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ADT-USB-PR081203001C-1

Abstract: P200A "mini usb" P200A00 mini usb
Contextual Info: 1 2 3 4 5 6 7 8 9 A A B B C C D D E F Item 1 2 3 4 5 6 7 Name JRS6-04FS7N1 P100345 P200A00 X000001 SB00600 SB00400 Description USB AF PVC PE 7*0. 12 L=50 L=2 PE: 30*60*0. 04 PE: 260*200*0. 04 Mini USB A5 E RoHS compliant Rev. F Description Date Approved G

ADT-USB-PR081203001C

Abstract: P200A00 P200A mini usb
Contextual Info: 1 2 3 4 5 6 7 8 9 A A B B C C D D E F Item 1 2 3 4 5 6 7 Name JRS6-04FS7N1 P100345 P200A00 X000001 SB00600 SB00400 Description USB AF PVC PE 7*0. 12 L=50 L=2 PE: 30*60*0. 04 PE: 260*200*0. 04 Mini USB A5 E RoHS compliant Rev. F Description Date Approved G

BCT8373A

Contextual Info: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE

ATMEGA32U4

Abstract: 7766D atmega16 assembly IC ATMEGA16 power supply schematic ATmega16 IR remote control 7766E SP12 SP13 SP14 SP15
Contextual Info: Features • High Performance, Low Power AVR 8-Bit Microcontroller • Advanced RISC Architecture • • • • – 135 Powerful Instructions – Most Single Clock Cycle Execution – 32 x 8 General Purpose Working Registers – Fully Static Operation

BCT245

Abstract: BCT8245A F245 SN54BCT8245A SN74BCT8245A
Contextual Info: SN54BCT8245A, SN74BCT8245A SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS043E – MAY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE

V5050

Abstract: BCT244 F244 SN54BCT8244A SN74BCT8244A
Contextual Info: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042E – FEBRUARY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8244A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This

Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability

Contextual Info: SN54BCT8245A, SN74BCT8245A SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS043E – MAY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE

mitsubishi split ac

Abstract: 013A1
Contextual Info: t U de nd v e er lo pm en Preliminary Specifications REV.A Mitsubishi microcomputers Specifications in this manual are tentative and subject to change. M16C / 6NT Group SINGLE-CHIP 16-BIT CMOS MICROCOMPUTER Description Description The M16C/6NT group of single-chip microcomputers are built using the high-performance silicon gate

ATMEL 649v

Abstract: 6490V ATMEGA329 TWI avr adc
Contextual Info: Features • High Performance, Low Power Atmel AVR® 8-Bit Microcontroller • Advanced RISC Architecture • • • • • • • • – 130 Powerful Instructions – Most Single Clock Cycle Execution – 32 x 8 General Purpose Working Registers – Fully Static Operation

Contextual Info: SN54BCT8245A, SN74BCT8245A SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS043E – MAY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE

ATmega32H

Abstract: PV15100 PCIE10 atmel 718 ac chopper ATMEGA64HVE2
Contextual Info: Atmel ATmega32HVE2/ATmega64HVE2 8-bit AVR Microcontroller with Precise Analog Frontend for very Accurate Voltage and Current Measurement PRELIMINARY DATASHEET Features ● Single-package fully-integrated ● High precision analog frontend ● 17bit single-ended voltage-ADC

PFC 5kw

Abstract: principle block diagram 115v 400hz power schematic diagram 10kw bldc motor speed controller 1242 qfn32 P320 AVR AT90PWM81
Contextual Info: Features • High performance, low power Atmel AVR® 8-bit Microcontroller • Advanced RISC architecture • • • • – 131 powerful instructions - most single clock cycle execution – 32 x 8 general purpose working registers – Fully static operation

bct8240a

Contextual Info: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS SCBS067E – FEBRUARY 1990 – REVISED DECEMBER 1996 D D D D D description The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This

