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    JESD22B117 Search Results

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    Catalog Datasheet MFG & Type Document Tags PDF

    JEDEC JESD22-B117

    Abstract: JESD22-B117 Solder Paste, Indium 5.8 N41 250 y 803 IPC-9504 10k resistor 1/8 watt datasheet hot air bga Solder Paste, Indium 5.1, Type 3 10k resistor 1/4 watt datasheet
    Text: RELIABILITY TEST DATA Table of Contents BGA RESISTOR ARRAY DESIGN VALIDATION TEST PLAN .3 DESIGN VERIFICATION PLAN & REPORT .4


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    BR2032

    Abstract: 0348
    Text: 03/04/04 RELIABILITY REPORT FOR DS1254W w/DS3800 Cap, Fastech, Single Sided PCB Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Don Lipps Staff Reliability Engineer Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292


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    DS1254W w/DS3800 30C/60% JESD22-B101 60C/90% BR2032 0348 PDF

    JESD22-B101

    Abstract: MTTF analysis data
    Text: 10/2/2006 RELIABILITY REPORT FOR DS3050W, Rev A, RoHS Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com


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    DS3050W, JESD22-A113 60C/90% JESD22-B101 MTTF analysis data PDF

    Nitto GE100BCUL

    Abstract: GE-100BC-UL DS26518 ge100bcul nitto GE UTAC laser Ablebond 2025D
    Text: 11/20/2008 RELIABILITY REPORT FOR DS26518, Rev B1 Maxim Integrated Products 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Director, Reliability Engineering Maxim Integrated Products 4401 South Beltwood Pkwy. Dallas, TX 75244-3292


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    DS26518, Nitto GE100BCUL GE-100BC-UL DS26518 ge100bcul nitto GE UTAC laser Ablebond 2025D PDF

    MTTF analysis data

    Abstract: JESD22-B101
    Text: 10/2/2006 RELIABILITY REPORT FOR DS3030W, Rev A, RoHS Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com


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    DS3030W, JESD22-A113 60C/90% MTTF analysis data JESD22-B101 PDF

    S 0319

    Abstract: CRM1525D
    Text: 12/17/2003 RELIABILITY REPORT FOR DS3146, Rev A1 Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com


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    DS3146, 30C/60% S 0319 CRM1525D PDF

    JESD22-B117

    Abstract: JEDEC JESD22-B117 JESD22-B101 JESD22-A113 ML614R
    Text: 7/28/2005 RELIABILITY REPORT FOR DS2030L, Rev A Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com


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    DS2030L, JESD22-B101 JESD22-A113 60C/90% JESD22-B117 JEDEC JESD22-B117 JESD22-B101 JESD22-A113 ML614R PDF

    Nitto GE 100

    Abstract: NITTO GE-100 Nitto GE MARK FA
    Text: 11/10/2006 RELIABILITY REPORT FOR DS33R11, Rev A2 Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com


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    DS33R11, 30C/60% Nitto GE 100 NITTO GE-100 Nitto GE MARK FA PDF

    JEDEC JESD22-B117

    Abstract: JESD22-B107 JESD22-B101 JESD22-A113
    Text: 7/28/2005 RELIABILITY REPORT FOR DS2045L, Rev A Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com


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    DS2045L, JESD22-B101 JESD22-A113 60C/90% JEDEC JESD22-B117 JESD22-B107 JESD22-B101 JESD22-A113 PDF

    induction cooker fault finding diagrams

    Abstract: induction cooker schematic diagram th 20594 JEDEC JESD22-B116 free datasheet transistor said horizontal tt 2222 8 PIN DIL 20594 JEDEC JESD22-B109 JESD22-B108A schematic diagram induction cooker induction cooker coil design
    Text: To our customers, Old Company Name in Catalogs and Other Documents On April 1st, 2010, NEC Electronics Corporation merged with Renesas Technology Corporation, and Renesas Electronics Corporation took over all the business of both companies. Therefore, although the old company name remains in this document, it is a valid


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    REJ27L0001-0101 induction cooker fault finding diagrams induction cooker schematic diagram th 20594 JEDEC JESD22-B116 free datasheet transistor said horizontal tt 2222 8 PIN DIL 20594 JEDEC JESD22-B109 JESD22-B108A schematic diagram induction cooker induction cooker coil design PDF

    JESD22-B107

    Abstract: JEDEC JESD22-B117 JESD22-B101 JESD22-A113 JESD22-B117 JESD22A-113
    Text: 7/20/2005 RELIABILITY REPORT FOR DS2030AB & Y, Rev A Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com


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    DS2030AB JESD22-B101 JESD22-A113 60C/90% JESD22-B107 JEDEC JESD22-B117 JESD22-B101 JESD22-A113 JESD22-B117 JESD22A-113 PDF

    FP4527

    Abstract: PHYSICAL DIMENSIONS JESD22-B100 JESD22-B117 fr 0204 JEDEC JESD22-B117 j-std-020 JESD22-B100 JSTD-020 catalyst tester FP452
    Text: 01/31/2003 RELIABILITY REPORT FOR DS21Q48 Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com


