QUAL Search Results

7476 ic specifications

Abstract: ic 7476 IC 7476 JK logic diagram of ic 7476 7476 logic diagram 7476 ic
Contextual Info: SN547G, SN54LS76A, SN7476, SN74LS76A DUAL J-K FLIP-FLOPS WITH PRESET AND CLEAR D EC EM BE R 1 9 8 3 -R E V IS E D M A R C H • Dependable Texas Instruments Quality and Reliability TO P V IE W ] *^16 : i k iclkC 15 H 1 Q 1 prëC 2 14 : i q 1clrC 3 13 DGND

TY 2016 thyristor

Abstract: Toshiba thyristors TOSHIBA Thyristor
Contextual Info: 5. R ELIA BILITY OF SEM ICONDUCTOR 5.1 to pro ducts are evaluated and when quality and reliability are confirm ed, next step o f the trial mass production proceeds. At the trial mass production step, stability of m anufacturing processes is evaluated p repo n­

74HC113

Abstract: D Flip Flops
Contextual Info: SN 54H C 113. SN 74H C 113 DUAL J K NEGATIVE-EDGE-TRIGGERED FLIP FLOPS WITH PRESET D 2 6 8 4 , DECEMBER 1 9 8 2 -R E V IS E D SEPTEMBER 1 9 8 7 T O P V IEW L J 14 1C LK Ü Dependable Texas Instruments Quality and Reliability 1 K L 1J C ip r e h description

Contextual Info: Quality Conformance Inspection of Finished Products 4. Q u a lity C o n fo rm a n c e In s p e c tio n o f Finished P ro du cts T he im portance of cre a tin g quality a n d reliability in sem iconductor products d u rin g the design an d m a n u fa c tu rin g p ha se s h a s been described. In order to check for com pliance in th e q u a lity control

Contextual Info: TYPES SN54H61, SN74H61 TRIPLE 3-INPUT EXPANDERS RE V ISE D D EC EM B ER 1983 SN54H 61 . J PACKAGE SN 74H 61 . J OR N PACKAGE [ • Package Options Include Plastic and Ceramic D IPs {TOP VIEW Dependable Texas Instruments Quality and Reliability 1AC 1 U

Contextual Info: SN54HC00, SN74HC00 QU AD R U PLE 2 INPUT POSITIVE-NAND G ATES D 2 6 8 4 . DECEMBER 1 9 8 2 -R E V IS E D M ARC H 1 9 8 4 S N 54H C 00 SN 74H C 00 TO P V IE W 1AC IB C 2 1Y0 3 2AÊ 4 Dependable Texas Instruments Quality and Reliability Th ese devices co n tain four in dependent 2 -in p u t

T 7411-1

Contextual Info: TYPES SN54111, SN74111 DUAL J-K MASTER-SLAVE FLIP-FLOPS WITH DATA LOCKOUT R E V IS E D DECEMBER 1983 S N 5 4 1 11 . . . J OR W PACKAGE • Package Options Include Plastic and Ceramic DIPs S N 7 4 1 11 . . . J OR N PACKAGE Dependable Texas Instruments Quality and

Contextual Info: SN54HC804, SN74HC804 HEX 2-INPUT NANO DRIVERS D2804, M ARCH 1 9 8 4 -R E V IS E D SEPTEMBER 1987 High-Current Outputs Can Drive Up to 15 LSTTL Loads SN 54H C804 . . . J PACKAGE S N 7 4 H C 8 0 4 . . . DW OR N PACKAG E T O P V IE W 1A C Dependable Texas Instruments Quality and

Contextual Info: SN54F27, SN74F27 TRIPLE 3-INPUT POSITIVE-NOR GATES D 2 93 2, M A R C H 1 9 8 6 -R E V IS E D J A N U A R Y 1989 TOP VIEW k J 14 H v c c 13 D i e 12 : i y 2AC 11 U3C 2BC 4 2C'C 5 10 ] 3 B 2Y 6 9 33A 8 ]3Y 1BC 32 1AC Dependable Texas Instruments Quality and

