MIL-STD-883 1010 Search Results

Contextual Info: P\-oS-o\ a company built on proven reliability MICROWAVE Chip Capacitors Bond Strength — exceeds Mil Std-883, Method 2011 Sheer Strength — exceeds Mil Std-883, Method 2019 Metalization — Gold, Mil-G-45204 Type III Grade A Quality Control System approved to Mil-l-45208

C5586

Abstract: Capacitor ceramic c70 C-30 N1500 N2200 P180 c5587 2302B c50710 c557
Contextual Info: f\-0S -0\ a company built on proven reliability MICROWAVE Chip Capacitors Bond Strength — exceeds Mil Std-883, Method 2011 Sheer Strength — exceeds Mil Std-883, Method 2019 Metalization — Gold, Mil-G-45204 Type III Grade A Quality Control System approved to Mil-l-45208

P22793

Abstract: P22804
Contextual Info: RELIABILITY MONITOR DS1225AB-200 NOV '98 MONITOR-DALLAS DEVICE REVISION DATE CODE LOT NUMBER PACKAGE ASSEMBLY SITE DS1225A A1 9826 101045 28 PIN MODULE DALLAS JOB_NO DESCRIPTION CONDITION P22787 SOLDERABILITY MIL-STD-883-2003 TOTAL: 3 1 WEEK P22788 PHYSICAL DIMENSIONS MIL-STD-883-2016

lot code

Abstract: DS1225 date code
Contextual Info: RELIABILITY MONITOR DS1225AB-200 MAY '98 MONITOR-DALLAS DEVICE REVISION DATE CODE LOT NUMBER PACKAGE ASSEMBLY SITE DS1225 S 9806 100539 28 PIN MODULE DALLAS JOB_NO DESCRIPTION P22069 P22070 CONDITION SOLDERABILITY MIL-STD-883-2003 TOTAL: PHYSICAL DIMENSIONS MIL-STD-883-2016

Contextual Info: General Information M ilitary Screening Procedures D. HI-REL SCREENING Unitrode offers devices screened to MIL-STD-883, customer requirements, and will perform tests as specified by MIL-M-38510. When ordering MIL-STD-883 Screening, specify: • Prime electrical and military temperature range, generic part number and package type

P22220

Abstract: MIL-STD-883-2016 p22793 ds1230Y date code P-225-1 P22789 P22070
Contextual Info: RELIABILITY MONITOR DS1225AB-200 MAY '98 MONITOR-DALLAS DEVICE REVISION DATE CODE LOT NUMBER PACKAGE ASSEMBLY SITE DS1225 S 9806 100539 28 PIN MODULE DALLAS JOB_NO DESCRIPTION CONDITION P22069 SOLDERABILITY MIL-STD-883-2003 TOTAL: 3 1 WEEK P22070 PHYSICAL DIMENSIONS MIL-STD-883-2016

107D

Contextual Info: CHIP LED LAMPS GENERAL INFORMATION QUALITY CONTROL AND ASSURANCE Classification Endurance Test Environmental Test Test Item Reference Standard Test Conditions Operation Life MIL-STD-750 : 1026 MIL-STD-883 : 1005 JIS C 7021 : B-1 High Temperature High Humidity

107D

Abstract: HX2040
Contextual Info: CHIP LED LAMPS GENERAL INFORMATION QUALITY CONTROL AND ASSURANCE Classification Endurance Test Environmental Test Test Item Reference Standard Test Conditions Result Operation Life MIL-STD-750 : 1026 MIL-STD-883 : 1005 JIS C 7021 : B-1 Connect with a power If = 20mA

QL3012

Abstract: QL3025 QL3040 QL3060 QL4016 QL4090 footprint pqfp 208 QuickLogic Military FPGA Introduction
Contextual Info: QuickLogic Military FPGA Introduction Military FPGA Combining High Performance and High Density Military FPGA Introduction DEVICE HIGHLIGHTS Device Highlights Military FPGA • Mil Std 883 and Mil Temp Ceramic ■ Mil Temp Plastic Guaranteed -55 to +125oC

Option Information

Contextual Info: Work-In-Progress Option Information www.vishay.com Vishay Siliconix MIL-PRF-38535 Class Level B Process Flow MIL-STD-883/M5004 INTERNAL VISUAL METHOD 2010 CONDITION B TEMP CYCLE METHOD 1010 CONDITION C CONSTANT ACCELERATION METHOD 2001 CONDITION E PRE-BURNIN ELECTRICAL

