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    SCAN18373T Search Results

    SCAN18373T Result Highlights (2)

    Part ECAD Model Manufacturer Description Download Buy
    SCAN18373T/MXA Rochester Electronics LLC SCAN18373 - Transparent Latch with 3-State Outputs Visit Rochester Electronics LLC Buy
    SCAN18373TSSC-G Rochester Electronics LLC SCAN18373 - Transparent Latch with 3-State Outputs Visit Rochester Electronics LLC Buy
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    SCAN18373T Price and Stock

    onsemi SCAN18373TSSC

    TRANSPARENT LATCH 9-BIT 56-SSOP
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    Rochester Electronics LLC SCAN18373T-MXA

    SCAN18373 - TRANSPARENT LATCH WI
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    DigiKey SCAN18373T-MXA Bulk 1
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    Rochester Electronics LLC SCAN18373TSSC-G

    TRANSPARENT LATCH WITH 3 STATE O
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    DigiKey SCAN18373TSSC-G Bulk 9
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    Rochester Electronics SCAN18373TSSC-G 127 1
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    onsemi SCAN18373TSSCX

    Latch Transparent 3-ST 18-CH D-Type 56-Pin SSOP T/R - Tape and Reel (Alt: SCAN18373TSSCX)
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    Avnet Americas SCAN18373TSSCX Reel 1,000
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    Fairchild Semiconductor Corporation SCAN18373TSSC

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    Bristol Electronics SCAN18373TSSC 691
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    Quest Components SCAN18373TSSC 25
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    SCAN18373TSSC 12
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    Find more SCAN18373T price and stock on Findchips.com

    SCAN18373T Datasheets (10)

    Part ECAD Model Manufacturer Description Curated Datasheet Type PDF
    SCAN18373T Fairchild Semiconductor Transparent Latch with 3-STATE Outputs Original PDF
    SCAN18373T National Semiconductor Serially Controlled Access Network Transparent Latch with TRI-STATE Outputs Original PDF
    SCAN18373T National Semiconductor SCAN-IEEE 1149.1 (JTAG COMPLIANT) Original PDF
    SCAN18373T National Semiconductor Transparent Latch with TRI-STATE Outputs Original PDF
    SCAN18373TF National Semiconductor Transparent Latch with TRI-STATE Outputs Original PDF
    SCAN18373TMDA National Semiconductor Transparent Latch with TRI-STATE Outputs Original PDF
    SCAN18373TSSC Fairchild Semiconductor Transparent Latch with 3-STATE Outputs Original PDF
    SCAN18373TSSC_NL Fairchild Semiconductor Transparent Latch with 3-STATE Outputs Original PDF
    SCAN18373TSSCX Fairchild Semiconductor Transparent Latch with 3-STATE Outputs Original PDF
    SCAN18373TW National Semiconductor Transparent Latch with TRI-STATE Outputs Original PDF

    SCAN18373T Datasheets Context Search

    Catalog Datasheet MFG & Type PDF Document Tags

    Untitled

    Abstract: No abstract text available
    Text: OBSOLETE SCAN18373T www.ti.com SNLS036B – SEPTEMBER 1998 – REVISED APRIL 2013 SCAN18373T Transparent Latch with Tri-State Outputs Check for Samples: SCAN18373T FEATURES DESCRIPTION • • • The SCAN18373T is a high speed, low-power transparent latch featuring separate data inputs


    Original     		PDF SCAN18373T SNLS036B SCAN18373T

    SCAN18373T

    Abstract: SCAN1837TSSC
    Text: Revised May 2000 SCAN18373T Transparent Latch with 3-STATE Outputs General Description Features The SCAN18373T is a high speed, low-power transparent latch featuring separate data inputs organized into dual 9bit bytes with byte-oriented latch enable and output enable


    Original     		PDF SCAN18373T SCAN18373T SCAN1837TSSC

    SCAN18373T

    Abstract: No abstract text available
    Text: SCAN18373T Transparent Latch with TRI-STATE Outputs General Description Features The SCAN18373T is a high speed, low-power transparent latch featuring separate data inputs organized into dual 9-bit bytes with byte-oriented latch enable and output enable control signals. This device is compliant with IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture with


    Original     		PDF SCAN18373T SCAN18373T 9-bi959

    scan18373

    Abstract: C1995 SCAN18373T SCAN18373TFMQB SCAN18373TSSC SCAN18373TSSCX
    Text: SCAN18373T Serially Controlled Access Network Transparent Latch with TRI-STATE Outputs General Description Features The SCAN18373T is a high speed low-power transparent latch featuring separate data inputs organized into dual 9-bit bytes with byte-oriented latch enable and output enable


