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    Abstract: No abstract text available
    Text: HXNAND00 Quad 2 Input NAND Features ▪ Radiation Hardened Total Dose: 300krad Si ▪ Supply voltage: 3.3V ▪ Quiescent current: 500 A ▪ Max Prop Delay 6.6nS ▪ Max Rise/Fall Time 4.3nS ▪ Input capacitance 11.5pF max PRODUCTION - Release - 21 Jul 2014 02:49:45 MST - Printed on 21 Jul 2014


    Original     		PDF HXNAND00 300krad HXNAND00 ADS-14200

    5962-07A07

    Abstract: HXNAND00 NAND Qualification Reliability 2Y smd 74LVC00A MIL-PRF38535 Honeywell Capacitors
    Text: HXNAND00 Quad 2 Input NAND Features • ■ ■ ■ ■ ■ ■ Radiation Hardened 300krad Si Supply voltage: 3.3V Quiescent current: 500µA Max Prop Delay 6.6nS in 50pF/500Ω load Max Rise/Fall Time 4.3nS in 50pF/500Ω load Input capacitance 11.5pF max


    Original     		PDF HXNAND00 300krad 50pF/500 HXNAND00 74LVC00A. N59-0507-000-000 5962-07A07 NAND Qualification Reliability 2Y smd 74LVC00A MIL-PRF38535 Honeywell Capacitors

    5962-07A07

    Abstract: HXNAND00
    Text: HXNAND00 Quad 2 Input NAND Features • ■ ■ ■ ■ ■ ■ Radiation Hardened 300krad Si Supply voltage: 3.3V Quiescent current: 500µA Max Prop Delay 6.6nS in 50pF/500Ω load Max Rise/Fall Time 4.3nS in 50pF/500Ω load Input capacitance 11.5pF max


    Original     		PDF HXNAND00 300krad 50pF/500 74LVC00A. N59-0507-000-000 5962-07A07