JEDEC JESD22-B117
Abstract: JESD22-B117 Solder Paste, Indium 5.8 N41 250 y 803 IPC-9504 10k resistor 1/8 watt datasheet hot air bga Solder Paste, Indium 5.1, Type 3 10k resistor 1/4 watt datasheet
Text: RELIABILITY TEST DATA Table of Contents BGA RESISTOR ARRAY DESIGN VALIDATION TEST PLAN .3 DESIGN VERIFICATION PLAN & REPORT .4
|
Original
|
|
PDF
|
BR2032
Abstract: 0348
Text: 03/04/04 RELIABILITY REPORT FOR DS1254W w/DS3800 Cap, Fastech, Single Sided PCB Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Don Lipps Staff Reliability Engineer Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292
|
Original
|
DS1254W
w/DS3800
30C/60%
JESD22-B101
60C/90%
BR2032
0348
|
PDF
|
JESD22-B101
Abstract: MTTF analysis data
Text: 10/2/2006 RELIABILITY REPORT FOR DS3050W, Rev A, RoHS Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com
|
Original
|
DS3050W,
JESD22-A113
60C/90%
JESD22-B101
MTTF analysis data
|
PDF
|
Nitto GE100BCUL
Abstract: GE-100BC-UL DS26518 ge100bcul nitto GE UTAC laser Ablebond 2025D
Text: 11/20/2008 RELIABILITY REPORT FOR DS26518, Rev B1 Maxim Integrated Products 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Director, Reliability Engineering Maxim Integrated Products 4401 South Beltwood Pkwy. Dallas, TX 75244-3292
|
Original
|
DS26518,
Nitto GE100BCUL
GE-100BC-UL
DS26518
ge100bcul
nitto GE
UTAC laser
Ablebond 2025D
|
PDF
|
MTTF analysis data
Abstract: JESD22-B101
Text: 10/2/2006 RELIABILITY REPORT FOR DS3030W, Rev A, RoHS Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com
|
Original
|
DS3030W,
JESD22-A113
60C/90%
MTTF analysis data
JESD22-B101
|
PDF
|
S 0319
Abstract: CRM1525D
Text: 12/17/2003 RELIABILITY REPORT FOR DS3146, Rev A1 Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com
|
Original
|
DS3146,
30C/60%
S 0319
CRM1525D
|
PDF
|
JESD22-B117
Abstract: JEDEC JESD22-B117 JESD22-B101 JESD22-A113 ML614R
Text: 7/28/2005 RELIABILITY REPORT FOR DS2030L, Rev A Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com
|
Original
|
DS2030L,
JESD22-B101
JESD22-A113
60C/90%
JESD22-B117
JEDEC JESD22-B117
JESD22-B101
JESD22-A113
ML614R
|
PDF
|
Nitto GE 100
Abstract: NITTO GE-100 Nitto GE MARK FA
Text: 11/10/2006 RELIABILITY REPORT FOR DS33R11, Rev A2 Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com
|
Original
|
DS33R11,
30C/60%
Nitto GE 100
NITTO GE-100
Nitto GE
MARK FA
|
PDF
|
JEDEC JESD22-B117
Abstract: JESD22-B107 JESD22-B101 JESD22-A113
Text: 7/28/2005 RELIABILITY REPORT FOR DS2045L, Rev A Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com
|
Original
|
DS2045L,
JESD22-B101
JESD22-A113
60C/90%
JEDEC JESD22-B117
JESD22-B107
JESD22-B101
JESD22-A113
|
PDF
|
induction cooker fault finding diagrams
Abstract: induction cooker schematic diagram th 20594 JEDEC JESD22-B116 free datasheet transistor said horizontal tt 2222 8 PIN DIL 20594 JEDEC JESD22-B109 JESD22-B108A schematic diagram induction cooker induction cooker coil design
Text: To our customers, Old Company Name in Catalogs and Other Documents On April 1st, 2010, NEC Electronics Corporation merged with Renesas Technology Corporation, and Renesas Electronics Corporation took over all the business of both companies. Therefore, although the old company name remains in this document, it is a valid
|
Original
|
REJ27L0001-0101
induction cooker fault finding diagrams
induction cooker schematic diagram
th 20594
JEDEC JESD22-B116 free
datasheet transistor said horizontal tt 2222
8 PIN DIL 20594
JEDEC JESD22-B109
JESD22-B108A
schematic diagram induction cooker
induction cooker coil design
|
PDF
|
JESD22-B107
Abstract: JEDEC JESD22-B117 JESD22-B101 JESD22-A113 JESD22-B117 JESD22A-113
Text: 7/20/2005 RELIABILITY REPORT FOR DS2030AB & Y, Rev A Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com
|
Original
|
DS2030AB
JESD22-B101
JESD22-A113
60C/90%
JESD22-B107
JEDEC JESD22-B117
JESD22-B101
JESD22-A113
JESD22-B117
JESD22A-113
|
PDF
|
FP4527
Abstract: PHYSICAL DIMENSIONS JESD22-B100 JESD22-B117 fr 0204 JEDEC JESD22-B117 j-std-020 JESD22-B100 JSTD-020 catalyst tester FP452