SS 1091 asn

Abstract: atmel sine wave pwm circuit atmega 128 atmel atmega 382 SM200 DSAQ00265166. ATMEGA USART programming example ATMEGA 326
Contextual Info: Features • • • • • • • • • • • High Performance, Low Power Atmel AVR® 8-Bit Microcontroller Advanced RISC Architecture – 130 Powerful Instructions – Most Single Clock Cycle Execution – 32 x 8 General Purpose Working Registers

mega32u4

Abstract: at90usb164 AT90USB324 Atmega32u4 SP10 SP11 SP12 SP13 SP14 SP15
Contextual Info: Features • High Performance, Low Power AVR 8-Bit Microcontroller • Advanced RISC Architecture • • • • – 135 Powerful Instructions – Most Single Clock Cycle Execution – 32 x 8 General Purpose Working Registers – Fully Static Operation

3290

Abstract: 3290PV rele 12V 10A RELE 12V 5 pines
Contextual Info: Features • High Performance, Low Power AVR 8-Bit Microcontroller • Advanced RISC Architecture • • • • • • • • – 130 Powerful Instructions – Most Single Clock Cycle Execution – 32 x 8 General Purpose Working Registers – Fully Static Operation

ATMEGA1280-16AU

Abstract: avr 2560 atmega1280 avr 328 pc 2561 2549K-AVR-01 PJ63 TQFP64 package
Contextual Info: Features • High Performance, Low Power AVR 8-Bit Microcontroller • Advanced RISC Architecture • • • • • • • • – 135 Powerful Instructions – Most Single Clock Cycle Execution – 32 x 8 General Purpose Working Registers – Fully Static Operation

ATMEGA324PA-PU

Abstract: DRQFN 168T 1610t VATMEGA324PA 25810 oc 192 modulator atmel 1010
Contextual Info: Features • High-performance, Low-power AVR 8-bit Microcontroller • Advanced RISC Architecture • • • • • – 131 Powerful Instructions – Most Single-clock Cycle Execution – 32 x 8 General Purpose Working Registers – Fully Static Operation

mega169

Abstract: atmega169v-8ai
Contextual Info: Features • High Performance, Low Power AVR 8-Bit Microcontroller • Advanced RISC Architecture • • • • • • • • – 130 Powerful Instructions – Most Single Clock Cycle Execution – 32 x 8 General Purpose Working Registers – Fully Static Operation

atmega169pv-8au

Abstract: avr adc
Contextual Info: Features • High Performance, Low Power AVR 8-Bit Microcontroller • Advanced RISC Architecture • • • • • • • • – 130 Powerful Instructions – Most Single Clock Cycle Execution – 32 x 8 General Purpose Working Registers – Fully Static Operation

0262F8

Abstract: marking TA1S INV04 p67 marking to-252
Contextual Info: To our customers, Old Company Name in Catalogs and Other Documents On April 1st, 2010, NEC Electronics Corporation merged with Renesas Technology Corporation, and Renesas Electronics Corporation took over all the business of both companies. Therefore, although the old company name remains in this document, it is a valid

DIODE marking CK 6CA

Abstract: DIODE marking 7BA SG 6CA 6ca DIODE code 20c 7ba Diode HP5 637 409 SG 5BA MARKING CO5 sg 7ba ai cm1 100 1e8
Contextual Info: To all our customers Regarding the change of names mentioned in the document, such as Mitsubishi Electric and Mitsubishi XX, to Renesas Technology Corp. The semiconductor operations of Hitachi and Mitsubishi Electric were transferred to Renesas Technology Corporation on April 1st 2003. These operations include microcomputer, logic, analog

SN74BCT373

Abstract: SN74BCT8373 SN74F373
Contextual Info: SN74BCT8373 SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES SCBS471 – JUNE 1990 – REVISED JUNE 1994 • • • • • • • • Member of the Texas Instruments SCOPE  Family of Testability Products Octal Test-Integrated Circuit Functionally Equivalent to SN74F373 and