DICING AND LASER GROOVING Search Results
DICING AND LASER GROOVING Result Highlights (5)
Part | ECAD Model | Manufacturer | Description | Download | Buy |
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TC4001BP |
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CMOS Logic IC, 2-Input/AND, DIP14 |
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74HC08D |
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CMOS Logic IC, 2-Input/AND, SOIC14 |
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TB67H481FTG |
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Stepping and Brushed Motor Driver /Bipolar Type / Vout(V)=50 / Iout(A)=3.0 / IN input type / VQFN32 |
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TC74HC08AP |
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CMOS Logic IC, Quad 2-Input/AND, DIP14 |
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7UL1G08NX |
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One-Gate Logic(L-MOS), 2-Input/AND, XSON6, -40 to 125 degC |
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DICING AND LASER GROOVING Datasheets Context Search
Catalog Datasheet | MFG & Type | Document Tags | |
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QB-PS-A01
Abstract: JDSU laser power supply JDSU QB-PS Q301 Q333-HD Q20x q202h umbilical Q201-HD
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498-JDSU 5378-JDSU QB-PS-A01 JDSU laser power supply JDSU QB-PS Q301 Q333-HD Q20x q202h umbilical Q201-HD | |
254 nm uv LED
Abstract: Chiller umbilical connector UV diode 250 nm r134a Q302 Q303-HD 532 nm laser diode umbilical Q3-04
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498-JDSU 5378-JDSU 254 nm uv LED Chiller umbilical connector UV diode 250 nm r134a Q302 Q303-HD 532 nm laser diode umbilical Q3-04 | |
Sharp Semiconductor Lasers
Abstract: AU4A transistor QB tensile-strength thermopile array BREAK FAILURE INDICATOR APPLICATIONS LIST relay failure analysis CRACK DETECTION PATTERNS gold wire bound failures due to ultrasonic cleaning 2n2222 micro electronics
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MIL-STD-883 SMA04033 Sharp Semiconductor Lasers AU4A transistor QB tensile-strength thermopile array BREAK FAILURE INDICATOR APPLICATIONS LIST relay failure analysis CRACK DETECTION PATTERNS gold wire bound failures due to ultrasonic cleaning 2n2222 micro electronics |