MEASUREMENTS GROUP Search Results

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Abstract: Fcc907 MB2141
Contextual Info: FCC907S-Time Measurements with MB2141 Emulator Application Note FCC907S-Time Measurements with MB2141 Emulator Fujitsu Microelectronic Europe GmbH, Microcontroller Application Group History 18th Nov. 99 MSt V1.0 New version Introduction In Softune Workbench exist 3 possibilities for time measurements.

Contextual Info: Agilent 8702E Lightwave Component Analyzer 850 nm, 1300 nm, 1550 nm 300 kHz to 3 or 6 GHz Product Overview Accurate modulation frequency response measurements of lightwave components 2 Measurement versatility by design Guided measurements Fast, easy measurements

NTC 7

Abstract: ML6428 VM700 BUT20
Contextual Info: April 1998 Application Brief 42016 The Low Noise Characteristics of the ML6428 INTRODUCTION This Application Note discusses noise measurements taken on the Micro Linear video filter family. The reason for the measurements is that noise, like group delay or

equivalent of transistor D 2331

Abstract: "Signal Conditioners" 2300 vishay D 2331 Front Monitor Diode optoisolator Peak and Hold
Contextual Info: 2331 Vishay Micro-Measurements Readout Modules with Peak-Hold Feature FEATURES • For use with Vishay Measurements Group 2300 Signal Conditioning Amplifier System • Provides real-time digital readout with peak-hold capability • Both maximum and minimum signals are sorted

RFFC2072

Abstract: RFFC5071 RFFC2071 RFFC5072 balun differential to single
Contextual Info: AN RFMD APPLICATION NOTE Integrated Configurable Components from RFMD Multi-Market Products Group Integrated Synthesizer/Mixer LO Output Measurements Preliminary Results Introduction This document contains preliminary results of local oscillator LO output measurements achieved by the RFFCx072 series of

Contextual Info: Fujitsu Microelectronics Europe MCU-AN-390039-E-V10 Application Note FCC907S-Time Measurements with MB2141 Emulator Fujitsu Microelectronic Europe GmbH, Microcontroller Application Group History 18th Nov. 99 MSt V1.0 New version Introduction In Softune Workbench exist 3 possibilities for time measurements.

microwave transistor siemens bfp 420

Abstract: 4144 lH21l BFP450 siemens MICROWAVE POWER TRANSISTOR IMPEDANCE MEASUREMENT doppler radar SMX-1 BFP450 transistor s parameters noise sot-343 as
Contextual Info: APPLICATIONS DISCRETE SEMICONDUCTORS Jakob Huber ● Gerhard Lohninger RF measurements on SIEGET bipolar transistors: Predicting performance straight from the wafer Multistage measurements are intended to ensure unrestricted operation of RF transistors. But until recently,

linear displacement sensor

Abstract: displacement sensor 350-ohm HS10 HS100 HS25 HS50 displacement sensors hs50
Contextual Info: HS Micro-Measurements Linear Displacement Sensor FEATURES • Infinite resolution • True output linearity over the entire measurement range • Low operating forces • Excellent stability and temperature compensation DESCRIPTION Micro-Measurements Linear Displacement Sensors use a

Photocoupler Q 817

Abstract: 727 thyristor PHILIPS WIDEBAND HYBRID IC MODULES transistor 33725 DIODE S4 74 vo 727 z-diode philips catv 860 amplifier ic SNW-EQ-611 tunnel diode GaAs philips OPTICAL PICK-UP
Contextual Info: GENERAL page Quality Pro Electron type numbering system Rating systems Letter symbols CATV parameters Appendix A - Common frequency sets for ddim measurements Appendix B - Common frequency sets for d2 measurements Appendix C - Distortion results using the CENELEC

strain Gages CEA

Abstract: TN-506 LWK-XX-W250B-350 CEA-XX-W250A-350 330-dfv MODEL 700 CEA-XX-W250C-120 326-DFV WWT-TG-W200B-050 bulletin B-131
Contextual Info: Standard Weldable Patterns Vishay Micro-Measurements Special Use Sensors - Weldable Strain Gages Vishay Micro-Measurements Standard Weldable Strain Gages and Temperature Sensors are specially designed for spot welding to structures and components. They are ideal

Contextual Info: RS-200 Micro-Measurements Milling Guide for Residual Stress Measurements INTRODUCTION A predominant factor contributing to the structural failure of machine parts, pressure vessels, framed structures, etc., may be the residual “locked-in” stresses that

linear displacement sensor specification

Abstract: HS50 linear displacement sensor
Contextual Info: HS Micro-Measurements Linear Displacement Sensor FEATURES • Infinite resolution  True output linearity over the entire measurement range  Low operating forces  Excellent stability and temperature compensation DESCRIPTION Micro-Measurements Linear Displacement Sensors use a

