49C460
Abstract: 7 bit hamming code 49C465 sd1623 XOR16 SD815
Text: APPLICATION NOTE AN-151 USING 32-BIT EDCS IN 8-BIT AND 16-BIT APPLICATIONS Integrated Device Technology, Inc. By Anupama Hegde INTRODUCTION The 49C460 and 49C465 are 32-bit error detection and correction EDC devices that use a modified Hamming code easily adaptable to 16 , 32 or 64-bit applications. 16-bit
|
Original
|
PDF
|
AN-151
32-BIT
16-BIT
49C460
49C465
64-bit
16-bit
7 bit hamming code
sd1623
XOR16
SD815
|
DL140
Abstract: E160 MC100E193 MC10E193
Text: MOTOROLA SEMICONDUCTOR TECHNICAL DATA Error Detection/Correction MC10E193 Circuit MC100E193 The MC10E/100E193 is an error detection and correction EDAC circuit. Modified Hamming parity codes are generated on an 8-bit word according to the pattern shown in the logic symbol. The P5 output gives
|
Original
|
PDF
|
MC10E193
MC100E193
MC10E/100E193
12-bit
MC10E193/D*
MC10E193/D
DL140
E160
MC100E193
MC10E193
|
3525 "application note"
Abstract: SECDED ic 4050 AN1404 AND8020 E160 MC100E193 MC100E193FN MC100E193FNR2 socket 775 pinout
Text: MC100E193 5VĄECL Error Detection/ Correction Circuit The MC100E193 is an error detection and correction EDAC circuit. Modified Hamming parity codes are generated on an 8-bit word according to the pattern shown in the logic symbol. The P5 output gives the parity of the whole word. The word parity is also
|
Original
|
PDF
|
MC100E193
MC100E193
12-bit
r14525
MC100E193/D
3525 "application note"
SECDED
ic 4050
AN1404
AND8020
E160
MC100E193FN
MC100E193FNR2
socket 775 pinout
|
"on semiconductor"
Abstract: E160 MC100E193 MC100E193FN MC100E193FNR2 MC10E193 MC10E193FN MC10E193FNR2 p4350
Text: MC10E193, MC100E193 5VĄECL Error Detection/ Correction Circuit The MC10E/100E193 is an error detection and correction EDAC circuit. Modified Hamming parity codes are generated on an 8-bit word according to the pattern shown in the logic symbol. The P5 output gives the parity of the whole word. The word parity is also
|
Original
|
PDF
|
MC10E193,
MC100E193
MC10E/100E193
12-bit
r14525
MC10E193/D
"on semiconductor"
E160
MC100E193
MC100E193FN
MC100E193FNR2
MC10E193
MC10E193FN
MC10E193FNR2
p4350
|
socket 775 pinout
Abstract: PLCC28 package
Text: MC100E193 5V ECL Error Detection/ Correction Circuit The MC100E193 is an error detection and correction EDAC circuit. Modified Hamming parity codes are generated on an 8-bit word according to the pattern shown in the logic symbol. The P5 output gives the parity of the whole word. The word parity is also
|
Original
|
PDF
|
MC100E193
12-bit
AND8020
MC100E193
AN1404
AN1405
AN1406
AN1503
AN1504
socket 775 pinout
PLCC28 package
|
Untitled
Abstract: No abstract text available
Text: MC100E193 5V ECL Error Detection/ Correction Circuit The MC100E193 is an error detection and correction EDAC circuit. Modified Hamming parity codes are generated on an 8-bit word according to the pattern shown in the logic symbol. The P5 output gives the parity of the whole word. The word parity is also
|
Original
|
PDF
|
MC100E193
12-bit
MC100E193/D
|
flash hamming ecc
Abstract: hamming code 512 bytes SLC nand hamming code 512 bytes hamming hamming code 7 bit hamming code micron ecc nand
Text: TN-29-08: Hamming Codes for NAND Flash Memory Devices Overview Technical Note Hamming Codes for NAND Flash Memory Devices For the latest NAND Flash product data sheets, see www.micron.com/products/nand/partlist.aspx. Overview NAND Flash memory products have become the technology of choice to satisfy highdensity, nonvolatile memory requirements in many applications. NAND Flash technology provides large amounts of storage at a price point lower than any of today's semiconductor alternatives. NAND Flash development has focused on low cost per bit,
|
Original
|
PDF
|
TN-29-08:
09005aef819bc571
09005aef819bc51c
tn2908
flash hamming ecc
hamming code 512 bytes
SLC nand hamming code 512 bytes
hamming
hamming code
7 bit hamming code
micron ecc nand
|
c1823.zip
Abstract: verilog code hamming an1823 flash hamming ecc 7 bit hamming code hamming code hamming code-error detection correction LP05 LP03 LP06
Text: AN1823 APPLICATION NOTE Error Correction Code in NAND Flash Memories This Application Note describes how to implement an Error Correction Code ECC , in ST NAND Flash memories, which can detect 2-bit errors and correct 1-bit errors per 256 Bytes. This Application Note should be downloaded with the c1823.zip file.
