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    MIL-STD 833 test method 3015

    Abstract: MP 1008 es
    Text: Timer E 2 1024K Electrically Erasable PR O M Technology, Incorporated P R E L IM IN A R Y D A T A S H E E T FEATURES • High Speed • 120 nsec Maximum Access Time ■ Low Power CMOS Technology • 70 mA Active Current • 8 mA Standby Current ■ High Endurance


    OCR Scan     		PDF M28C010A 1024K 28C010A 120ns D40009 MIL-STD 833 test method 3015 MP 1008 es

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    Abstract: No abstract text available
    Text: Technology, Incorporated Timer E 2 1024K Electrically Erasable PRO M PRELIMINARY DATASHEET FEATURES • High Speed • 120 nsec Maximum Access Time High Endurance • tO,000 Cycles/Byte • 10 Year Data Retention ■ Low Power CMOS Technology • 70 mA Active Current


    OCR Scan     		PDF 1024K 80fjsec 28C010A MD400096/- 120-120ns