HP8341B

Abstract: HP4145 hp11612a 8970B TRANSISTOR noise figure measurements footprint transistor Plessey
Contextual Info: On Wafer Noise Measurement Using Bipolar Transistor RF Test Structures S.D. Connor Bipolar Characterization Group, Central R&D, G.E.C. Plessey Semiconductors, Tweedale Way, Oldham, Lancs OL9 7LA, England. Abstract:- We present here a technique for on wafer noise we measurements using bipolar R.F. cell structures. Measurements were taken

Philips KS capacitors

Abstract: ferrite core transformer calculation formula Full bridge converter 200 watt ,50 KHz flyback transformer philips PHILIPS ferrite transformer cores 4558 smd planar transformer formula half-bridge converter half bridge converter Philips KS 40 Temperature Control
Contextual Info: application note 10 Watt DC/DC Converter using IIC Magnetics Philips Components 10 Watt DC/DC Converter using IIC Magnetics Contents 1 Introduction 3 Converter specification 4 Topology selection 4 Design of IIC magnetics 5 Electrical measurements 8 Thermal measurements

Contextual Info: Agilent 8504B Precision Reflectometer 0 to 80 dB return loss 25 micron resolution 1300 and 1550 nm Product Overview Lightwave component return loss measurements 2 Crucial return loss measurements High levels of measurement sensitivity Agilent 8504B Precision Reflectometer

Contextual Info: Achieve Accurate Resistance Measurements with the Agilent 34980A Multifunction Switch Measure Unit Application Note Challenge the Boundaries of Test Agilent Modular Products Easily identify sources of resistive errors and make accurate 2, 3 and 4-wire resistance measurements

EP-40-125TQ-350

Abstract: ea502 EP-40-250AE-350 EA-50-500BL-350 EA-30-250BF-350 EP-40-125AC-350 EA-50-125AC-350 EA-30-060CC-350 EP-40-250BK-10C EA-50-125TQ-350
Contextual Info: High S-T-C Patterns Vishay Micro-Measurements Special Purpose Sensors - High S-T-C Patterns The thermal coefficient of expansion of a group of materials generically classified as plastics varies greatly with type and the temperature range of interest. Vishay Micro-Measurements offers a variety of standard gage patterns with

dqpsk modulation tetra

Abstract: FRB connector hp deskjet 840 diagram IEC60555-2 EN50082-1 IEC1000-4-2 IEC1000-4-3 IEC1000-4-4 IEEE488 TETRA radio
Contextual Info: Signal Analyzers 2310 TETRA Signal Analyzer Setting new standards in TETRA transmitter analysis where speed and accuracy counts • Accurate TETRA transmitter measurements • Test TETRA base stations, terminals and direct mode radios • Measurements made conforming to ETSI,

IPC-CC-830

Abstract: resistive linear position transducer 1440-TPS02-01RB XM-320 lvdt sensor Rotary variable differential transformer XM320 differential relay transformer lvdt 8 channel latching Relay
Contextual Info: TECHNICAL DATA XM-320 POSITION MODULE The Allen-Bradley XM -320 Position Module is a 2-channel general-purpose monitor that supports the following measurements per channel: • Axial Position Independent measurements per channel. • Valve Position Independent

326-DFV

Abstract: measurements group "model 700" welder 330-DFV LWK-XX-W250B-350 strain Gages CEA TN-506 TEMPERATURE SENSORS AND LST NETWORKS MODEL 700 strain Gages CEA-XX-W250A-350
Contextual Info: Standard Weldable Patterns Micro-Measurements Special Use Sensors - Weldable Strain Gages Micro-Measurements Standard Weldable Strain Gages and Temperature Sensors are specially designed for spot welding to structures and components. They are ideal for applications where test or environmental conditions preclude

Contextual Info: Sealed Weldable Patterns Micro-Measurements Special Use Strain Gages - Weldable Strain Gages are equally advantageous when strain measurements must be made at elevated temperatures, but the nature of the test object does not permit the use of an elevatedtemperature-curing

Contextual Info: Standard Weldable Patterns Micro-Measurements Special Use Sensors - Weldable Strain Gages Micro-Measurements Standard Weldable Strain Gages and Temperature Sensors are specially designed for spot welding to structures and components. They are ideal for applications where test or environmental conditions preclude

CEA-XX-W250A-350

Abstract: LWK-XX-W250B-350 TN-506 330-DFV LWK-XX-W250D-350 326-DFV bulletin B-131 CEA-XX-W250A-120 strain Gages strain Gages CEA
Contextual Info: Weldable Patterns Vishay Micro-Measurements Special Purpose Sensors - Weldable Patterns Vishay Micro-Measurements Weldable Strain Gages and Temperature Sensors are specially designed for spot welding to structures and components. They are ideal for applications where test or environmental conditions preclude

CPF-50D

Abstract: CPF-50C CEG-75C
Contextual Info: Bondable Terminals Micro-Measurements Terminal Details and Descriptions For many types of strain gages i.e., Micro-Measurements EA-Series , instrument leadwires generally should not be attached directly to the solder tabs of the gage. Instead, the normal practice is to install bondable terminals adjacent