MIL-STD-883 Method 2019

Contextual Info: Quality Standards and Military Screening Amplifonix is qualified to support both MIL-STD-883 * screening as well as parts that conform to MIL-PRF-38534 Class H. All screening is performed on site, including Groups A, B, C and D. Environmental Screening Test

Contextual Info: Military and Aerospace ICs _ Screening and Conformance Testing Lot Screening Tests /3A Screening Level is Compliant to MIL-STD-883, Para. 1.2.1 Total Lot Screening X = 100% Testing Screening Tests Conditions Assembly Precap Visual

690b

Contextual Info: Miniature Panel Mount Optical Encoder Reliability Data HRPG Series Description The following cumulative test results have been obtained from testing performed at HewlettPackard Optoelectronics Division in accordance with the latest revision of MIL- STD-883.

Contextual Info: C5 The C5 resistor chips on ceramic are designed for higher power applications and user trimmability. These chips are manufactured using state-of-the-art thin-film techniques, are 100% electrically tested and visually inspected to MIL-STD-883. Small single chip size 100 x 100 mil

Contextual Info: Surface Mount Chip LEDs Reliability Data HSMX-C650, C670 HSMF-C655 Description revisions of MIL- STD-883. The following cumulative test results have been obtained from testing performed at HewlettPackard Optoelectronics Division in accordance with the latest

MTTF

Abstract: MTTF test data ina series
Contextual Info: Silicon Bipolar Monolithic Amplifier Reliability Data INA Series Description The following cumulative test results have been obtained from testing performed at HewlettPackard in accordance with the latest revision of MIL-STD-883. Data was gathered from the

MIL-STD-883, Method 1010

Contextual Info: Surface Mount Flip Chip LEDs Reliability Data Description The following cumulative test results have been obtained from testing performed at HewlettPackard Optoelectronics Division in accordance with the latest revisions of MIL- STD-883. HSMX-H630, -H670, -H690,

MTTF

Contextual Info: Silicon Bipolar Variable Gain Amplifiers Reliability Data IVA Series Description The following cumulative test results have been obtained from testing performed at HewlettPackard in accordance with the latest revision of MIL-STD-883. Data was gathered from the

MIL-STD-883, Method 1010

Contextual Info: High Performance Surface Mount Chip LEDs Reliability Data HSMX-S660, S670, S690 Description revisions of MIL- STD-883. The following cumulative test results have been obtained from testing performed at HewlettPackard Optoelectronics Division in accordance with the latest

CD4017 smd

Abstract: Ic cd4060 pin configuration 7012 smd ic CD4541 equivalent CD4010 circuit pin configuration cd4541 application CD4050AFB CD4017 equivalent CD4013BFB 4018A
Contextual Info: CMOS Logic ICs - CD4000B Series Features Compliance to MIL-STD-883 The Harris High-Reliability C D 400 0B S er es of high-voltage Harris C D 4 0 0 0 Series parts are in full compliance with Para­ graph 1.2.1 of M IL-S TD -883. Product is provided to m eet the

MSK PRODUCT COMPARISON CHART

Contextual Info: MSK PRODUCT COMPARISON CHART Test Flow or Requirement MIL-STD-883 Test Method Certification Qualification QML Listing No Element Evaluation Clean Room Processing Ultrasonic Inspection, TM 2030 Wirebond Process Control No Yes A/R Yes Hermetic Class H Yes

ATF-13XXX

Abstract: failure test data
Contextual Info: Low Noise Gallium Arsenide FET Reliability Data ATF-10XXX ATF-13XXX Description The following cumulative test results have been obtained from testing performed at HewlettPackard in accordance with the latest revision of MIL-STD-883. Data was gathered from the

IAM-8XXXX

Abstract: MTTF
Contextual Info: Silicon Bipolar Active Mixer Reliability Data IAM-8XXXX Description The following cumulative test results have been obtained from testing performed at HewlettPackard in accordance with the latest revision of MIL-STD-883. Data was gathered from the product qualification, reliability

JESD22 A108-B

Contextual Info: Agilent HDSM-425G 0.4" Dual Digit Green Surface Mount Seven Segment Display Reliability Data Sheet Description The following cumulative test results have been obtained from testing performed at Agilent Technologies in accordance with the latest revision of MIL-STD-883.