    Original     		PDF SCAN18373T SCAN18373T 20-3A scan18373 C1995 SCAN18373TFMQB SCAN18373TSSC SCAN18373TSSCX

    SCAN18373T

    Abstract: SCAN18373TFMQB
    Text: MICROCIRCUIT DATA SHEET Original Creation Date: 10/23/98 Last Update Date: 12/11/98 Last Major Revision Date: SCAN18373T-X REV 1A0 SERIALLY CONTROLLED ACCESS NETWORK TRANSPARENT LATCH WITH TRI-STATE OUTPUTS General Description The SCAN18373T is a high speed, low-power transparent latch featuring separate data inputs


    Original     		PDF MNSCAN18373T-X SCAN18373T M0000517 SCAN18373TFMQB

    SCAN18373TSSCX

    Abstract: SCAN18373T 5962-9311801MXA SCAN18373TFMQB SCAN18373TSSC
    Text: SCAN18373T Transparent Latch with 3-STATE Outputs General Description Features The SCAN18373T is a high speed, low-power transparent latch featuring separate data inputs organized into dual 9-bit bytes with byte-oriented latch enable and output enable control signals. This device is compliant with IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture with


    Original     		PDF SCAN18373T SCAN18373T SCAN18373TSSCX 5962-9311801MXA SCAN18373TFMQB SCAN18373TSSC

    Mil JAN jm38510 Cross Reference

    Abstract: JM38510 5962-8997001PC 5962-87572 5962-8991101XC DS16F95QMLV 75202 jm3851030402bca 5962-9203001MPC 7900801CA
    Text: NATIONAL SEMICONDUCTOR STANDARD MICROCIRCUIT DRAWING CROSS REFERENCE NATIONAL SEMICONDUCTOR STANDARD MICROCIRCUIT DRAWING CROSS REFERENCE 1/16/98 Part Numbering Guides Jan Product: JM38510 / 119 05 B P A MIL-M-38510 Basic Specification Lead Finish A = Solder, C = Gold


    Original     		PDF JM38510 MIL-M-38510 10krad 100krad O-100 SCAN18374TFMQB SCAN18540TFMQB SCAN18541TFMQB SCANPSC100FDMQB SCANPSC100FFMQB Mil JAN jm38510 Cross Reference 5962-8997001PC 5962-87572 5962-8991101XC DS16F95QMLV 75202 jm3851030402bca 5962-9203001MPC 7900801CA

    analog devices die list

    Abstract: 54AC245 74ACT04 LM108 LM137K SCAN18373T SCAN18374T SCANPSC100F SCANPSC110F
    Text: N VOLUME NO. 2 1999 BARE DIE USE IS GROWING RAPIDLY CONTENTS he rapid demand for smaller and PAGE 1 Bare Die Use is Growing BARE DIE MEET smaller consumer products is Rapidly pushing designers and manufacQUALITY, RELIABILITY, Page 2 Boundary Scan Assists turers to reassess their selection of comAND PERFORMANCE


    Original     		PDF

    SN54LVT18502

    Abstract: SN54ABT8245 SN54ABT8543 SN54ABTH18502A SN54BCT8240A SN54BCT8244A SN54BCT8245A SN54BCT8373A SN74ABT18245A SN74ABT18502
    Text: Using ispGDX to Replace Boundary Scan Bus Devices the I/O cells make almost any TTL-bus application possible, especially with the 3.5ns Tpd and Tco of the 3.3V ispGDXV devices. After a brief overview of the ispGDX architecture, several examples illustrating the use of the


    Original     		PDF SN74BCT8374A ti8374; ispGDX160VA-3Q208; SN54LVT18502 SN54ABT8245 SN54ABT8543 SN54ABTH18502A SN54BCT8240A SN54BCT8244A SN54BCT8245A SN54BCT8373A SN74ABT18245A SN74ABT18502

    PSC110F

    Abstract: AN0123 AN-1037 SCAN18373T SCAN18540T SCANPSC110 SCANPSC110F
    Text: Fairchild Semiconductor Application Note 1023 February 1996 INTRODUCTION IEEE Std. 1149.1 JTAG defines a standard Test Access Port (TAP), protocol and set of commands for built in test at both the chip and board level. A board designed with boundary scan components typically consists of one scan chain