Text: 01/31/2003 RELIABILITY REPORT FOR DS21Q48 Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com
|
Original
|
DS21Q48
FA30006154)
FP4527
PHYSICAL DIMENSIONS JESD22-B100
JESD22-B117
fr 0204
JEDEC JESD22-B117
j-std-020
JESD22-B100
JSTD-020
catalyst tester
FP452
|
PDF
|
J-STD-020
Abstract: Ablebond 71
Text: 07/15/2003 RELIABILITY REPORT FOR DS3144, Rev A1 Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com
|
Original
|
DS3144,
J-STD-020
Ablebond 71
|
PDF
|
JESD22-B107
Abstract: JESD22-B101 JESD22-A113 JESD22-B100 JEDEC JESD22-B117 PHYSICAL DIMENSIONS JESD22-B100 JESD-22-A113
Text: 7/22/2005 RELIABILITY REPORT FOR DS2050W, Rev A Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com
|
Original
|
DS2050W,
JESD22-B101
JESD22-A113
60C/90%
JESD22-B107
JESD22-B101
JESD22-A113
JESD22-B100
JEDEC JESD22-B117
PHYSICAL DIMENSIONS JESD22-B100
JESD-22-A113
|
PDF
|
|
JESD22-B101
Abstract: ML2020R
Text: 10/2/2006 RELIABILITY REPORT FOR DS3070W, Rev A, RoHS Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com
|
Original
|
DS3070W,
JESD22-A113
60C/90%
JESD22-B101
ML2020R
|
PDF
|
Jesd22-A113
Abstract: JEDEC JESD22-B117 PHYSICAL DIMENSIONS JESD22-B100 JESD22-B107
Text: 7/20/2005 RELIABILITY REPORT FOR DS2045AB & Y, Rev A Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com
|
Original
|
DS2045AB
JESD22-B101
JESD22-A113
60C/90%
Jesd22-A113
JEDEC JESD22-B117
PHYSICAL DIMENSIONS JESD22-B100
JESD22-B107
|
PDF
|
NITTO HC-100-XJAA-M
Abstract: CRM1525D HC-100XJAA-M
Text: 12/17/2003 RELIABILITY REPORT FOR DS3148, Rev A1 Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com
|
Original
|
DS3148,
30C/60%
NITTO HC-100-XJAA-M
CRM1525D
HC-100XJAA-M
|
PDF
|
JESD22-B117
Abstract: No abstract text available
Text: 10/2/2006 RELIABILITY REPORT FOR DS3065W, Rev A, RoHS Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com
|
Original
|
DS3065W,
JESD22-A113
60C/90%
JESD22-B117
|
PDF
|
Nitto GE 100
Abstract: GE-100-LFC nitto GE100LFC NITTO GE-100 MIL-STD-883-2012 ML614R J-STD-020 nitto GE ds12r885-5
Text: 12/2/2005 RELIABILITY REPORT FOR DS12R887, Rev A2-R0A Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Don Lipps Staff Reliability Engineer Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : don.lipps@dalsemi.com
|
Original
|
DS12R887,
Nitto GE 100
GE-100-LFC
nitto GE100LFC
NITTO GE-100
MIL-STD-883-2012
ML614R
J-STD-020
nitto GE
ds12r885-5
|
PDF
|
JESD22-B101
Abstract: No abstract text available
Text: 10/2/2006 RELIABILITY REPORT FOR DS2070W, Rev A, RoHS Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com
|
Original
|
DS2070W,
JESD22-A113
60C/90%
JESD22-B101
|
PDF
|
JESD22-B117
Abstract: F-0203-04
Text: Integrated Device Technology, Inc. 2975 Stender Way, Santa Clara, CA - 95054 PRODUCT/PROCESS CHANGE NOTICE PCN PCN #: F-0203-04 DATE: 2/27/2002 Product Affected: Plastic Ball Grid Array (PBGA) BG121 Date Effective: Contact: Title: Phone #: Fax #: E-mail:
|
Original
|
F-0203-04
BG121
168Hrs,
EIA/JESD22-A110
MIL-STD-883
EIA/JESD22-A102
J-STD-20
J-STD-35
JESD22-B117
|
PDF
|
JESD22-B101
Abstract: 211624 DS1310
Text: 10/2/2006 RELIABILITY REPORT FOR DS3045W, Rev A, RoHS Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com
|
Original
|
DS3045W,
JESD22-A113
60C/90%
JESD22-B101
211624
DS1310
|
PDF
|
NITTO HC-100-XJAA-M
Abstract: CRM1525D HC100-XJ HC100 HC-100-XJAA-M HC100-XJAA JEDEC JESD22-B117
Text: 12/17/2003 RELIABILITY REPORT FOR DS31412, Rev A1 Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com
|
Original
|
DS31412,
30C/60%
NITTO HC-100-XJAA-M
CRM1525D
HC100-XJ
HC100
HC-100-XJAA-M
HC100-XJAA
JEDEC JESD22-B117
|
PDF
|
Untitled
Abstract: No abstract text available
Text: 03/04/04 RELIABILITY REPORT FOR DS1254Y w/DS3800 Cap, Fastech, Single Sided PCB Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Don Lipps Staff Reliability Engineer Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292
|
Original
|
DS1254Y
w/DS3800
30C/60%
JESD22-B101
60C/90%
|
PDF
|