|
Original
|
PDF
|
AN1823
c1823
c1823.zip
verilog code hamming
an1823
flash hamming ecc
7 bit hamming code
hamming code
hamming code-error detection correction
LP05
LP03
LP06
|
verilog code hamming
Abstract: c1823.zip an1823 hamming code 512 bytes SLC nand hamming code 512 bytes flash hamming ecc STMicroelectronics NAND256W3A hamming 7 bit hamming code error correction code
Text: AN1823 APPLICATION NOTE Error Correction Code in Single Level Cell NAND Flash Memories This Application Note describes how to implement an Error Correction Code ECC in ST Single Level Cell (SLC) NAND Flash memories, that can detect 2-bit errors and correct 1-bit errors per 256 or 512 Bytes.
|
Original
|
PDF
|
AN1823
Byte/1056
verilog code hamming
c1823.zip
an1823
hamming code 512 bytes
SLC nand hamming code 512 bytes
flash hamming ecc
STMicroelectronics NAND256W3A
hamming
7 bit hamming code
error correction code
|
7 bit hamming code
Abstract: AN1221 HC05 HC08 hamming encoding
Text: MOTOROLA SEMICONDUCTOR APPLICATION NOTE Order this document by AN1221/D AN1221 Hamming Error Control Coding Techniques with the HC08 MCU by Mark McQuilken & Mark Glenewinkel CSIC Applications INTRODUCTION This application note is intended to demonstrate the use of error control coding ECC in a digital transmission system. The HC08 MCU will be used to illustrate the code development of this process. A message
|
Original
|
PDF
|
AN1221/D
AN1221
7 bit hamming code
AN1221
HC05
HC08
hamming encoding
|
Untitled
Abstract: No abstract text available
Text: * ERROR DETECTION/ CORRECTION CIRCUIT SYNERGY SEMICONDUCTOR FEATURES DESCRIPTION • ■ ■ ■ ■ ■ Hamming code generation 8-bit wide Expandable for more width Provides parity register ESD protection of 2000V Fully compatible with industry standard 10KH,
|
OCR Scan
|
PDF
|
lnternal75Ki2
MC10E/100E193
SY10E193
SY100E193
pa850
SY10E193JC
J28-1
SY100E193JC
|
Untitled
Abstract: No abstract text available
Text: * ERROR DETECTION/ CORRECTION CIRCUIT SYNERGY SY10E193 SY100E193 SEMICONDUCTOR FEATURES DESCRIPTION • Hamming code generation ■ Extended 100E V ee range of -4.2V to -5.5V ■ 8-bit wide ■ Expandable for more width ■ Provides parity register ■ Fully compatible with industry standard 10KH,
|
OCR Scan
|
PDF
|
SY10E193
SY100E193
lnternal75KÂ
MC10E/100E193
28-pin
SY10/100E193
|
Untitled
Abstract: No abstract text available
Text: MOTOROLA SEMICONDUCTOR TECHNICAL DATA Error Detection/Correction Circuit MC10E193 MC100E193 The MC10E/100E193 is an error detection and correction EDAC circuit. Modified Hamming parity codes are generated on an 8-bit word according to the pattern shown in the logic symbol. The P5 output gives
|
OCR Scan
|
PDF
|
MC10E193
MC100E193
MC10E/100E193
12-bit
|
Untitled
Abstract: No abstract text available
Text: MOTOROLA SEMICONDUCTOR TECHNICAL DATA Error Detection/Correction Circuit MC10E193 MC100E193 The MC10E/100E193 is an error detection and correction EDAC circuit. Modified Hamming parity codes are generated on an 8-bit word according to the pattern shown in the logic symbol. The P5 output gives
|
OCR Scan
|
PDF
|
MC10E193
MC100E193
MC10E/100E193
12-bit
DL140
b3b7252
|
|
block diagram code hamming
Abstract: ot 112 generate the parity after shift register block SECDED E160 E193 MC10193 SY100E193 SY10E193 p4350
Text: * ERROR DETECTION/ CORRECTION CIRCUIT SYNERGY S E M IC O N D U C T O R SY10E193 SY100E193 DESCRIPTION FEATURES • Hamming code generation ■ Extended 100E V ee range of -4.2V to -5.5V ■ 8-bit wide ■ Expandable for more width ■ Provides parity register
|
OCR Scan
|
PDF
|
SY10E193
SY100E193
lnternal75K
MC10E/100E193
SY10/100E193
SY10E193JC
J28-1
SY10E193JCTR
SY100E193JC
block diagram code hamming
ot 112
generate the parity after shift register block
SECDED
E160
E193
MC10193
SY100E193
p4350
|
Untitled
Abstract: No abstract text available
