PQFP208, Search Results
PQFP208, Result Highlights (5)
Part | ECAD Model | Manufacturer | Description | Download | Buy |
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TE505S16-40QC-G |
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TE505S16 - Field Programmable Gate Array, CMOS, PQFP208 | |||
TE505S16-40QI |
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TE505S16 - Field Programmable Gate Array, CMOS, PQFP208 | |||
TE505S16-40QI-G |
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TE505S16 - Field Programmable Gate Array, CMOS, PQFP208 | |||
TE505S16-40QC |
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TE505S16 - Field Programmable Gate Array, CMOS, PQFP208 | |||
ELANSC300-33VC |
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Microcontroller, 32-Bit, 33MHz, CMOS, PQFP208, TQFP-208 |
PQFP208, Datasheets Context Search
Catalog Datasheet | MFG & Type | Document Tags | |
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121C-2
Abstract: XC1765D XC95108 XL mp8000ch4 p103 pot datasheet reliability report PQFP240 XC95xxx 17256d D1 PGA 478
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Original |
XC4005XL PQFP-160 PLCC-84, HQFP-304, VQFP-100 XC4044XL XC4013XLA 121C-2 XC1765D XC95108 XL mp8000ch4 p103 pot datasheet reliability report PQFP240 XC95xxx 17256d D1 PGA 478 | |
XC95XXXL
Abstract: XC95XXX XC1765D PQFP240 C17S xc9536 A9903 XCV1000E FG HT 12E APPLICATION Reliability Test Methods for Packaged Devices
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Original |
XC4005XL PQFP-160 PLCC-84, HQFP-304, VQFP-100 XC4044XL XC4013XLA XC95XXXL XC95XXX XC1765D PQFP240 C17S xc9536 A9903 XCV1000E FG HT 12E APPLICATION Reliability Test Methods for Packaged Devices |