Untitled
Abstract: No abstract text available
Text: HXNAND00 Quad 2 Input NAND Features ▪ Radiation Hardened Total Dose: 300krad Si ▪ Supply voltage: 3.3V ▪ Quiescent current: 500 A ▪ Max Prop Delay 6.6nS ▪ Max Rise/Fall Time 4.3nS ▪ Input capacitance 11.5pF max PRODUCTION - Release - 21 Jul 2014 02:49:45 MST - Printed on 21 Jul 2014
|
Original
|
PDF
|
HXNAND00
300krad
HXNAND00
ADS-14200
|
5962-07A07
Abstract: HXNAND00 NAND Qualification Reliability 2Y smd 74LVC00A MIL-PRF38535 Honeywell Capacitors
Text: HXNAND00 Quad 2 Input NAND Features • ■ ■ ■ ■ ■ ■ Radiation Hardened 300krad Si Supply voltage: 3.3V Quiescent current: 500µA Max Prop Delay 6.6nS in 50pF/500Ω load Max Rise/Fall Time 4.3nS in 50pF/500Ω load Input capacitance 11.5pF max
|
Original
|
PDF
|
HXNAND00
300krad
50pF/500
HXNAND00
74LVC00A.
N59-0507-000-000
5962-07A07
NAND Qualification Reliability
2Y smd
74LVC00A
MIL-PRF38535
Honeywell Capacitors
|
5962-07A07
Abstract: HXNAND00
Text: HXNAND00 Quad 2 Input NAND Features • ■ ■ ■ ■ ■ ■ Radiation Hardened 300krad Si Supply voltage: 3.3V Quiescent current: 500µA Max Prop Delay 6.6nS in 50pF/500Ω load Max Rise/Fall Time 4.3nS in 50pF/500Ω load Input capacitance 11.5pF max
|
Original
|
PDF
|
HXNAND00
300krad
50pF/500
74LVC00A.
N59-0507-000-000
5962-07A07
|