Text: ERROR DETECTION/ CORRECTION CIRCUIT SYNERGY SY10E193 SY100E193 SEMICONDUCTOR DESCRIPTION FEATURES • Hamming code generation ■ Extended 100E V ee range of -4 .2 V to -5 .5 V ■ 8-bit wide ■ Expandable for more width ■ Provides parity register ■ Fully com patible with industry standard 10KH,
|
OCR Scan
|
PDF
|
SY10E193
SY100E193
lnternal75KÂ
C10E/100E193
10/100E
SY10E193JC
J28-1
SY10E193JCTR
SY100E193JC
|
Untitled
Abstract: No abstract text available
Text: * ERR OR DETECTION/ C O RR ECT IO N CIRCUIT SYNERGY SEMICONDUCTOR FEATURES DESCRIPTION • Hamming code generation ■ Extended 100E V ee range of -4.2V to -5.5V ■ 8-bit wide ■ Expandable for more width ■ Provides parity register ■ Fully compatible with industry standard 10KH,
|
OCR Scan
|
PDF
|
SY10E193
SY100E193
lnternal75KD
MC10E/100E193
28-pin
SY10/100E193
|
Untitled
Abstract: No abstract text available
Text: * ERROR DETECTION/ CORRECTION CIRCUIT SYNERGY SY10E193 SY100E193 SEMICONDUCTOR FEATURES DESCRIPTION • Hamming code generation ■ Extended 100E V ee range of -4.2V to -5.5V ■ 8-bit wide ■ Expandable for more width ■ Provides parity register ■ Fully compatible with industry standard 10KH,
|
OCR Scan
|
PDF
|
SY10E193
SY100E193
lnternal75KÂ
MC10E/100E193
28-pin
SY10/100E193
|
Untitled
Abstract: No abstract text available
Text: MOTOROLA SEM ICONDUCTOR TECHNICAL DATA • • • • • • M C10E193 M C100E193 Hamming Code Generation 8-Bit Word, Expandable Provides Parity of Whole Word Scannable Parity Register Extended 100E Vgg Range of -4 .2 V to 75 k il Input Pulldown Resistors
|
OCR Scan
|
PDF
|
C10E193
C100E193
MC10E/100E193
|
MC10193
Abstract: E160 E193 SY100E193 SY101E193
Text: A ERROR DETECTION/ CORRECTIVE CIRCUIT SYN ERG Y e v in n F ic n 1 y 101E193 _ SEMICONDUCTOR J D E S C R IP T IO N FEATURES Hamming Code Generation. 8 - Bit Wide. Expandable for more width. Provides Parity Register. ESD Protection of 2000V.
|
OCR Scan
|
PDF
|
SY100E193:
SY101E193:
MC10E/100E193.
SY10E/100E/101E193
MC10193
E160
E193
SY100E193
SY101E193
|
Untitled
Abstract: No abstract text available
Text: * ERROR DETECTION/ CORRECTIVE CIRCUIT SYNERG Y SEMICONDUCTOR |Y100E193 O i l U 1 1 1 y%3 D ESCRIPTIO N FEATURES The SY10E/100E/101E193 is an errordetection and correction EDAC circuit designed for use in new, high performance ECL systems. The E193 generates hamming parity codes on an 8 -bit
|
OCR Scan
|
PDF
|
Y100E193
SY10E/100E/101E193
10KH00
|
Untitled
Abstract: No abstract text available
Text: MOTOROLA SEMICONDUCTOR TECHNICAL DATA Error Detection/C orrection Circuit M C10E193 M C 100E193 The MC10E/100E193 is an error detection and correction EDAC circuit. Modified Hamming parity codes are generated on an 8-bit word according to the pattern shown in the logic symbol. The P5 output gives
|
OCR Scan
|
PDF
|
C10E193
100E193
MC10E/100E193
12-bit
|
block diagram code hamming
Abstract: SECDED 7 bit hamming code hamming code E160 E193 MC10193 SY100E193 SY10E193 generate the parity after shift register block
Text: *SYNERGY ERROR DETECTION/ CORRECTION CIRCUIT S E M IC O N D U C TO R FEATURES SY10E193 SY100E193 D E S C R IP T IO N I Hamming code generation i 8-bit wide Expandable for more width Provides parity register ESD protection of 2000V Fully compatible with Industry standard 10KH,
|
OCR Scan
|
PDF
|
SY10E193
SY100E193
lnternal75Kii
MC10E/100E193
SY100E193
S0013A1
000D7D2
block diagram code hamming
SECDED
7 bit hamming code
hamming code
E160
E193
MC10193
generate the parity after shift register block
|
Untitled
Abstract: No abstract text available
Text: ERROR DEFECTION SYN ER G Y iv iU E iy j C O R R E C T I O N CIRCl.lH ' V 1Q0 E193 S E M IC O N D U C TO R BH3353I31TS! FEATURES • Hamming code generation ■ Extended 100E V ee range of -4.2V to -5.5V ■ 8-bit wide ■ Expandable for more width ■ Provides parity register
|
OCR Scan
|
PDF
|
lntemal75K
MC10E/100E193
28-pin
BH3353I31TS!
SY10/100E193
SY10E193JC
SY10E193JCTR
SY100E193JC
SY100E193JCTR
J28-1
|