    Original     		PDF

    jm38510

    Abstract: JD5417BCA 54ACT3301W-QML 54ACT3301 JD5403BCA 5962-8752401PA JD54174BEA 5962-9958101QXC JD5407BCA JD54F157BEA
    Text: N STANDARD MICROCIRCUIT DRAWING CROSS REFERNCE and NOTES May 2000 N STANDARD MICROCIRCUIT DRAWING PART NUMBERING GUIDE JAN or MIL-M-38510 J M 3 8 5 1 / 1 1 9 05 B MIL-M-38510 Specification P A Lead finish A=solder,C-gold Radiation Assurance Indicator / M


    Original     		PDF MIL-M-38510 MIL-M-38510 di161SFA JM54AC163B2A JM54AC163BEA JM54AC163BFA JM54AC163S2A JM54AC163SEA JM54AC163SFA JM54AC191B2A jm38510 JD5417BCA 54ACT3301W-QML 54ACT3301 JD5403BCA 5962-8752401PA JD54174BEA 5962-9958101QXC JD5407BCA JD54F157BEA

    FQPF*7N65C APPLICATIONS

    Abstract: bc548 spice model bf494 spice model spice model bf199 LM3171 BC517 spice model bc547 spice model BF494 spice MOC3043-M spice model SPICE model BC237
    Text: Fairchild PSG.book Page i Wednesday, July 28, 2004 11:12 AM Fairchild Semiconductor Product Catalog Rev. 1 Analog & Mixed Signal Discrete Power Interface & Logic Microcontrollers Optoelectronics RF Power Front Matter.fm Page ii Monday, August 2, 2004 10:09 AM


    Original     		PDF UF4003. UF4004. UF4005. UF4006. UF4007. USB10H. USB1T1102 USB1T11A. vKA75420M W005G FQPF*7N65C APPLICATIONS bc548 spice model bf494 spice model spice model bf199 LM3171 BC517 spice model bc547 spice model BF494 spice MOC3043-M spice model SPICE model BC237

    mm74c922

    Abstract: nte CROSS-REFERENCE SJ 76 A DIODE EMI Quad 2 input nand gate cd 4093 7400 functional cross-reference HST 4047 pinout information of CMOS 4001, 4011, 4070 32-Bit Parallel-IN Serial-OUT Shift Register Fairchild Semiconductor Integrated Circuit Data Catalog 1970 application MM74C926
    Text: Logic Product Catalog Analog Discrete Interface & Logic Optoelectronics July 2002 Across the board. Around the world. Logic Literature Table of Contents Description Literature # Advanced Logic Products Databook CROSSVOLT , Fairchild Switch, TinyLogic™, VHC


    Original     		PDF Power247TM, mm74c922 nte CROSS-REFERENCE SJ 76 A DIODE EMI Quad 2 input nand gate cd 4093 7400 functional cross-reference HST 4047 pinout information of CMOS 4001, 4011, 4070 32-Bit Parallel-IN Serial-OUT Shift Register Fairchild Semiconductor Integrated Circuit Data Catalog 1970 application MM74C926

    cmos s-r latch

    Abstract: hex latch 74ACQ373 MM74HC259 hex to 7 segment decoder Multiplexer latch octal S-R latch 74ABT373 74AC373 74AC573
    Text: Logic Products by Function Latch Products Logic Product Family Product Description Package Voltage Node DM93L14 Bipolar-TTL Quad Latch DIP 5 DM74LS75 Bipolar-LS Quad Latch DIP SOIC 5 DM74LS259 Bipolar-LS 8-Bit Serial In to Parallel Out Addressable Latches


    Original     		PDF DM93L14 DM74LS75 DM74LS259 MM74HC259 74AC573 DM74LS279 74LVTH162373 16-Bit 74VCX162373 cmos s-r latch hex latch 74ACQ373 MM74HC259 hex to 7 segment decoder Multiplexer latch octal S-R latch 74ABT373 74AC373 74AC573

    LM6462

    Abstract: LM6464 LM103-3.6 54ACT3301 38510R75001 SMD MARKING CODE ACQ lm1242 MM54HC564 LH0041CJ 54AC00
    Text: N 4 N TABLE OF CONTENTS Included in this guide are the Enhanced Solutions products that are offered by National Semiconductor, their qualification levels, and packages as well as available process flows, radiation testing, and other information that can support your design.


    Original     		PDF 1-877-Dial-Die LM6462 LM6464 LM103-3.6 54ACT3301 38510R75001 SMD MARKING CODE ACQ lm1242 MM54HC564 LH0041CJ 54AC00

    pinout information of CMOS 4001, 4011, 4070

    Abstract: 54C922 CGS3301 54HC123A F100K ECL 300 series and design guide 4060 counter 4029 counter MM54HC245 MM54C76 4081 AND gate
    Text: N National Semiconductor offers a broad selection of advanced logic and interface families. Each family uniquely combines certain process and design techniques to address their evolving roles in system design. System & Board Test Products SCAN National’s portfolio of SCAN test products lowers a system’s cost of ownership over the course of its life cycle.


