and Reliability • Totem-Pole Version of 'HC266 S N 5 4 H C 7 2 6 6 . . . J P AC K A G E S N 7 4 H C 7 2 6 6 . . . D OR N P AC KA G E

9262E

Contextual Info: SMJ27C256 262 144-BIT UV ERASABLE PROGRAMMABLE READ-ONLY MEMORY SGMS005D-MAY 1986-REVISED FEBRUARY 1993 Military Operating Temperature Range . . . - 55°C to 125°C J P A C K A G ET T O P V IE W MIL-STD-883C Class B High-Reliabillity Processing Organization . . . 32K

TLP508

Abstract: thyristor 072 0043 sl 1008 transistor thyristor st 103
Contextual Info: 9. Reliability 9.1 General In recent years, as the application fields for photo couplers expand, more discussions are being made on reliability. For reliability improvement, it is insufficient to perform strinct process management and to have reliability tests such as life test and environmental tests. It is necessary to

Contextual Info: SAFETY ORGANIZATIONS RELIABILITY SPECIFICATIONS: THIS FILTER HAS BEEN FORMALLY RECOGNIZED, CERTIFIED DR APPROVED BY THE LISTED AGENCY. THEREFORE, ALL TEST/REQUIREMENTS SPECIFIED IN THE LATEST REVISION DF THE FOLLOWING AGENCY STANDARDS HAVE BEEN MET: STORAGE TEMPERATURE: -40°C TO +85°C

toko cps

Abstract: CPS1149 CPS1099 toko 1013
Contextual Info: CPS TOKO Series DC-DC Converters • <3*, OVERVIEW The CPS series o f DC-DC converters are products o f Toko’s original circuit development with built-in high stability and high reliability characteristics. In the structure, metallic housing is used to reduce

TLRA155BP

Abstract: TLRA155
Contextual Info: T O S H IB A TLRA155BP T O S H IB A LED L A M P G a A fA s RED LIGHT E M ISS IO N TLRA155BP PA NEL C IRCUIT IN D IC A T O R Unit in mm Excellent Bright Red : Colorless Clear Lens High Reliability, Ts^g : —40—120°C Low Drive Current, Practical Brightness are Achieved

SBP9900

Abstract: SBP9900A-1 21L70 catalog 74ls 2ST23 SBP9900A 21l8 SBP9900ACJ 9900 Panel SBP 9900
Contextual Info: TEXAS IN STR -CUC/UPJ 5 e! Ô 9 6 1 7 2 2 TEXAS ÏNBTR C U C T U F T ^ — I De | 0^ 1752 O O E llb ? 29C 21167 S J~ T - Y 7 - / 7 - /-é SBP 9900A-1 Microprocessors Texas Instruments invented the integrated circuit, microprocessor and microcomputer, which have made T l synonymous with reliability,

Contextual Info: SF31 - SF38 CREAT BY ART Pb 3.0AMPS. Super Fast Rectifiers DO-201AD RoHS COMPLIANCE Features — High efficiency, low VF — High current capability — High reliability — High surge current capability — Low power loss — For use in low voltage, high frequency inventor,

Contextual Info: 8 Bit Microcontroller TLCS-870/C Series TMP86FH93NG The information contained herein is subject to change without notice. 021023_D TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity

35502a

Contextual Info: 2A01G - 2A07G CREAT BY ART Pb 2.0 AMPS. Glass Passivated Rectifiers DO-15 RoHS COMPLIANCE Features Glass passivated chip junction High efficiency, Low VF High current capability High reliability High surge current capability Low power loss Green compound with suffix "G" on packing