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    DS21Q48 FA30006154) FP4527 PHYSICAL DIMENSIONS JESD22-B100 JESD22-B117 fr 0204 JEDEC JESD22-B117 j-std-020 JESD22-B100 JSTD-020 catalyst tester FP452 PDF

    J-STD-020

    Abstract: Ablebond 71
    Text: 07/15/2003 RELIABILITY REPORT FOR DS3144, Rev A1 Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com


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    DS3144, J-STD-020 Ablebond 71 PDF

    JESD22-B107

    Abstract: JESD22-B101 JESD22-A113 JESD22-B100 JEDEC JESD22-B117 PHYSICAL DIMENSIONS JESD22-B100 JESD-22-A113
    Text: 7/22/2005 RELIABILITY REPORT FOR DS2050W, Rev A Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com


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    DS2050W, JESD22-B101 JESD22-A113 60C/90% JESD22-B107 JESD22-B101 JESD22-A113 JESD22-B100 JEDEC JESD22-B117 PHYSICAL DIMENSIONS JESD22-B100 JESD-22-A113 PDF

    JESD22-B101

    Abstract: ML2020R
    Text: 10/2/2006 RELIABILITY REPORT FOR DS3070W, Rev A, RoHS Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com


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    DS3070W, JESD22-A113 60C/90% JESD22-B101 ML2020R PDF

    Jesd22-A113

    Abstract: JEDEC JESD22-B117 PHYSICAL DIMENSIONS JESD22-B100 JESD22-B107
    Text: 7/20/2005 RELIABILITY REPORT FOR DS2045AB & Y, Rev A Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com


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    DS2045AB JESD22-B101 JESD22-A113 60C/90% Jesd22-A113 JEDEC JESD22-B117 PHYSICAL DIMENSIONS JESD22-B100 JESD22-B107 PDF

    NITTO HC-100-XJAA-M

    Abstract: CRM1525D HC-100XJAA-M
    Text: 12/17/2003 RELIABILITY REPORT FOR DS3148, Rev A1 Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com


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    DS3148, 30C/60% NITTO HC-100-XJAA-M CRM1525D HC-100XJAA-M PDF

    JESD22-B117

    Abstract: No abstract text available
    Text: 10/2/2006 RELIABILITY REPORT FOR DS3065W, Rev A, RoHS Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com


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    DS3065W, JESD22-A113 60C/90% JESD22-B117 PDF

    Nitto GE 100

    Abstract: GE-100-LFC nitto GE100LFC NITTO GE-100 MIL-STD-883-2012 ML614R J-STD-020 nitto GE ds12r885-5
    Text: 12/2/2005 RELIABILITY REPORT FOR DS12R887, Rev A2-R0A Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Don Lipps Staff Reliability Engineer Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : don.lipps@dalsemi.com


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    DS12R887, Nitto GE 100 GE-100-LFC nitto GE100LFC NITTO GE-100 MIL-STD-883-2012 ML614R J-STD-020 nitto GE ds12r885-5 PDF

    JESD22-B101

    Abstract: No abstract text available
    Text: 10/2/2006 RELIABILITY REPORT FOR DS2070W, Rev A, RoHS Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com


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    DS2070W, JESD22-A113 60C/90% JESD22-B101 PDF

    JESD22-B117

    Abstract: F-0203-04
    Text: Integrated Device Technology, Inc. 2975 Stender Way, Santa Clara, CA - 95054 PRODUCT/PROCESS CHANGE NOTICE PCN PCN #: F-0203-04 DATE: 2/27/2002 Product Affected: Plastic Ball Grid Array (PBGA) BG121 Date Effective: Contact: Title: Phone #: Fax #: E-mail:


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    F-0203-04 BG121 168Hrs, EIA/JESD22-A110 MIL-STD-883 EIA/JESD22-A102 J-STD-20 J-STD-35 JESD22-B117 PDF

    JESD22-B101

    Abstract: 211624 DS1310
    Text: 10/2/2006 RELIABILITY REPORT FOR DS3045W, Rev A, RoHS Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com


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    DS3045W, JESD22-A113 60C/90% JESD22-B101 211624 DS1310 PDF

    NITTO HC-100-XJAA-M

    Abstract: CRM1525D HC100-XJ HC100 HC-100-XJAA-M HC100-XJAA JEDEC JESD22-B117
    Text: 12/17/2003 RELIABILITY REPORT FOR DS31412, Rev A1 Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com


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    DS31412, 30C/60% NITTO HC-100-XJAA-M CRM1525D HC100-XJ HC100 HC-100-XJAA-M HC100-XJAA JEDEC JESD22-B117 PDF

    Untitled

    Abstract: No abstract text available
    Text: 03/04/04 RELIABILITY REPORT FOR DS1254Y w/DS3800 Cap, Fastech, Single Sided PCB Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Don Lipps Staff Reliability Engineer Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292


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    DS1254Y w/DS3800 30C/60% JESD22-B101 60C/90% PDF