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    EP3C16F256I7N Price and Stock

    Intel Corporation EP3C16F256I7N

    IC FPGA 168 I/O 256FBGA
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    DigiKey EP3C16F256I7N Tray 106 1
    • 1 $119.85
    • 10 $119.85
    • 100 $116.6408
    • 1000 $116.6408
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    Altera Corporation EP3C16F256I7N

    FPGA - Field Programmable Gate Array
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    Mouser Electronics EP3C16F256I7N 90
    • 1 $119.86
    • 10 $116.66
    • 100 $116.66
    • 1000 $116.66
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    Win Source Electronics EP3C16F256I7N 2,000
    • 1 $69.566
    • 10 $56.522
    • 100 $56.522
    • 1000 $56.522
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    EP3C16F256I7N Datasheets (2)

    Part ECAD Model Manufacturer Description Curated Datasheet Type PDF
    EP3C16F256I7N Altera Embedded - FPGAs (Field Programmable Gate Array), Integrated Circuits (ICs), IC FPGA 168 I/O 256FBGA Original PDF
    EP3C16F256I7N Altera Cyclone™ III FPGAs: An Unprecedented Combination of Power, Functionality, and Cost; 256 pin FBGA; -40 to 100°C Original PDF

    EP3C16F256I7N Datasheets Context Search

    Catalog Datasheet MFG & Type PDF Document Tags

    PCN0904

    Abstract: EP3C16Q240C8N EP3C10E144C8N EP3C16F484C6 ep3C40F484C8N EP3C40F780I7N ep3c16 EP3C25F324C8N EP3C25E144I7N EP3C120F484I7N
    Text: Revision: 1.2.0 PROCESS CHANGE NOTIFICATION PCN0904 Cyclone III Family Process Shrink from 65-nm to 60-nm and Package Bill of Material Change Change Description This is an update to PCN0904, please see revision history table for information specific to this


    Original     		PDF PCN0904 65-nm 60-nm PCN0904, EU-REP3C16U484I7N EP3C10E144C7 EP3C10E144C7N EP3C10E144C8 PCN0904 EP3C16Q240C8N EP3C10E144C8N EP3C16F484C6 ep3C40F484C8N EP3C40F780I7N ep3c16 EP3C25F324C8N EP3C25E144I7N EP3C120F484I7N

    CYCLONE 3 ep3c25f324* FPGA

    Abstract: FBGA-484 datasheet EP3C16F484I7N EPM570T144I5 EP3C10E144I7N EP3C25F324I7N EPM1270F256I5 EPM1270T144I5 EP2C5Q208I8N EP3C120F780I7N
    Text: Technical Brief Extended Temperature Support for Cyclone II, Cyclone III, and MAX II Devices Introduction Semiconductor devices undergo at least two types of testing: device characterization and production testing. Device characterization is used to verify the performance of a semiconductor design and its physical implementation.


    Original     		PDF