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    Untitled

    Abstract: No abstract text available
    Text: High-Reliability High-Speed CMOS Logic ICs CD54HC174/3A CD54HCT174/3A Switching Speed Limits with black dots (• are tested 100%.) SWITCHING CHARACTERISTICS ( C l = 50 pF, Input t„ t, = 6 ns) LIMITS TEST CONDITIO NS CHARACTERISTIC SYMBOL Propagation Delay


    OCR Scan     		PDF CD54HC174/3A CD54HCT174/3A CD54HC/HCT174 54HCT

    Untitled

    Abstract: No abstract text available
    Text: High-Reliability High-Speed CMOS Logic ICs CD54HC173/3A CD54HC173/3A Burn-ln Test-Circuit Connections Static STATIC BURN-IN I GROUND Vcc 6V 1,2,7-15 16 OPEN 3-6 CD54HC/HCT173 Dynamic OPEN GROUND 1/2 Vcc (3V) Vcc (6V) — 1,2,8-10,15 3-6 16 CD54HC/HCT173


    OCR Scan     		PDF CD54HC173/3A CD54HC/HCT173 2k-47k CD54HC174/3A CD54HCT174/3A CD54HC174 CD54HCT174 36950RI