JESD22
Abstract: No abstract text available
Text: RELIABILITY REPORT Date: 7/27/11 QUALITY ENG : PART NUMBER MICREL QA/REL KSZ8842PMBL AM QUAL VEHICLES PACKAGE TYPE : ASSEMBLY FAB PROCESS KSZ8842PMBL AM 100 LFBGA OSE TSMC 0.15 um KSZ8842PMQL AM 128L PQFP ASE TSMC 0.15 um AEC Q100 GROUP A QUALIFICATION RESULTS:
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KSZ8842PMBL
KSZ8842PMQL
JESD22
121C/100%
-50C/
KSZ8842PMBL
GFS0028
JESD22
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Untitled
Abstract: No abstract text available
Text: QUALIFICATION REPORT Date: 3/28/12 QUALITY ENG : PART NUMBER MICREL QA/REL KSZ8864RMN/RMNI/RMNU Qual vehicles PACKAGE TYPE : ASSEMBLY FAB LOC PROCESS 64L MLF QFN TICP DONGBU, TAIWAN 0.13um KSZ8864RMNU QUALIFICATION RESULTS: Test # Reference Test Conditions
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KSZ8864RMN/RMNI/RMNU
KSZ8864RMNU
JESD22
AEC-Q100008
AEC-Q100002
AEC-Q100001
Mil-STD883
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Untitled
Abstract: No abstract text available
Text: QUALIFICATION REPORT Update Date: 9/23/11 QUALITY ENG : PART NUMBER MICREL QA/REL KSZ885116MLL/MLLI/MLLU Qual vehicles PACKAGE TYPE : ASSEMBLY FAB LOC PROCESS 48L LQFP TICP, Taiwan DONGBU 0.18um KSZ8851-16MLLU MOLD COMPOUND CEL9200HF QUALIFICATION RESULTS:
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KSZ885116MLL/MLLI/MLLU
KSZ8851-16MLLU
CEL9200HF
JESD22
AEC-Q100008
AEC-Q100002
Mil-STD883
M111W471MEA
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delco
Abstract: Mil-Std-202F 215j JIS-C-6429 28F0818 28F0448-6T0 Q-1000-211 28c0236 0bw 10 28R3149-000 28F0303-0T0 laird 6429
Text: AUTOMOTIVE RELIABILITY TESTING www.lairdtech.com SIP-BRO-15-0208 Part Number Date Test Performed Test Source 25D0889-010 06/16/1999 1,3,5,6,7,14 Trace Laboratories 25S0670-000 06/16/1999 1,3,5,6,7,14 Trace Laboratories 28B0375-400 06/16/1999 1,3,5,6,7,14
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SIP-BRO-15-0208
25D0889-010
25S0670-000
28B0375-400
28B1020-100
28C0236-0BW
28F0121-0S0
delco
Mil-Std-202F 215j
JIS-C-6429
28F0818
28F0448-6T0
Q-1000-211
28c0236 0bw 10
28R3149-000
28F0303-0T0
laird 6429
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Untitled
Abstract: No abstract text available
Text: RELIABILITY MONITOR PROGRAM FOURTH QUARTER 2003 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 02/26/04 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those
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JESD22
MIL-STD-883,
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JESD22 B100
Abstract: No abstract text available
Text: RELIABILITY MONITOR PROGRAM FIRST QUARTER 2004 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 04/20/04 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those
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JESD22
MIL-STD-883,
JESD22 B100
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Untitled
Abstract: No abstract text available
Text: RELIABILITY MONITOR PROGRAM FIRST QUARTER 2000 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 04/20/00 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those
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JESD22
MIL-STD-883,
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Untitled
Abstract: No abstract text available
Text: RELIABILITY MONITOR PROGRAM FIRST QUARTER 1999 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 4/20/99 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those
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JESD22
MIL-STD-883,
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Untitled
Abstract: No abstract text available
Text: RELIABILITY MONITOR PROGRAM SECOND QUARTER 2000 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 07/20/00 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those
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JESD22
MIL-STD-883,
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reliability report 2012
Abstract: No abstract text available
Text: RELIABILITY MONITOR PROGRAM SECOND QUARTER 1999 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 7/20/99 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those
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JESD22
MIL-STD-883,
reliability report 2012
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Untitled
Abstract: No abstract text available
Text: RELIABILITY MONITOR PROGRAM FOURTH QUARTER 1999 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 01/18/00 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those
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JESD22
MIL-STD-883,
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quality acceptance plan
Abstract: No abstract text available
Text: RELIABILITY MONITOR PROGRAM THIRD QUARTER 2000 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 010/20/00 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those
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JESD22
MIL-STD-883,
quality acceptance plan
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reliability testing report
Abstract: No abstract text available
Text: RELIABILITY MONITOR PROGRAM THIRD QUARTER 2001 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 4/30/01 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those
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JESD22
MIL-STD-883,
reliability testing report
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Untitled
Abstract: No abstract text available
Text: RELIABILITY MONITOR PROGRAM FOURTH QUARTER 2001 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 2/20/02 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those
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JESD22
MIL-STD-883,
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quality acceptance plan
Abstract: in-coming quality control TR-TSY-000357
Text: RELIABILITY MONITOR PROGRAM FOURTH QUARTER 1998 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 1/29/98 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those
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JESD22
MIL-STD-883,
quality acceptance plan
in-coming quality control
TR-TSY-000357
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Untitled
Abstract: No abstract text available
Text: RELIABILITY MONITOR PROGRAM SECOND QUARTER 2000 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 07/20/00 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those
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JESD22
MIL-STD-883,
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Untitled
Abstract: No abstract text available
Text: RELIABILITY MONITOR PROGRAM THIRD QUARTER 2000 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 010/20/00 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those
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JESD22
MIL-STD-883,
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Untitled
Abstract: No abstract text available
Text: RELIABILITY MONITOR PROGRAM SECOND QUARTER 2002 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 8/17/02 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those
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JESD22
MIL-STD-883,
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Untitled
Abstract: No abstract text available
Text: RELIABILITY MONITOR PROGRAM FIRST QUARTER 1999 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 4/20/99 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those
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JESD22
MIL-STD-883,
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Untitled
Abstract: No abstract text available
Text: RELIABILITY MONITOR PROGRAM THIRD QUARTER 2001 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 10/20/01 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those
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JESD22
MIL-STD-883,
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Untitled
Abstract: No abstract text available
Text: RELIABILITY MONITOR PROGRAM FOURTH QUARTER 2000 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 1/23/01 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those
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JESD22
MIL-STD-883,
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Untitled
Abstract: No abstract text available
Text: RELIABILITY MONITOR PROGRAM THIRD QUARTER 1999 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 10/20/99 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those
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JESD22
MIL-STD-883,
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Untitled
Abstract: No abstract text available
Text: RELIABILITY MONITOR PROGRAM SECOND QUARTER 2003 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 06/18/03 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those
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JESD22
MIL-STD-883,
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Untitled
Abstract: No abstract text available
Text: RELIABILITY MONITOR PROGRAM THIRD QUARTER 2001 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 10/20/01 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those
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JESD22
MIL-STD-883,
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