TC9802 Search Results
TC9802 Datasheets Context Search
Catalog Datasheet | Type | Document Tags | |
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TC9800Contextual Info: 9. Reliability Data TC9800/01, TC9802/03 Intrinsic fa ilu re rate estim atio n from life test results N u m b e r o f sam ples (pcs) E q u iv a le n t d evice hours @ 6 0 °C Ea = 0.8eV 400 N u m b er o f defects (pcs) 1 57.0 x 106 Failu re ra te* 60°C (Fit) |
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TC9800/01, TC9802/03) 105Pa TC9800 | |
tc9800
Abstract: P300
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OCR Scan |
TC9800 TC9802 DIP-20-P-300A DIP-24-P-300 20pcs 16pcs 300-mil SOL-20-P-300 40pcs P300 | |
TC9800
Abstract: TC9802P TC9802
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OCR Scan |
TC9802P. TC9802FW TC9800. TC9802P, TC9800 TC9802P TC9802 | |
TC9800
Abstract: tc9802
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DIP20-P-300A TC9800/01P, TC9802/03P, TC9806/07P, TC9808/09P 20pin DIP24-P-300) TC9804/05P 24pin SOL20-P-300) TC9800 tc9802 | |
tc9800Contextual Info: 3. N o t e s o n D e s i g n i n g a n d H a n d l in g C ir c u it s 3.1 Electrostatic D ischarge CMOS ICs have a very thin gate insulation oxide film. W hen a high voltage is applied to this gate electrode input of CMOS IC , the oxide film directly under the gate som etimes |
OCR Scan |
TC9800 200pF, | |
tc9800
Abstract: CP1128 TC9806 TC9802
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TC9800/01 TC9802/03 TC9804/0S TC9806/07 TC9808/09 tc9800 CP1128 TC9806 TC9802 | |
HD637B01VOP
Abstract: HD63701VOP HD63705VOP hd63701xop HD637A01VOP HD64F3048F16 MB8516 HD637B01YOP HD63701YOP lh57257
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Original |
AF-9700 24DIP 28DIP HD637B01VOP HD63701VOP HD63705VOP hd63701xop HD637A01VOP HD64F3048F16 MB8516 HD637B01YOP HD63701YOP lh57257 | |
AM 16v8
Abstract: 22V8 tc9800 TC98
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TC9800 TC9800, TC9801, 9800P TC9800/01 TC9804/05 TC9802/03 TC9808/09 TC9806/07 AM 16v8 22V8 TC98 | |
TC9800
Abstract: TC9800P
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OCR Scan |
TC9800 TC9802P TC9803P TC9804P TC9805P TC9806P TC9807P TC9808P TC9800P |