INCOMING leadframe INSPECTION procedure
Abstract: mttf water distribution INCOMING Plate INSPECTION
Text: May 1997 Quality Assurance 2-1 Ericsson Components AB is the main company within the components business area in the Ericsson Coporation. An overall quality policy, common to all business areas, is defined by the Ericsson Corporate Executive Committee. Pre-specification
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MOA2
Abstract: SOT500AA1 transponder chip philips pllmc SNW-FQ-611 "Chip card module" PLLMC-05 INCOMING MATERIAL INSPECTION procedure contactless Functional Specification Contactless Chip Card Module Specification
Text: CHIP CARD MODULES Contactless Chip Card Module Specification MOA2 Product Specification Revision 3.0 PUBLIC Philips Semiconductors January 2004 28730 Philips Semiconductors Product Specification Revision 3.0 Contactless Chip Card Module Specification – MOA2
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SCA74
MOA2
SOT500AA1
transponder chip philips
pllmc
SNW-FQ-611
"Chip card module"
PLLMC-05
INCOMING MATERIAL INSPECTION procedure
contactless Functional Specification
Contactless Chip Card Module Specification
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SMD CODE 9Z
Abstract: 80C251 PLCC44 J-STD-20 SMD CODE 9T Smd parts identification 14x14x1.4mm PLCC18 Temic PART DATE CODE moisture sensitive handling and packaging temic ulc products
Text: Information about SMD Plastic Packages Prepared by: Elisabeth Lamarti Pierre Houzé Quality Department SMD Packaging Contents 1. INTRODUCTION -2 2. GENERALITIES -2
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300mm
SMD CODE 9Z
80C251 PLCC44
J-STD-20
SMD CODE 9T
Smd parts identification
14x14x1.4mm
PLCC18
Temic PART DATE CODE
moisture sensitive handling and packaging
temic ulc products
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X3132
Abstract: l200c data hypervision visionary 2000 diode ST2D 77 fxs 100 10 FXS-100 Instrument Design Engineering Associates l200c MS170 XC2000
Text: November 21, 1997 Version 2.0 Quality Assurance and Reliability 11* Quality Assurance Program All aspects of the Quality Assurance Program at Xilinx have been designed to eliminate the root cause of defects, rather than to try to remove them by inspection. A quality system
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ISO9002.
ISO9002
19age
X3132
l200c data
hypervision visionary 2000
diode ST2D 77
fxs 100 10
FXS-100
Instrument Design Engineering Associates
l200c
MS170
XC2000
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MS170
Abstract: x3132 hypervision visionary 2000 XRF-5500 FXS-100 fein fxs MS-170 JMS-6401F X41481
Text: Quality Assurance and Reliability R May 14, 1999 Version 2.2 12* Quality Assurance Program All aspects of the Quality Assurance Program at Xilinx have been designed to eliminate the root cause of defects, rather than to try to remove them by inspection. A quality system
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ISO9001.
ISO9001
MS170
x3132
hypervision visionary 2000
XRF-5500
FXS-100
fein fxs
MS-170
JMS-6401F
X41481
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FEIN FOCUS FXS-100
Abstract: curve tracer equipment XCS17 hypervision visionary 2000 XRF-5500 diode ST2D 77 JMS-6401F JEOL SEM mil-std-883* lead fatigue MS-170
Text: Quality Assurance and Reliability R February 1, 2000 v3.0 9* Quality Assurance Program All aspects of the Quality Assurance Program at Xilinx have been designed to eliminate the root cause of defects by prevention, rather than to try to remove defects through
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ISO9001.
