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Catalog Datasheet	MFG & Type	PDF	Document Tags
TSOP 173 g Abstract: 5H9602 6c9648 3b1326 5G9551 MIL-M-38535 6F9627 4c19 3C1660 atmel 906 Text: PAGE 1 OF 21 ATMEL COPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C040 CMOS EPROM RELIABILITY DATA* -125°C DYNAMIC OPERATING LIFE TEST -200°C RETENTION BAKE -PROGRAM AND ERASE -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC) -15 PSIG PRESSURE POT	Original	PDF	AT-27C040 MIL-M-38535 AT-27C1024 AT-27C512R AT-27C010 AT-27C040 12C/TSOP/SOIC/PDIP 6D9702 8B9832 TSOP 173 g 5H9602 6c9648 3b1326 5G9551 6F9627 4c19 3C1660 atmel 906
29C256 Abstract: 29C257 report on PLCC tsop 6 MIL-M-38535 3A0081 Text: PAGE 1 OF 8 ATMEL CORPORATION Tel: 408 441-0311 Fax: (408) 436-4200 AT-29C256 PEROM RELIABILITY DATA - 125°C DYNAMIC OPERATING LIFE TEST - CYCLE TEST - 200°C RETENTION BAKE - 125°C DYNAMIC LIFE TEST (PLASTIC) - 125°C RETENTION BAKE (PLASTIC) - 15 PSIG PRESSURE POT	Original	PDF	AT-29C256 MIL-M-38535 AT-29C257 AT-29C256 2D9303 3A9313 3A9318 3B9324 29C256 29C257 report on PLCC tsop 6 3A0081
M1014 Abstract: K2078 1c9136 5D9602 AT27C010 AT27C512R 1C9133 27c256r 1A9110 3D9352 Text: PAGE 1 OF 15 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C256R CMOS EPROM RELIABILITY DATA* * - 200°C DATA RETENTION BAKE - 125°C DYNAMIC OPERATING LIFE TEST - 125°C HIGH TEMPERATURE REVERSE BIAS (HTRB) - TEMPERATURE CYCLE, CENTRIFUGE, FINE AND GROSS	Original	PDF	AT-27C256R from27C256R 4B0691 8703A) M1014 K2078 1c9136 5D9602 AT27C010 AT27C512R 1C9133 27c256r 1A9110 3D9352
27c080 Abstract: tsop 138 atmel 27c080 resistor activation energy MIL-M-38535 tsop40 3D0442-1 Text: PAGE 1 OF 8 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C080 EPROM RELIABILITY DATA - 125°C OPERATING LIFE TEST - 200°C RETENTION BAKE - 125°C OPERATING LIFE TEST (PLASTIC) - 150°C RETENTION BAKE (PLASTIC) - 15 PSIG PRESSURE POT * This report was generated from AT-27C080 reliability testing.	Original	PDF	AT-27C080 MIL-M-38535 AT-27C040 AT-27C4096 AT-27C080 A3B0575-2 3B9336 A3B0575-1 3B9331 27c080 tsop 138 atmel 27c080 resistor activation energy tsop40 3D0442-1
EEPROM 28C256 Abstract: 7b9729 1C0302 28C040 28C256 82307 28C256 atmel 4b23 6D9708 6C9638 Text: PAGE 1 OF 10 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-28C256 CMOS EEPROM RELIABILITY DATA -150°C DYNAMIC OPERATING LIFE TEST -CYCLE TEST -200°C RETENTION BAKE -125°C DYNAMIC OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC)	Original	PDF	AT-28C256 MIL-M38535 AT-28C010 AT-28C040 AT-28C256 1C0302 3E0319 3E0323 3G0338 EEPROM 28C256 7b9729 1C0302 28C040 28C256 82307 28C256 atmel 4b23 6D9708 6C9638
29C256 Abstract: 29C257 PLCC 64 Text: PAGE 1 OF 8 ATMEL CORPORATION Tel: 408 441-0311 Fax: (408) 436-4200 AT-29C256 PEROM RELIABILITY DATA - 125°C DYNAMIC OPERATING LIFE TEST - CYCLE TEST - 200°C RETENTION BAKE - 125°C DYNAMIC LIFE TEST (PLASTIC) - 125°C RETENTION BAKE (PLASTIC) - 15 PSIG PRESSURE POT	Original	PDF	AT-29C256 MILM-38535 AT-29C257 AT-29C256 2D9303 3A9313 3A9318 3B9324 29C256 29C257 PLCC 64
29c512 datasheet Abstract: 29c512 3B9317 1H0050 at 29c512 datasheet 6F9631 1H0208 ATMEL 940 Text: PAGE 1 OF 10 ATMEL CORPORATION Tel: 408 441-0311 Fax: (408) 436-4200 AT-29C512 PEROM RELIABILITY DATA - 125°C DYNAMIC OPERATING LIFE TEST - CYCLE TEST - 200°C RETENTION BAKE - 125°C DYNAMIC LIFE TEST (PLASTIC) - 150°C RETENTION BAKE (PLASTIC) - 15 PSIG PRESSURE POT	Original	PDF	AT-29C512 AT-29C512 B3B0684 4A0927 4A2182 4D0262 5G1621 2D9303 3B9327 4A9422 29c512 datasheet 29c512 3B9317 1H0050 at 29c512 datasheet 6F9631 1H0208 ATMEL 940