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Texas Instruments SN74BCT8374ADW Specialty Function Logic Device w/Octal D-Typ Edge-Trig Flip-Flop
Distributors	Part	Package	Stock	Lead Time	Min Order Qty	Price	Buy
Mouser Electronics	SN74BCT8374ADW		68			1 $12.09 10 $9.5 100 $8.13 1000 $7.21 10000 $7.21	Buy Now
Texas Instruments SN74BCT8374ADWG4 BCT/FBT SERIES, 8-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, PDSO24
Distributors	Part	Package	Stock	Lead Time	Min Order Qty	Price	Buy
Quest Components ()	SN74BCT8374ADWG4		252			1 $15.4744 10 $15.4744 100 $12.0356 1000 $11.004 10000 $11.004	Buy Now
	SN74BCT8374ADWG4		120			1 $9.9 10 $9.9 100 $4.62 1000 $4.29 10000 $4.29	Buy Now
	SN74BCT8374ADWG4		35			1 $12 10 $6 100 $5.2 1000 $5.2 10000 $5.2	Buy Now
	SN74BCT8374ADWG4		12			1 $12 10 $8 100 $8 1000 $8 10000 $8	Buy Now

SN74BCT8374ADWG4 Datasheets (1)

Part	ECAD Model	Manufacturer	Description	Curated	Datasheet Type	PDF
SN74BCT8374ADWG4		Texas Instruments	Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops 24-SOIC 0 to 70		Original	PDF

SN74BCT8374ADWG4 Datasheets Context Search

Catalog Datasheet	Type	Document Tags	PDF
Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E − JUNE 1990 − REVISED JULY 1996 D Members of the Texas Instruments SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE TOP VIEW SCOPE  Family of Testability Products	Original	SN54BCT8374A, SN74BCT8374A SCBS045E BCT374	PDF
Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability	Original	SN54BCT8374A, SN74BCT8374A SCBS045E BCT374	PDF
F374 Abstract: SN54BCT8374A SN74BCT8374A SN74BCT8374 Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability	Original	SN54BCT8374A, SN74BCT8374A SCBS045E BCT8374A SN54BCT8374A F374 SN54BCT8374A SN74BCT8374A SN74BCT8374	PDF
Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E − JUNE 1990 − REVISED JULY 1996 D Members of the Texas Instruments SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE TOP VIEW SCOPE  Family of Testability Products	Original	SN54BCT8374A, SN74BCT8374A SCBS045E BCT374	PDF
Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E − JUNE 1990 − REVISED JULY 1996 D Members of the Texas Instruments SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE TOP VIEW SCOPE  Family of Testability Products	Original	SN54BCT8374A, SN74BCT8374A SCBS045E SN54BCT8374A BCT374	PDF
F374 Abstract: SN54BCT8374A SN74BCT8374A Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability	Original	SN54BCT8374A, SN74BCT8374A SCBS045E BCT8374A SN54BCT8374A F374 SN54BCT8374A SN74BCT8374A	PDF
Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability	Original	SN54BCT8374A, SN74BCT8374A SCBS045E BCT374	PDF
Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E − JUNE 1990 − REVISED JULY 1996 D Members of the Texas Instruments SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE TOP VIEW SCOPE  Family of Testability Products	Original	SN54BCT8374A, SN74BCT8374A SCBS045E BCT374	PDF
Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability	Original	SN54BCT8374A, SN74BCT8374A SCBS045E BCT374	PDF
F374 Abstract: SN54BCT8374A SN74BCT8374A SCBS045e SN74BCT8374 bct8374 Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability	Original	SN54BCT8374A, SN74BCT8374A SCBS045E BCT8374A SN54BCT8374A F374 SN54BCT8374A SN74BCT8374A SCBS045e SN74BCT8374 bct8374	PDF
Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability	Original	SN54BCT8374A, SN74BCT8374A SCBS045E BCT374	PDF