FEIN FOCUS FXS-100
curve tracer equipment
XCS17
hypervision visionary 2000
XRF-5500
diode ST2D 77
JMS-6401F
JEOL SEM
mil-std-883* lead fatigue
MS-170
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IPC-SM-786A
Abstract: GUIDELINES FOR HANDLING MOISTURE SENSITIVE DEVICE ic packages A113 PMC-951041 baxter iv bag GUIDELINES FOR HANDLING MOISTURE SENSITIVE DEVICES
Text: APPLICATION NOTE PMC-951041 ISSUE 3 HANDLING MOISTURE SENSITIVE IC PACKAGES HANDLING OF MOISTURE SENSITIVE PLASTIC PACKAGES APPLICATION NOTE ISSUE 3: SEPTEMBER 1997 PMC-Sierra, Inc. 105 - 8555 Baxter Place Burnaby, BC Canada V5A 4V7 604 .415.6000 APPLICATION NOTE
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PMC-951041
IPC-SM-786A
GUIDELINES FOR HANDLING MOISTURE SENSITIVE DEVICE
ic packages
A113
PMC-951041
baxter iv bag
GUIDELINES FOR HANDLING MOISTURE SENSITIVE DEVICES
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SMD transistor MARK DAR
Abstract: in-process quality inspections Pharmaceuticals Product TRANSISTOR SMD MARKING CODE NM MP 1008 es semiconductors cross index Microwave GaAs FET catalogue gate turn off thyristors TRANSISTOR SMD MARKING CODE 8D SMD Schottky Dioden transistor pnp a110
Text: Einzelhalbleiter Small-Signal Semiconductors Qualitätsmanagement, Qualität und Zuverlässigkeit Quality Management, Quality and Reliability Themenschrift 07.96 Special-Subject Brochure 07.96 Vorwort Preface Der Geschäftszweig Einzelhalbleiter im Unternehmensbereich Halbleiter entwickelt, fertigt und vertreibt ein breites
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PPAP level submission requirement table
Abstract: PPAP MANUAL for automotive industry foundry metals quality MANUALS result of 200 prize bond INCOMING MATERIAL INSPECTION checklist, PCB TSMC 90nm sram SMD a006 ISO 9001 Sony foundry INCOMING MATERIAL INSPECTION procedure INCOMING RAW MATERIAL INSPECTION procedure
Text: Contents Contents i Chapter 1 Quality Management 1.1 Quality Policy 1.2 Quality Organization 1.3 ISO 9001 Year 2000 Revision 1.4 Quality Systems 1.4.1 Process Map 1.4.2 Advanced Product Quality Planning 1.4.3 Quality Assurance in the Project Approval Stage
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DC04 display
Abstract: how to test POWER MOSFET with digital multimeter tektronix 576 curve tracer VISHAY VT 300 WEIGHT INDICATOR TSMC 0.35Um FLUKE 79 manual THERMAL ELECTRIC COOLER hp 4274A 532 nm laser diode PHOTO TRANSISTOR ppt
Text: Quality And Reliability Report 2005 DC04-0001 Page 1 of 79
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DC04-0001
DC04 display
how to test POWER MOSFET with digital multimeter
tektronix 576 curve tracer
VISHAY VT 300 WEIGHT INDICATOR
TSMC 0.35Um
FLUKE 79 manual
THERMAL ELECTRIC COOLER
hp 4274A
532 nm laser diode
PHOTO TRANSISTOR ppt
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tsmc 0.35um 2p4m cmos
Abstract: K2411 specification of scr 2p4m teradyne j750 tester manual 2p4m equivalent Z0853006PSC SCR 2P4M Z84C1510FEC DC04 display Z0853006VSC
Text: Quality And Reliability Report 2004 Period Covered: 2003
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DC04-0001
tsmc 0.35um 2p4m cmos
K2411
specification of scr 2p4m
teradyne j750 tester manual
2p4m equivalent
Z0853006PSC
SCR 2P4M
Z84C1510FEC
DC04 display
Z0853006VSC
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Untitled
Abstract: No abstract text available
Text: PGA308-DIE www.ti.com SBOS624 – JUNE 2012 SINGLE-SUPPLY, AUTO-ZERO SENSOR AMPLIFIER WITH PROGRAMMABLE GAIN AND OFFSET Check for Samples: PGA308-DIE FEATURES 1 • • • • • • • • Digital Calibration for Bridge Sensors Offset Select: Coarse and Fine
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PGA308-DIE
SBOS624
PGA308
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Z0840004PSC
Abstract: Z0853006PSC sumitomo crm1033b Sumitomo CRM 1033B Z84C008 z0840004 Z0847004PSC Z0843006PSC Z0843004PSC Z84C3006PEC
Text: ZiLOG, Inc. 2H - Year 2002 Quality And Reliability Report ZAC03-0004 ZiLOG 2002Quality and Reliability Report Chapter Title and Subsection TABLE OF CONTENTS Chapter Title and Subsection Chapter 1 - ZiLOG’s Quality Culture Reliability And Quality Assurance Policy Statement………………………………. 1 - 1
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ZAC03-0004
2002Quality
Z0840004PSC
Z0853006PSC
sumitomo crm1033b
Sumitomo CRM 1033B
Z84C008
z0840004
Z0847004PSC
Z0843006PSC
Z0843004PSC
Z84C3006PEC
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TLV4112-DIE
Abstract: No abstract text available
Text: TLV4112-DIE www.ti.com SGLS411 – NOVEMBER 2012 HIGH-OUTPUT-DRIVE OPERATIONAL AMPLIFIER WITH SHUTDOWN FEATURES 1 • • • High Output Drive Rail-To-Rail Output Universal Operational Amplifier EVM DESCRIPTION The TLV4112 single-supply operational amplifier provides output currents in excess of 300 mA at 5 V. This
