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    1009885

    Abstract: DC-12 TP 1322
    Contextual Info: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR03XXXS X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A


    Original     		HR03XXXS 01-20DB) DC-12 MIL-STD-1686. MIL-STD-130. TP-8965 TP-8965. 755W002. 1009885 TP 1322 PDF

    1009915

    Abstract: TP 1322
    Contextual Info: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR03XXXW1 X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A


    Original     		HR03XXXW1 01-20DB) MIL-STD-1686. MIL-STD-130. TP-8965 TP-8965. 755W002. 09-E1001 1009915 TP 1322 PDF

    Contextual Info: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR03XXXS X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A


    Original     		HR03XXXS 01-20DB) DC-12 TP-8965. MC0023. PDF

    Contextual Info: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR03XXXW1S X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A


    Original     		HR03XXXW1S 01-20DB) MIL-STD-1686. MIL-STD-130. TP-8965 TP-8965. MC0023. 04-E272 PDF

    Contextual Info: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR03XXX X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A


    Original     		HR03XXX 01-20DB) DC-12 TP-8965. MC0023. PDF

    1009895

    Abstract: HR03XXXW3 TP-8965
    Contextual Info: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR03XXXW3 X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A


    Original     		HR03XXXW3 01-20DB) MIL-STD-130. TP-8965 TP-8965. 755W002. 09-E1001 1009895 HR03XXXW3 TP-8965 PDF

    1009875

    Abstract: TP 1322 DC-12
    Contextual Info: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR03XXX X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A


    Original     		HR03XXX 01-20DB) DC-12 MIL-STD-1686. MIL-STD-130. TP-8965 TP-8965. 755W002. 1009875 TP 1322 PDF

    waffle

    Contextual Info: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR03XXXG X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (00-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A


    Original     		HR03XXXG 00-20DB) DC-12 MIL-STD-1686. MIL-STD-130. TP-8965 TP-8965. 755W002. waffle PDF

    Contextual Info: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR03XXXW1 X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A


    Original     		HR03XXXW1 01-20DB) TP-8965. MC0023. PDF

    Contextual Info: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR03XXXW3S X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A


    Original     		HR03XXXW3S 01-20DB) MIL-STD-1686. MIL-STD-130. TP-8965 TP-8965. MC0023. 04-E272 PDF

    1009905

    Abstract: TP 1322 HR03XXXW3 0120d
    Contextual Info: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR03XXXW3S X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A


    Original     		HR03XXXW3S 01-20DB) MIL-STD-130. TP-8965 TP-8965. 755W002. 09-E1001 1009905 TP 1322 HR03XXXW3 0120d PDF

    1009925

    Abstract: TP 1322
    Contextual Info: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR03XXXW1S X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A


    Original     		HR03XXXW1S 01-20DB) MIL-STD-1686. MIL-STD-130. TP-8965 TP-8965. 755W002. 09-E1001 1009925 TP 1322 PDF

    Contextual Info: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR03XXXW1S X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A


    Original     		HR03XXXW1S 01-20DB) TP-8965. MC0023. PDF

    Contextual Info: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR03XXXS X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A


    Original     		HR03XXXS 01-20DB) DC-12 MIL-STD-1686. MIL-STD-130. TP-8965 TP-8965. MC0023. PDF

    Contextual Info: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR03XXXW3 X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A


    Original     		HR03XXXW3 01-20DB) TP-8965. MC0023. PDF