    Original     		PDF Spectrum/STV/5M96/Printed pinout information of CMOS 4001, 4011, 4070 54C922 CGS3301 54HC123A F100K ECL 300 series and design guide 4060 counter 4029 counter MM54HC245 MM54C76 4081 AND gate

    AN-1023

    Abstract: AN-1037 AN-890 SCAN18373T SCAN18540T SCANPSC110F
    Text: Fairchild Semiconductor Application Note November 1995 Revised May 2001 Structural System Test via IEEE Std. 1149.1 with Hierarchical and Multidrop Addressable JTAG Port, SCANPSC110F Introduction IEEE Std. 1149.1 JTAG defines a standard Test Access Port (TAP) protocol and set of commands for built in test at


    Original     		PDF SCANPSC110F AN-1023 AN-1037 AN-890 SCAN18373T SCAN18540T SCANPSC110F

    smd TRANSISTOR code marking w2t

    Abstract: MARKING SMD PNP TRANSISTOR w2t w2t smd transistor TRANSISTOR SMD MARKING CODE s2a SMD TRANSISTOR w2w smd marking e2w smd code W2W transistor e2w lm1455 marking code w2T
    Text: N Table of Contents QML Certification .1 National’s Space-Level Product Families .1


    Original     		PDF 1-800-52-HI-REL 1-800-52-HI-REL. smd TRANSISTOR code marking w2t MARKING SMD PNP TRANSISTOR w2t w2t smd transistor TRANSISTOR SMD MARKING CODE s2a SMD TRANSISTOR w2w smd marking e2w smd code W2W transistor e2w lm1455 marking code w2T

    Untitled

    Abstract: No abstract text available
    Text: S E M IC O N D U C T O R T SCAN18373T Transparent Latch with 3-STATE Outputs General Description Features The S C A N 18373T is a high speed, low -pow er transparent latch featuring separate data inputs organized into dual 9-bit bytes with byte-oriented latch enable and output enable con­


    OCR Scan     		PDF SCAN18373T 18373T

    Untitled

    Abstract: No abstract text available
    Text: March 1994 Semiconductor SCAN18373T Serially Controlled Access Network Transparent Latch with TRI-STATE Outputs General Description Features The SCAN18373T is a high speed, low-power transparent latch featuring separate data inputs organized into dual 9-bit


    OCR Scan     		PDF SCAN18373T SCAN18373T 20-3A

    Untitled

    Abstract: No abstract text available
    Text: 18373T National Semiconductor SCAN18373T Transparent Latch with TRI-STATE Outputs General Description Features The SCAN18373T is a high speed, low-power transparent latch featuring separate data inputs organized into dual 9-bit bytes with byte-oriented latch enable and output enable


    OCR Scan     		PDF 18373T SCAN18373T SCAN18373T

    Untitled

    Abstract: No abstract text available
    Text: 18373T ß National Semiconductor SCAN18373T Transparent Latch with TRI-STATE Outputs General Description Features The SCAN18373T is a high speed, low-power transparent latch featuring separate data inputs organized into dual 9-bit bytes with byte-oriented latch enable and output enable


    OCR Scan     		PDF 18373T SCAN18373T WA28D WA56A TYPWA56A b5D1122

    BU 2735 AS

    Abstract: SMD A06 5962-9311801MXA SCAN18373T SCAN18373TFMQB SCAN18373TSSC SCAN18373TSSCX AI-431 18373TSSC
    Text: S E M IC O N D U C T O R T SCAN18373T Transparent Latch with 3-STATE Outputs General Description Features T h e S C A N 1 8 3 7 3 T is a h igh s p e e d , lo w -p o w e r tra n s p a re n t la tch fe a tu rin g s e p a ra te d a ta in p u ts o rg a n iz e d in to dua l 9 -b it


    OCR Scan     		PDF SCAN18373T SCAN18373T BU 2735 AS SMD A06 5962-9311801MXA SCAN18373TFMQB SCAN18373TSSC SCAN18373TSSCX AI-431 18373TSSC

    Untitled

    Abstract: No abstract text available
    Text: •M ICO N DUCTO R r General Description Features T h e S C A N 1 8 3 7 3 T is a high s p e e d , lo w -p o w e r tra n s p a re n t ■ IE E E 1149.1 J T A G C o m p lia n t la tch fe a tu rin g s e p a ra te d a ta in p u ts o rg a n iz e d in to d u a l 9 -b it


    OCR Scan     		PDF SCAN18373T SCAN18373T