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TLV4112-DIE
SGLS411
TLV4112
TLV4112
TLV4112TDA1
TLV4112TDA2
TLV4112-DIE
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REF3140-DIE
Abstract: No abstract text available
Text: REF3140-DIE www.ti.com SBVS205 – JUNE 2012 SERIES VOLTAGE REFERENCE Check for Samples: REF3140-DIE FEATURES 1 • • • • APPLICATIONS Low Dropout High Output Current High Accuracy Low IQ • • • • Portable, Battery Powered Equipment Data Acquisition Systems
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REF3140-DIE
SBVS205
REF3140
REF3140â
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Untitled
Abstract: No abstract text available
Text: OPA656-DIE www.ti.com SBOS596 – MARCH 2012 WIDEBAND, UNITY-GAIN STABLE, FET-INPUT OPERATIONAL AMPLIFIER Check for Samples: OPA656-DIE FEATURES 1 • • • • • • APPLICATIONS Unity-Gain Bandwidth Low Input Bias Current Low Offset and Drift Low DL
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OPA656-DIE
SBOS596
OPA656
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Untitled
Abstract: No abstract text available
Text: OPA140A-DIE www.ti.com SBOS610B – MARCH 2012 – REVISED MARCH 2012 HIGH-PRECISION, LOW-NOISE, RAIL-TO-RAIL OUTPUT, 11-MHZ JFET OPERATIONAL AMPLIFIER Check for Samples: OPA140A-DIE FEATURES 1 • • • • • • • • • • • Very Low Offset Drift
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OPA140A-DIE
SBOS610B
11-MHZ
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ti 9815
Abstract: No abstract text available
Text: REF3325-DIE www.ti.com SBOS621 – MAY 2012 3.9- A, SC70-3, 30-ppm/°C DRIFT VOLTAGE REFERENCE Check for Samples: REF3325-DIE FEATURES 1 • • • • APPLICATIONS Low Supply Current High Output Current Low Temperature Drift High Initial Accuracy • •
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REF3325-DIE
SBOS621
SC70-3,
30-ppm/
REF3325
REF3325
REF3325TDD1
REF3325TDD2
ti 9815
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THS3001-DIE
Abstract: No abstract text available
Text: THS3001-DIE www.ti.com SLOS812 – AUGUST 2012 420-MHz HIGH-SPEED CURRENT-FEEDBACK AMPLIFIER Check for Samples: THS3001-DIE FEATURES 1 • • • • • • High Speed: – 40-ns Settling Time 0.1% High Output Drive Excellent Video Performance Low Input Offset Voltage
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THS3001-DIE
SLOS812
420-MHz
40-ns
THS3001
THS3001-DIE
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MC1558-DIE
Abstract: SLOS847
Text: MC1558-DIE www.ti.com SLOS847 – APRIL 2013 DUAL GENERAL-PURPOSE OPERATIONAL AMPLIFIER Check for Samples: MC1558-DIE FEATURES 1 • • Short-Circuit Protection Wide Common-Mode and Differential Voltage Ranges • • • No Frequency Compensation Required
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MC1558-DIE
SLOS847
MC1558-DIE
SLOS847
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REF3140-DIE
Abstract: No abstract text available
Text: REF3140-DIE www.ti.com SBVS205 – JUNE 2012 SERIES VOLTAGE REFERENCE Check for Samples: REF3140-DIE FEATURES 1 • • • • APPLICATIONS Low Dropout High Output Current High Accuracy Low IQ • • • • Portable, Battery Powered Equipment Data Acquisition Systems
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REF3140-DIE
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REF3140
REF3140-DIE
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Untitled
Abstract: No abstract text available
Text: REF3325-DIE www.ti.com SBOS621B – MAY 2012 – REVISED JULY 2012 DRIFT VOLTAGE REFERENCE Check for Samples: REF3325-DIE FEATURES 1 • • • • APPLICATIONS Low Supply Current High Output Current Low Temperature Drift High Initial Accuracy • • •
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REF3325-DIE
SBOS621B
REF3325
REF3325
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5962R99620
Abstract: TL1431-DIE
Text: TL1431-DIE www.ti.com SLVSC17 – JUNE 2013 RAD-TOLERANT SPACE GRADE DIE, PRECISION PROGRAMMABLE REFERENCE Check for Samples: TL1431-DIE FEATURES 1 • • • QMLV Qualified to 100k Rad RHA, SMD 5962R99620 Initial Voltage Tolerance 0.2-Ω Typical Output Impedance
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TL1431-DIE
SLVSC17
5962R99620
TL1431-DIE
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INCOMING RAW MATERIAL INSPECTION format
Abstract: signetics handbook
Text: Philips Sem lconductors-Slgnetics FA ST TTL Logic Series Quality and reliability SUMMARY The Signetics Company was founded in September, 1961 by a group of scientists and engineers who were among the pioneers in the development of integrated circuits. Signetics, acquired by Philips in 1975, was
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100th
INCOMING RAW MATERIAL INSPECTION format
signetics handbook
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