Contextual Info: SN54HC7266, SN74HC72S6 QUADRUPLE 2-INPUT EXCLUSIVE-NOR GATES D 2 8 0 4 . M A R C H 1 9 8 4 -R E V IS E D SEPTEMBER 1 9 8 7 • Dependable Texas Instruments Quality and Reliability • Totem-Pole Version of 'HC266 S N 5 4 H C 7 2 6 6 . . . J P AC K A G E S N 7 4 H C 7 2 6 6 . . . D OR N P AC KA G E

sn7423

Abstract: transistor 1yc
Contextual Info: SN5423, SN5425, SN7423, SN7425 DUAL 4 INPUT NOR GATES WITH STROBE DECEMBER 1983-REVISED MARCH 1988 SN5423 . Package Options Include Plastic and Ceram ic D IP s and Ceram ic Flat Packages . J OR W P AC K A G E S N 7423. N P AC KA G E TOP V IE W ! Dependable T exas Instrum ents Quality and

SN64H

Abstract: D268 74HC266
Contextual Info: SN54HC266, SN74HC266 QUADRUPLE 2-INPUT EXCLUSIVE NOR GATES WITH OPEN DRAIN OUTPUTS D2684, DECEMBER 1 98 2 -REVISED SEPTEMBER 1987 TOP VIE W y j u D vcc 1A C 13 J 4B 1B c 2 1YC 3 12 3 4A 2Y £ 4 11 ] 4 Y 2AC 5 10 ] 3Y 2B £ 6 g 2 3B G ND C 7 8 3 3A Dependable Texas Instruments Quality and

Contextual Info: 8 Bit Microcontroller TLCS-870/C Series TMP86FH93NG The information contained herein is subject to change without notice. 021023_D TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity

hf 224 capacitor

Contextual Info: 8 Bit Microcontroller TLCS-870/C Series TMP86C407MG TMP86C407MG The information contained herein is subject to change without notice. 021023 _ D TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and

TMP86FS49AIUG

Abstract: toshiba rf semiconductor 2014
Contextual Info: 8 Bit Microcontroller TLCS-870/C Series TMP86FS49AIUG The information contained herein is subject to change without notice. 021023_D TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and

MUR360S

Abstract: 320s
Contextual Info: MUR305S - MUR360S CREAT BY ART Pb RoHS 3.0 AMPS. Surface Mount Ultrafast Power Rectifiers SMC/DO-214AB COMPLIANCE Features — For surface mounted application — Glass passivated junction chip — Low profile package — Built-in strain relief — Qualified as per AEC-Q101

TMP86CM74AFG

Contextual Info: 8 Bit Microcontroller TLCS-870/C Series TMP86CM74AFG The information contained herein is subject to change without notice. 021023_D TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and

Contextual Info: 8 Bit Microcontroller TLCS-870/C1 Series TMP89FH46 The information contained herein is subject to change without notice. 021023_D TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and

automatic light dimmer based on temperature

Contextual Info: 8 Bit Microcontroller TLCS-870/C Series TMP86CK74AFG The information contained herein is subject to change without notice. 021023_D TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and

Contextual Info: 8 Bit Microcontroller TLCS-870/C1 Series TMP89FM46L The information contained herein is subject to change without notice. 021023_D TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity

Contextual Info: 8 Bit Microcontroller TLCS-870/C1 Series TMP89CM42 The information contained herein is subject to change without notice. 021023_D TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity

tmp86fs49aug

Contextual Info: 8 Bit Microcontroller TLCS-870/C Series TMP86FS49AUG TMP86FS49AUG The information contained herein is subject to change without notice. 021023 _ D TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and

Contextual Info: 8 Bit Microcontroller TLCS-870/X Series TMP88CH41NG The information contained herein is subject to change without notice. 021023_D TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and

Contextual Info: 8 Bit Microcontroller TLCS-870/C Series TMP86FH47ADUG TMP86FH47ADUG The information contained herein is subject to change without notice. 021023 _ D TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and